involving moving the probe head or the IC under test; docking stations

Industry

CPC
G01R31/2887

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2887involving moving the probe head or the IC under test; docking stations

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 12,210,055
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Diagnostic device
- Patent number 12,203,981
- Issue date Jan 21, 2025
- The Boeing Company
- Ian M. Dayton
- G01 - MEASURING TESTING
Information Patent Grant
Contacting module for contacting optoelectronic chips
- Patent number 12,203,983
- Issue date Jan 21, 2025
- Jenoptik Optical Systems GmbH
- Robert Buettner
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device testing apparatus and electronic device testing m...
- Patent number 12,180,018
- Issue date Dec 31, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe head and substrate inspection device including the same
- Patent number 12,181,492
- Issue date Dec 31, 2024
- Kee Bok Seo
- G01 - MEASURING TESTING
Information Patent Grant
Ergonomic loading for a test interface board (TIB) / burn-in-board...
- Patent number 12,174,248
- Issue date Dec 24, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit spike check probing apparatus and method
- Patent number 12,169,220
- Issue date Dec 17, 2024
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing all test circuits on a wafer from...
- Patent number 12,153,087
- Issue date Nov 26, 2024
- IC ANALYTICA, LLC
- Patrick G. Drennan
- G01 - MEASURING TESTING
Information Patent Grant
Docking device and method for coupling second devices for interface...
- Patent number 12,135,349
- Issue date Nov 5, 2024
- Turbodynamics GmbH
- Stefan Thurmaier
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component testing apparatus, socket, and carrier
- Patent number 12,130,327
- Issue date Oct 29, 2024
- Advantest Corporation
- Naoto Imaizumi
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device pick-and-place system and electronic device testi...
- Patent number 12,103,789
- Issue date Oct 1, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe-holder support and corresponding probes with facilitated moun...
- Patent number 12,099,087
- Issue date Sep 24, 2024
- Giuseppe Amelio
- G01 - MEASURING TESTING
Information Patent Grant
Fine pitch probe card
- Patent number 12,085,589
- Issue date Sep 10, 2024
- Xallent Inc.
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Workpiece positioning mechanism and workpiece inspection apparatus
- Patent number 12,078,673
- Issue date Sep 3, 2024
- TAKAOKA TOKO CO., LTD.
- Taichi Aranami
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and method
- Patent number 12,044,725
- Issue date Jul 23, 2024
- Nippon Telegraph and Telephone Corporation
- Toru Miura
- G01 - MEASURING TESTING
Information Patent Grant
Chip detection device, chip detection system, and control method
- Patent number 12,032,017
- Issue date Jul 9, 2024
- Shandong Caiju Electronic Technology Co., Ltd.
- Meng Meng
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Apparatus for aligning device having fine pitch and method therefor
- Patent number 12,019,116
- Issue date Jun 25, 2024
- AMT CO., LTD.
- Du Chul Kim
- G01 - MEASURING TESTING
Information Patent Grant
Prober controlling device, prober controlling method, and prober
- Patent number 12,007,413
- Issue date Jun 11, 2024
- Tokyo Seimitsu Co., Ltd.
- Tetsuo Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Detection unit, semiconductor film layer inspection apparatus inclu...
- Patent number 12,000,866
- Issue date Jun 4, 2024
- EnVigth Co., Ltd.
- Hyoung Sik Kim
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,977,098
- Issue date May 7, 2024
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Chip tray positioning device
- Patent number 11,970,342
- Issue date Apr 30, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Handling integrated circuits in automated testing
- Patent number 11,961,220
- Issue date Apr 16, 2024
- Texas Instruments Incorporated
- Neeraj Bhardwaj
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device
- Patent number 11,940,482
- Issue date Mar 26, 2024
- Nidec-Read Corporation
- Takashi Isa
- G01 - MEASURING TESTING
Information Patent Grant
Temperature control and method for devices under test and image sen...
- Patent number 11,932,498
- Issue date Mar 19, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test device including temperature control module and...
- Patent number 11,927,623
- Issue date Mar 12, 2024
- SK Hynix Inc.
- Nack Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test system
- Patent number 11,921,154
- Issue date Mar 5, 2024
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Pad structure and testkey structure and testing method for semicond...
- Patent number 11,906,577
- Issue date Feb 20, 2024
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Linzhi Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated test system
- Patent number 11,899,042
- Issue date Feb 13, 2024
- Teradyne, Inc.
- Philip Luke Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic charge measurement tool
- Patent number 11,881,424
- Issue date Jan 23, 2024
- Intel Corporation
- Ho Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 11,860,225
- Issue date Jan 2, 2024
- Renesas Electronics Corporation
