Tester/user interface

Industry

CPC
G01R31/31912

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31912Tester/user interface

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electronic tester and testing method
- Patent number 11,971,450
- Issue date Apr 30, 2024
- Rohde & Schwarz GmbH & Co. KG
- Yi Jin
- G01 - MEASURING TESTING
Information Patent Grant
Electronic test equipment apparatus and methods of operating thereof
- Patent number 11,740,278
- Issue date Aug 29, 2023
- Infineon Technologies AG
- Kevin Roche
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing artificial intelligence chip, devi...
- Patent number 11,714,128
- Issue date Aug 1, 2023
- KUNLUNXIN TECHNOLOGY (BEIJING) COMPANY LIMITED
- Ziyu Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated verification code generation based on a hardware design a...
- Patent number 11,579,195
- Issue date Feb 14, 2023
- Micron Technology, Inc.
- Benjamin Ting
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test method and test system
- Patent number 11,293,982
- Issue date Apr 5, 2022
- Rohde & Schwarz GmbH & Co. KG
- Philip Diegmann
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for simultaneously testing a plurality of remot...
- Patent number 11,262,397
- Issue date Mar 1, 2022
- Contec, LLC
- Rajeev Tiwari
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for determining the state of charge of a bat...
- Patent number 11,214,150
- Issue date Jan 4, 2022
- Volvo Truck Corporation
- Esteban Gelso
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Control method of touch display apparatus
- Patent number 11,144,198
- Issue date Oct 12, 2021
- MPI CORPORATION
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display method of display apparatus
- Patent number 11,036,390
- Issue date Jun 15, 2021
- MPI CORPORATION
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Oscilloscope and method for testing a device under test
- Patent number 11,009,552
- Issue date May 18, 2021
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
Deterministic concurrent test program executor for an automated tes...
- Patent number 10,990,513
- Issue date Apr 27, 2021
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement apparatus with projected user interface
- Patent number 10,983,144
- Issue date Apr 20, 2021
- Rohde & Schwarz GmbH & Co. KG
- Bernhard Sterzbach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of creating program for measurement system, measurement syst...
- Patent number 10,956,180
- Issue date Mar 23, 2021
- Keysight Technologies, Inc.
- Tomonori Ura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement device and configuration method
- Patent number 10,908,197
- Issue date Feb 2, 2021
- Rohde & Schwarz GmbH & Co. KG
- Mario Guenther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic device detection and connection verification
- Patent number 10,782,348
- Issue date Sep 22, 2020
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power supply stress testing
- Patent number 10,495,683
- Issue date Dec 3, 2019
- VIAVI SOLUTIONS DEUTSCHLAND GMBH
- Reiner Schnizler
- G01 - MEASURING TESTING
Information Patent Grant
Formatting and navigating graphed information
- Patent number 10,401,390
- Issue date Sep 3, 2019
- KEITHLEY INSTRUMENTS, LLC
- Brian P. Frackelton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Run-time configurable graphical interface for measuring device
- Patent number 10,386,394
- Issue date Aug 20, 2019
- Rohde & Schwarz GmbH & Co. KG
- Joachim Eibl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wire order testing method and associated apparatus
- Patent number 10,192,634
- Issue date Jan 29, 2019
- MediaTek Singapore Pte Ltd.
- Chun-Xue Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test system and method
- Patent number 9,229,059
- Issue date Jan 5, 2016
- Elite Semiconductor Memory Technology Inc.
- Min-Chung Chou
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for generating electronic test and data structure
- Patent number 8,225,152
- Issue date Jul 17, 2012
- Agilent Technologies, Inc.
- Christopher K Sutton
- G01 - MEASURING TESTING
Information Patent Grant
Signal generator providing ISI scaling to touchstone files
- Patent number 8,218,611
- Issue date Jul 10, 2012
- Tektronix International Sales GmbH
- Sampathkumar R. Desai
- G01 - MEASURING TESTING
Information Patent Grant
Integrated high-efficiency microwave sourcing control process
- Patent number 8,131,387
- Issue date Mar 6, 2012
- Teradyne, Inc.
- Yong Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor testing using a testing scena...
- Patent number 8,069,130
- Issue date Nov 29, 2011
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Signal generator and user interface for setting test sequences and...
- Patent number 8,064,506
- Issue date Nov 22, 2011
- Tektronix International Sales GmbH
- Ramasubramaniya Raja
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous physical and protocol layer analysis
- Patent number 7,965,764
- Issue date Jun 21, 2011
- LeCroy Corporation
- Roland Gamper
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Signal generator display interface for instinctive operation of edi...
- Patent number 7,928,981
- Issue date Apr 19, 2011
- Tektronix International Sales GmbH
- Toshio Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
Form-based user interface tool for specifying time-based, distribut...
- Patent number 7,792,781
- Issue date Sep 7, 2010
- Agilent Technologies, Inc.
- James Adam Cataldo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Simultaneous physical and protocol layer analysis
- Patent number 7,756,199
- Issue date Jul 13, 2010
- LeCroy Corporation
- Roland Gamper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphical user interface for creation of IBIST tests
- Patent number 7,590,504
- Issue date Sep 15, 2009
- Asset Intertech, Inc.
- James Ernest Chorn
