Test equipment positional control manipulator

Abstract

An apparatus and method are provided for the automatic operation of a manipulator to move a test head or peripheral into position for proper alignment and docking of the test head with the peripheral. Examples of peripherals include a handler and a prober. Sensors are provided to obtain relative positional information of the test head in the relation to the peripheral, allowing a controller to issue instructions to the manipulator to correct differences in each of the six degrees of freedom between the mating surfaces of the test head and the manipulator.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

The invention will be apparent from the description herein and the accompanying drawings, in which like reference characters refer to the same parts throughout the different views.

FIG. 1 is a perspective view of a testing device according to an illustrative embodiment of the present invention;

FIG. 2 is a schematic view of the testing device of FIG. 1;

FIG. 3 is a perspective view of another illustrative embodiment of the present invention;

FIG. 4 is another perspective view of a portion of the embodiment of FIG. 3;

FIG. 5 is a schematic view of a test head mating surface according to another illustrative embodiment of the invention;

FIG. 6 is a schematic view of a test head mating surface according to another illustrative embodiment of the invention;

FIG. 7 is a schematic view of a peripheral mating surface according to another illustrative embodiment of the invention;

FIG. 8 is a schematic view of an operator interface and controls according to another illustrative embodiment of the invention; and

FIG. 9 is a flowchart of a method according to an illustrative embodiment of the invention.

Claims

1. A method for docking a test head, comprising: receiving positional information regarding a position of a peripheral relative to a test head, at least one of the group of the test head and the peripheral supported by a manipulator; andautomatically moving the test head relative to the peripheral, in position to enable docking of the test head to the peripheral by instructing the manipulator to move at least one of the group of the test head and the peripheral relative to the other of the group.

2. The method of claim 1, wherein the step of receiving comprises receiving relative x-axis and y-axis positional data from a coarse alignment receptacle.

3. The method of claim 2, wherein the step of receiving comprises receiving relative z-axis positional data from at least one of the group of the coarse alignment receptacle and a pin interacting with the course alignment receptacle.

4. The method of claim 1, wherein the step of receiving comprises receiving relative x-axis, y-axis and z-axis positional data from three coarse alignment receptacles.

5. The method of claim 1, wherein the step of receiving comprises receiving positional data from at least one of the group of a machine vision system and a digital image to determine at least one degree of freedom of the test head relative to the peripheral.

6. The method of claim 5, wherein the step of receiving comprises receiving z-axis positional data from a mechanical position detector of the test head relative to the peripheral.

7. The method of claim 1, further comprising activating at least one cam to cause a final pull down.

8. The method of claim 1, further comprising, after the automatically moving step, activating at least one outer pull down module to draw the test head closer to the peripheral.

9. The method of claim 1, further comprising, after the automatically moving step, activating at least one cam by the use of a cable to draw the test head closer to the peripheral.

10. The method of claim 1, wherein the automatically moving step includes instructions to the manipulator to move to change at least two of pitch, roll and yaw of the test head relative to the peripheral.

11. A testing device, comprising: a test head;a manipulator coupled to a support structure;at least one sensor for determining a position of the test head relative to a peripheral;a controller configured to determine an instruction for the manipulator to change the position of the test head relative to the peripheral to enable docking of the test head to the peripheral.

12. The device of claim 11, wherein the instruction is automatically forwarded to the manipulator and the manipulator automatically moves the test head.

13. The device of claim 11, further comprising an operator interface, wherein the instruction is provided to the operator interface and an operator activates a control to initiate movement of the test head relative to the peripheral.

14. The device of claim 13, wherein the control is a hand wheel.

15. The device of claim 11, further comprising the peripheral, wherein the peripheral is a handler.

16. The device of claim 11, further comprising the peripheral, wherein the peripheral is a prober.

17. The device of claim 11, wherein the at least one sensor comprises three coarse alignment receptacles having x, y and z axis measurement capability.

18. The device of claim 11, wherein the at least one sensor comprises a machine vision system.

19. The device of claim 11, wherein the controller determines instructions to change the at least two of pitch, roll and yaw of the test head to match a mating face of the peripheral.

20. A testing device, comprising: means for supporting a test head and moving the test head relative to a peripheral;means for detecting a relative position between the test head and the peripheral;means for determining instructions for automatically moving the test head relative to the peripheral to enable docking of the test head to the peripheral, the means for supporting and moving being responsive to the means for determining instructions.