- Fukumi Unokuchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...
- Publication number 20250020689
- Publication date Jan 16, 2025
- FormFactor, Inc.
- Choon Beng Sia
- G01 - MEASURING TESTING
Information Patent Application
MACHINE-READABLE CODE IN INTEGRATED CIRCUIT
- Publication number 20250006650
- Publication date Jan 2, 2025
- GLOBALFOUNDRIES U.S. Inc.
- Alain F. Loiseau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHIELDING DEVICE FOR A CHUCK, CORRESPONDING CHUCK, AND CORRESPONDIN...
- Publication number 20250006545
- Publication date Jan 2, 2025
- ERS electronic GmbH
- Klemens Reitinger
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR PACKAGE
- Publication number 20240426905
- Publication date Dec 26, 2024
- TSE CO., LTD
- Min Cheol KIM
- G01 - MEASURING TESTING
Information Patent Application
Diagnostic Device
- Publication number 20240418773
- Publication date Dec 19, 2024
- The Boeing Company
- Ian M. Dayton
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ADJUSTING THE POSITION OF PROBING BASE AND PROBING MACHI...
- Publication number 20240393386
- Publication date Nov 28, 2024
- MPI CORPORATION
- YA-HUNG LO
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Automatic Height Adjustment for Chip Testing
- Publication number 20240377455
- Publication date Nov 14, 2024
- DIODES INCORPORATED
- Jie Ren
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER
- Publication number 20240369623
- Publication date Nov 7, 2024
- TOKYO SEIMITSU CO., LTD.
- Akira YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Probe-holder support and corresponding probes with facilitated moun...
- Publication number 20240353481
- Publication date Oct 24, 2024
- Microtest S.p.A.
- Giuseppe Amelio
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR POSITIONING SEMICONDUCTOR DEVICES AND CORRESPONDING POSI...
- Publication number 20240329125
- Publication date Oct 3, 2024
- STMicroelectronics International N.V.
- Moise AVOCI UGWIRI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRIVE CONTROL DEVICE, DRIVE CONTROL METHOD, PROGRAM AND PROBER
- Publication number 20240319263
- Publication date Sep 26, 2024
- TOKYO SEIMITSU CO., LTD.
- Eiji FUKANO
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND TECHNIQUES FOR DETERMINING WHEN A PROBE TIP IS PROXIMAT...
- Publication number 20240255571
- Publication date Aug 1, 2024
- Xallent Inc.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
MAGNETICALLY RETAINED REPLACEABLE CHUCK ASSEMBLY FOR PICK-AND-HOLD...
- Publication number 20240230753
- Publication date Jul 11, 2024
- Advantest Corporation
- Patrick Sherman
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
- Publication number 20240230714
- Publication date Jul 11, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
CONTACTING MODULE HAVING A MOUNTING PLATE FOR CONTACTING OPTOELECTR...
- Publication number 20240219461
- Publication date Jul 4, 2024
- Robert BUETTNER
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20240192270
- Publication date Jun 13, 2024
- Teraview Limited
- Brian Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
MAGNETICALLY RETAINED REPLACEABLE CHUCK ASSEMBLY FOR PICK-AND-HOLD...
- Publication number 20240133948
- Publication date Apr 25, 2024
- Advantest Corporation
- Patrick Sherman
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
VOICE COIL LEAF SPRING PROBER
- Publication number 20240125847
- Publication date Apr 18, 2024
- MACOM Technology Solutions Holdings, Inc.
- Timothy James VANDERWERF
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SETTING UP TEST APPARATUS AND TEST APPARATUS
- Publication number 20240118338
- Publication date Apr 11, 2024
- TOKYO ELECTRON LIMITED
- Shinjiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
GUIDE PLATE AND TEST DEVICE INCLUDING SAME
- Publication number 20240118337
- Publication date Apr 11, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
REMOTE CONTROL DEVICES FOR PROBE SYSTEMS, PROBE SYSTEMS THAT INCLUD...
- Publication number 20240110942
- Publication date Apr 4, 2024
- FormFactor, Inc.
- Benjamin E. Waters
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT METHOD AND ALIGNMENT DEVICE
- Publication number 20240096716
- Publication date Mar 21, 2024
- STAR TECHNOLOGIES (WUHAN) CO., LTD.
- CHOON LEONG LOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUIDE PLATE STRUCTURE AND PROBE ARRAY
- Publication number 20240036106
- Publication date Feb 1, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027520
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027522
- Publication date Jan 25, 2024
- Advantest Corporation
- Takayuki TANAKA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027521
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027523
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND METHOD, AND NON-TRANSITORY COMPUTER-READABLE REC...
- Publication number 20240019483
- Publication date Jan 18, 2024
- TOKYO ELECTRON LIMITED
- Shinjiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE DEVICE
- Publication number 20240003939
- Publication date Jan 4, 2024
- WINBOND ELECTRONICS CORP.
- Ting-Ming FU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOWIRE-BASED INTERCONNECTS FOR SUB-MILLIMETER WAVE INTEGRATED CIR...
- Publication number 20230411221
- Publication date Dec 21, 2023
- Regents of the University of Minnesota
- Rhonda Franklin
- H01 - BASIC ELECTRIC ELEMENTS

