The present disclosure relates to wafer manufacturing and flat panel display technologies, and in particular to a thin film transistor (TFT) array substrate and its manufacturing method.
The display industry currently heavily relies on modularization. As shown in
Schottky diodes are required on FPCA so as to prevent the latch up between VGL (the voltage provide by DIC to control the on/off of thin film transistors (TFTs), and AVEE (or VSN, the working voltage provided to the DIC). However, the diodes placed on FPCA take up space, making FPCA larger. The diodes' height also have adversary effect to the thinning of the FPCA and the mobile phone.
To obviate the shortcomings of the prior art, the present disclosure teaches a novel thin film transistor (TFT) array substrate and a related manufacturing method so that the flexible printed circuit assembly (FPCA) may be reduced both in thickness and cost.
The TFT array substrate includes a substrate having a display area and a non-display area, and at least a Schottky diode on the non-display area. The Schottky diode includes an anode layer and a cathode layer on the substrate, a gate insulation layer on the substrate covering the anode and cathode layers, a first gate on the gate insulation layer covering portions of the anode and cathode layers, an inter-layer insulation layer on the gate insulation layer covering the first gate and having a number of vias exposing the anode and cathode layers, respectively, and a first electrode and a second electrode in the vias on the inter-layer insulation layer connecting the anode and cathode layers, respectively.
The TFT array substrate further includes at least a TFT on the display area of the substrate. The TFT includes an active layer on the substrate, and a source and a drain electrically connected to the active layer.
In one embodiment, the anode layer, the cathode layer, and the active layer are on a same layer.
In one embodiment, the first and second gates are on a same layer.
In one embodiment, the first and second electrodes, and the source and the drain are on a same layer.
In one embodiment, the active layer includes a source area, a drain area, and a ditch area between the source and drain areas. The anode layer, the source area, and the drain area are made of a same material, and the cathode layer and the ditch area are made of a same material.
In one embodiment, the TFT array substrate further include at least a soldering pad on the non-display area.
The method for manufacturing TFT array substrate includes the steps of: forming an active layer of a TFT on a display area of a substrate, and an anode layer and a cathode layer of a Schottky diode on a non-display area of the substrate; forming a gate insulation layer on the substrate covering the active layer, the anode layer, and the cathode layer; forming a second gate of the TFT and a first gate of the Schottky diode on the gate insulation layer, the second gate being right above the active layer, the first gate covering a portion of the anode layer and a portion of the cathode layer; forming an inter-layer insulation layer on the gate insulation layer covering the first and second gates; forming a number of vias in the inter-layer insulation layer and the gate insulation layer exposing the active layer, the anode layer, and the cathode layer, respectively; and forming a source and a drain of the TFT, and a first electrode and a second electrode of the Schottky diode on the inter-layer insulation layer in the vias connecting the active layer, the anode layer, and the cathode layer, respectively.
In one embodiment, the active layer includes a source area, a drain area, and a ditch area between the source and drain areas. The anode layer, the source area, and the drain area are made of a same material, and the cathode layer and the ditch area are made of a same material.
In one embodiment, the first and second gates are formed using a same technique.
According to the present disclosure, the material and placement cost for the TFT array substrate may be reduced. In addition, FPCA's area and thickness may be effectively lowered, thereby supporting the thinning of the liquid crystal module and the mobile phone as well. In addition, the TFT and the Schottky diode are formed simultaneously without an extra step, thereby simplifying the manufacturing process.
To make the technical solution of the embodiments according to the present disclosure, a brief description of the drawings that are necessary for the illustration of the embodiments will be given as follows. Apparently, the drawings described below show only example embodiments of the present disclosure and for those having ordinary skills in the art, other drawings may be easily obtained from these drawings without paying any creative effort. In the drawings:
In the following embodiments of the present disclosure are explained in details along with the accompanied drawings.
The drawings only depicts the embodiments schematically and do not limit the present disclosure in any way. For persons skilled in the art, it should be understood that there may be various variations without departing from the scope of the present disclosure.
As shown in
The first and second semiconductors 210 and 220 are usually formed using a physical vapor deposition (PVD) method. In one embodiment, the first and second semiconductors 210 and 220 are made of a same material.
An optional buffer layer (not shown) may be formed between the first and second semiconductors 210 and 220, and the substrate 100.
Then, as shown in
Then, as shown in
Then, as shown in
Then, as shown in
Finally, as shown in
As described, the present disclosure achieves simplified manufacturing process and reduced cost by forming the Schottky diode simultaneously when the TFT is formed.
In addition, the TFT array substrate and the manufacturing method may reduce the area and significantly lower the thickness of flexible printed circuit assembly (FPCA), thereby effectively supporting the miniaturization of liquid crystal modules and also the mobile phones.
Embodiments of the present disclosure have been described, but not intending to impose any unduly constraint to the appended claims. Any modification of equivalent structure or equivalent process made according to the disclosure and drawings of the present disclosure, or any application thereof, directly or indirectly, to other related fields of technique, is considered encompassed in the scope of protection defined by the clams of the present disclosure.
Number | Date | Country | Kind |
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201610807781.4 | Sep 2016 | CN | national |
Filing Document | Filing Date | Country | Kind |
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PCT/CN2016/101611 | 10/10/2016 | WO | 00 |