Number | Name | Date | Kind |
---|---|---|---|
5390131 | Rohrbaugh et al. | Feb 1995 | A |
5726920 | Chen et al. | Mar 1998 | A |
5761064 | La et al. | Jun 1998 | A |
5838951 | Song | Nov 1998 | A |
5841893 | Ishikawa et al. | Nov 1998 | A |
5991699 | Kulkarni et al. | Nov 1999 | A |
6033316 | Nixon | Mar 2000 | A |
6036345 | Jannette et al. | Mar 2000 | A |
6038588 | Nagarajayya et al. | Mar 2000 | A |
6091997 | Flamme et al. | Jul 2000 | A |
6138252 | Whitten et al. | Oct 2000 | A |
6418389 | Peter et al. | Jul 2002 | B2 |
6446021 | Schaeffer | Sep 2002 | B1 |
6453435 | Limon et al. | Sep 2002 | B1 |
6473707 | Grey | Oct 2002 | B1 |
6577981 | Grey et al. | Jun 2003 | B1 |
6590587 | Wichelman et al. | Jul 2003 | B1 |
6597381 | Eskridge et al. | Jul 2003 | B1 |
6639417 | Takao | Oct 2003 | B2 |
6639687 | Neilsen | Oct 2003 | B1 |
6745140 | Sutton | Jun 2004 | B2 |
20010019328 | Schwuttke et al. | Sep 2001 | A1 |
20030033105 | Yutkowitz | Feb 2003 | A1 |
20030233387 | Watanabe et al. | Dec 2003 | A1 |
20040153776 | Rhea et al. | Aug 2004 | A1 |
Number | Date | Country |
---|---|---|
2 236 063 | Oct 1999 | CA |
Entry |
---|
National Instruments, “TestStand—A Complete Test Executive Environment,” National Instruments, p. 55-60 (Mar., 2000). |
Czapski, Joseph, “Useful Feathures of Automated Test Systems in the R&D Laboratory”, Proceedings of the Autotestcon 2000, IEEE, Sep. 18-21, 2000, pp. 601-613, XPO02256433. |