involving moving the probe head or the IC under test; docking stations

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor wafer testing system and related method for improving...

Diagnostic device

Contacting module for contacting optoelectronic chips

Electronic device testing apparatus and electronic device testing m...

Probe head and substrate inspection device including the same

Ergonomic loading for a test interface board (TIB) / burn-in-board...

Integrated circuit spike check probing apparatus and method

Apparatus and method for testing all test circuits on a wafer from...

Docking device and method for coupling second devices for interface...

Electronic component testing apparatus, socket, and carrier

Electronic device pick-and-place system and electronic device testi...

Probe-holder support and corresponding probes with facilitated moun...

Fine pitch probe card

Workpiece positioning mechanism and workpiece inspection apparatus

Inspection device and method

Chip detection device, chip detection system, and control method

Apparatus for aligning device having fine pitch and method therefor

Prober controlling device, prober controlling method, and prober

Detection unit, semiconductor film layer inspection apparatus inclu...

System for testing an integrated circuit of a device and its method...

Chip tray positioning device

Handling integrated circuits in automated testing

Inspection device

Temperature control and method for devices under test and image sen...

Semiconductor test device including temperature control module and...

Test system

Pad structure and testkey structure and testing method for semicond...

Automated test system

Electrostatic charge measurement tool

Method of manufacturing semiconductor device

Patents Applicationslast 30 patents

PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...

MACHINE-READABLE CODE IN INTEGRATED CIRCUIT

SHIELDING DEVICE FOR A CHUCK, CORRESPONDING CHUCK, AND CORRESPONDIN...

TEST APPARATUS FOR SEMICONDUCTOR PACKAGE

Diagnostic Device

METHOD FOR ADJUSTING THE POSITION OF PROBING BASE AND PROBING MACHI...

System and Method for Automatic Height Adjustment for Chip Testing

WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER

Probe-holder support and corresponding probes with facilitated moun...

METHOD FOR POSITIONING SEMICONDUCTOR DEVICES AND CORRESPONDING POSI...

DRIVE CONTROL DEVICE, DRIVE CONTROL METHOD, PROGRAM AND PROBER

METHODS AND TECHNIQUES FOR DETERMINING WHEN A PROBE TIP IS PROXIMAT...

MAGNETICALLY RETAINED REPLACEABLE CHUCK ASSEMBLY FOR PICK-AND-HOLD...

CONTROLLING ALIGNMENT DURING A THERMAL CYCLE

CONTACTING MODULE HAVING A MOUNTING PLATE FOR CONTACTING OPTOELECTR...

TEST SYSTEM

MAGNETICALLY RETAINED REPLACEABLE CHUCK ASSEMBLY FOR PICK-AND-HOLD...

VOICE COIL LEAF SPRING PROBER

METHOD FOR SETTING UP TEST APPARATUS AND TEST APPARATUS

GUIDE PLATE AND TEST DEVICE INCLUDING SAME

REMOTE CONTROL DEVICES FOR PROBE SYSTEMS, PROBE SYSTEMS THAT INCLUD...

ALIGNMENT METHOD AND ALIGNMENT DEVICE

GUIDE PLATE STRUCTURE AND PROBE ARRAY

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

TESTING DEVICE AND METHOD, AND NON-TRANSITORY COMPUTER-READABLE REC...

WAFER PROBE DEVICE

NANOWIRE-BASED INTERCONNECTS FOR SUB-MILLIMETER WAVE INTEGRATED CIR...