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...
- Publication number 20240418774
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD, CENTRAL TEST CONTROL UNIT, MEASUREMENT SYSTEM
- Publication number 20240241175
- Publication date Jul 18, 2024
- Rohde& Schwarz GmbH & Co. KG
- Thomas BRAUNSTORFINGER
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC COMPONENT COMPARISON APPARATUS, SYSTEM, AND RELATED METHODS
- Publication number 20240125869
- Publication date Apr 18, 2024
- COILCRAFT, INCORPORATED
- Leonard Crane
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC TESTER AND TESTING METHOD
- Publication number 20230176124
- Publication date Jun 8, 2023
- Rohde& Schwarz GmbH & Co. KG
- Yi JIN
- G01 - MEASURING TESTING
Information Patent Application
USAGE-AWARE COMPRESSION FOR STREAMING DATA FROM A TEST AND MEASUREM...
- Publication number 20230012393
- Publication date Jan 12, 2023
- Tektronix, Inc.
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING DROP TEST EQUIPMENT
- Publication number 20220397606
- Publication date Dec 15, 2022
- Konepaja-Heinä Oy
- Ilkka HEINÄ
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SIMULTANEOUSLY TESTING A PLURALITY OF REMOT...
- Publication number 20210088577
- Publication date Mar 25, 2021
- CONTEC, LLC
- Rajeev Tiwari
- G01 - MEASURING TESTING
Information Patent Application
Electronic Test Equipment Apparatus and Methods of Operating Thereof
- Publication number 20210033659
- Publication date Feb 4, 2021
- Kevin Roche
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE AND METHOD FOR TESTING A DEVICE UNDER TEST
- Publication number 20200200821
- Publication date Jun 25, 2020
- Rohde& Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED VERIFICATION CODE GENERATION BASED ON A HARDWARE DESIGN A...
- Publication number 20200158781
- Publication date May 21, 2020
- Micron Technology, Inc.
- Benjamin Ting
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY METHOD OF DISPLAY APPARATUS
- Publication number 20190361074
- Publication date Nov 28, 2019
- MPI Corporation
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND ARRANGEMENT FOR DETERMINING THE STATE OF CHARGE OF A BAT...
- Publication number 20190339333
- Publication date Nov 7, 2019
- VOLVO TRUCK CORPORATION
- Esteban Gelso
- B60 - VEHICLES IN GENERAL
Information Patent Application
POWER SUPPLY STRESS TESTING
- Publication number 20190219629
- Publication date Jul 18, 2019
- VIAVI SOLUTIONS DEUTSCHLAND GMBH
- Reiner SCHNIZLER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CREATING PROGRAM FOR MEASUREMENT SYSTEM, MEASUREMENT SYST...
- Publication number 20190012189
- Publication date Jan 10, 2019
- KEYSIGHT TECHNOLOGIES, INC.
- Tomonori Ura
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Analyzing an Electrical Circuit
- Publication number 20180292457
- Publication date Oct 11, 2018
- WISTRON NEWEB CORPORATION
- Yuan-Chia Hsu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Automatic Device Detection and Connection Verification
- Publication number 20180259579
- Publication date Sep 13, 2018
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- G01 - MEASURING TESTING
Information Patent Application
WIRE ORDER TESTING METHOD AND ASSOCIATED APPARATUS
- Publication number 20180144812
- Publication date May 24, 2018
- MEDIATEK SINGAPORE PTE LTD
- Chun-Xue YU
- G11 - INFORMATION STORAGE
Information Patent Application
AUTOMATICALLY GENERATING EXECUTABLE CODE FOR A TEST SEQUENCE
- Publication number 20130061206
- Publication date Mar 7, 2013
- Auriga Measurement Systems, LLC
- Lawrence Smith
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...
- Publication number 20120109874
- Publication date May 3, 2012
- OptimalTest Ltd.
- Gil Balog
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMULTANEOUS PHYSICAL AND PROTOCOL LAYER ANALYSIS
- Publication number 20100141657
- Publication date Jun 10, 2010
- Roland Gamper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...
- Publication number 20090265300
- Publication date Oct 22, 2009
- OptimalTest Ltd.
- Gil Balog
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PERPENDICULAR HEAD WITH WIDE TRACK WRITING CAPABILITY AND METHODS O...
- Publication number 20090244787
- Publication date Oct 1, 2009
- Alan Paul Giorgi
- G01 - MEASURING TESTING
Information Patent Application
Signal Generator Providing ISI Scaling to Touchstone Files
- Publication number 20090195498
- Publication date Aug 6, 2009
- TEKTRONIX INTERNATIONAL SALES GMBH
- MURALIDHARAN A. KARAPATTU
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED HIGH-EFFICIENCY MICROWAVE SOURCING CONTROL PROCESS
- Publication number 20090043526
- Publication date Feb 12, 2009
- Yong Zhang
- G01 - MEASURING TESTING
Information Patent Application
Signal Generator and User Interface for Setting Test Sequences and...
- Publication number 20080313516
- Publication date Dec 18, 2008
- TEKTRONIX INTERNATIONAL SALES GMBH
- Ramasubramaniya Raja
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Displaying Test Data
- Publication number 20080270849
- Publication date Oct 30, 2008
- Carli Connally
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Displaying Pin Result Data
- Publication number 20080270848
- Publication date Oct 30, 2008
- Carli Connally
- G01 - MEASURING TESTING
Information Patent Application
Testing System
- Publication number 20080256406
- Publication date Oct 16, 2008
- PINTAIL TECHNOLOGIES, INC.
- Keith Arnold
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUS PHYSICAL AND PROTOCOL LAYER ANALYSIS
- Publication number 20080255784
- Publication date Oct 16, 2008
- Roland Gamper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Form-Based User Interface Tool for Specifying Time-Based, Distribut...
- Publication number 20080243732
- Publication date Oct 2, 2008
- James Adam Cataldo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Tester/user interface

