Number | Name | Date | Kind |
---|---|---|---|
5291495 | Udell, Jr. | Mar 1994 | |
5331570 | Bershteyn | Jul 1994 | |
5502731 | Meltzer | Mar 1996 | |
5519713 | Baeg et al. | May 1996 | |
5528604 | El-Maleh et al. | Jun 1996 | |
5534774 | Moore et al. | Jul 1996 | |
5544173 | Meltzer | Aug 1996 |
Entry |
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International Test Conference 1991, Paper 14-2, Hierarchical Test Program Development for Scan Testable Circuits, pp. 375-384. |