Number | Name | Date | Kind |
---|---|---|---|
4025906 | Riikonen | May 1977 | |
4604744 | Littlebury et al. | Aug 1986 | |
4606024 | Glass et al. | Aug 1986 | |
4710931 | Bellay et al. | Dec 1987 | |
5056093 | Whetsel | Oct 1991 | |
5325368 | James et al. | Jun 1994 | |
5343478 | James et al. | Aug 1994 | |
5369604 | Ravindranath et al. | Nov 1994 | |
5390351 | Di Giulio et al. | Feb 1995 | |
5414715 | Hamblin et al. | May 1995 |
Entry |
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F. W. Angelotti et al, "System Level Interconnect Test In A Tristate Environment", 1993 IEEE, International Test Conference 1993, pp. 45-53. |
IEEE Computer Society, "IEEE Standard Test Access Port and Boundary-Scan Architecture", Oct. 1993. |
C. M. Maunder et al, "The Test Access Port And Boundary-Scan Architecture", IEEE Computer Society Press Tutorial 1990. |