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electronic tester and testing method

Electronic test equipment apparatus and methods of operating thereof

Method and apparatus for testing artificial intelligence chip, devi...

Automated verification code generation based on a hardware design a...

Test method and test system

Systems and methods for simultaneously testing a plurality of remot...

Method and arrangement for determining the state of charge of a bat...

Control method of touch display apparatus

Display method of display apparatus

Oscilloscope and method for testing a device under test

Deterministic concurrent test program executor for an automated tes...

Measurement apparatus with projected user interface

Method of creating program for measurement system, measurement syst...

Measurement device and configuration method

Automatic device detection and connection verification

Power supply stress testing

Formatting and navigating graphed information

Run-time configurable graphical interface for measuring device

Wire order testing method and associated apparatus

Memory test system and method

Method and apparatus for generating electronic test and data structure

Signal generator providing ISI scaling to touchstone files

Integrated high-efficiency microwave sourcing control process

Methods and systems for semiconductor testing using a testing scena...

Signal generator and user interface for setting test sequences and...

Simultaneous physical and protocol layer analysis

Signal generator display interface for instinctive operation of edi...

Form-based user interface tool for specifying time-based, distribut...

Simultaneous physical and protocol layer analysis

Graphical user interface for creation of IBIST tests

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...

METHOD, CENTRAL TEST CONTROL UNIT, MEASUREMENT SYSTEM

ELECTRIC COMPONENT COMPARISON APPARATUS, SYSTEM, AND RELATED METHODS

ELECTRONIC TESTER AND TESTING METHOD

USAGE-AWARE COMPRESSION FOR STREAMING DATA FROM A TEST AND MEASUREM...

METHOD FOR CONTROLLING DROP TEST EQUIPMENT

SYSTEMS AND METHODS FOR SIMULTANEOUSLY TESTING A PLURALITY OF REMOT...

Electronic Test Equipment Apparatus and Methods of Operating Thereof

OSCILLOSCOPE AND METHOD FOR TESTING A DEVICE UNDER TEST

AUTOMATED VERIFICATION CODE GENERATION BASED ON A HARDWARE DESIGN A...

DISPLAY METHOD OF DISPLAY APPARATUS

METHOD AND ARRANGEMENT FOR DETERMINING THE STATE OF CHARGE OF A BAT...

POWER SUPPLY STRESS TESTING

METHOD OF CREATING PROGRAM FOR MEASUREMENT SYSTEM, MEASUREMENT SYST...

Method and Device for Analyzing an Electrical Circuit

Automatic Device Detection and Connection Verification

WIRE ORDER TESTING METHOD AND ASSOCIATED APPARATUS

AUTOMATICALLY GENERATING EXECUTABLE CODE FOR A TEST SEQUENCE

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...

SIMULTANEOUS PHYSICAL AND PROTOCOL LAYER ANALYSIS

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...

PERPENDICULAR HEAD WITH WIDE TRACK WRITING CAPABILITY AND METHODS O...

Signal Generator Providing ISI Scaling to Touchstone Files

INTEGRATED HIGH-EFFICIENCY MICROWAVE SOURCING CONTROL PROCESS

Signal Generator and User Interface for Setting Test Sequences and...

Method and Apparatus for Displaying Test Data

Method and Apparatus for Displaying Pin Result Data

Testing System

SIMULTANEOUS PHYSICAL AND PROTOCOL LAYER ANALYSIS

Form-Based User Interface Tool for Specifying Time-Based, Distribut...