Claims
- 1. A contactless, nondestructive method for determining the sufficiency of bonding of a layer of a composite material during manufacture of the composite material comprising the steps of:
heating the layer; monitoring the surface temperature of the layer to obtain a temperature-time signature for the layer; and using the temperature-time signature to determine the sufficiency of bonding of the layer.
- 2. The method as recited in claim 1, wherein the layer is heated using a laser.
- 3. The method as recited in claim 1, wherein the surface temperature is monitored using a means for sensing temperature.
- 4. The method as recited in claim 3, wherein the temperature sensing means is an infrared focal plane array.
- 5. The method as recited in claim 1, wherein the surface temperature is monitored as the layer is heated and applied to the composite material.
- 6. The method as recited in claim 1, wherein the layer is heated and the surface temperature monitored after the layer has been applied to the composite material.
- 7. A contactless, nondestructive method for measuring a property of a material comprising the steps of:
placing a conducting fiber in contact with the material; exciting the fiber with microwaves; and monitoring a thermal response resulting from the excitation of the fiber with microwaves to measure the property of the material at the position of the fiber.
- 8. The method as recited in claim 7, wherein the thermal response is monitored using a means for sensing temperature.
- 9. The method as recited in claim 7, wherein the fiber is bonded to the surface of the material.
- 10. The method as recited in claim 7, wherein the fiber is embedded in the material.
- 11. The method as recited in claim 10, wherein the thermal response results from a rise in the temperature of the fiber.
- 12. The method as recited in claim 10, wherein the thermal response results from a scattering of the microwaves incident on the fiber.
- 13. The method as recited in claim 10, wherein the thermal response depends on the ratio of the length of the microwaves to the length of the fiber.
- 14. The method as recited in claim 10, wherein the thermal response depends on the polarization of the microwaves.
- 15. The method as recited in claim 10, wherein the property being measured is the thermal diffusivity of the material.
- 16. The method as recited in claim 8, wherein a plurality of fibers are embedded in the material in the form of a code, the code being detectable by the temperature sensing means.
- 17. The method as recited in claim 8, wherein at least two fibers are placed in contact with the material and close enough together that when the fibers are excited with the microwaves simultaneously the distance between the fibers and therefore the strain in the material can be measured.
- 18. The method as recited in claim 8, wherein a plurality of fibers of different lengths are placed in contact with the material and excited simultaneously with microwaves of different frequencies to permit differentiation of the thermal response at different locations of the material.
- 20. The method as recited in claim 7, wherein the fiber comprises carbon.
- 21. The method as recited in claim 7, wherein the fiber comprises a metal.
- 22. The method as recited in claim 7, wherein the fiber comprises a semiconductor.
- 23. The method as recited in claim 7, wherein the fiber comprises a semi-metal.
- 24. The method as recited in claim 7, wherein the fiber comprises a shape memory alloy.
- 25. The method as recited in claim 7, wherein the fiber comprises a light sensitive organic metal, the conductivity being controlled by both light and microwaves.
- 26. The method as recited in claim 7, wherein the fiber comprises a material which undergoes a metal-insulator transition under an external parameter.
- 27. A contactless, nondestructive method for monitoring the temperature of a metal or semiconductor through an optically opaque, microwave transparent cover comprising the steps of:
illuminating the metal or semiconductor with microwaves; and measuring the reflected power of the microwaves, the measured reflected power varying with the temperature of the metal or semiconductor thereby permitting monitoring of the temperature.
- 28. The method as recited in claim 27, further comprising the step of initially heating the metal or semiconductor using induction heating.
- 29. A contactless, nondestructive shearographic method for determining the depth of a defect in a material comprising the steps of:
heating the material, thereby stressing the material and producing a shearographic fringe; and measuring the time dependence of the shearographic fringe development to determine the depth of the defect.
- 30. The method as recited in claim 29, wherein the material is heated with a laser source.
- 31. The method as recited in claim 10, further comprising the step of using the thermal responses to measure the depth of the fiber in the material.
CROSS-REFERENCE TO RELATED APPLICATION
[0001] This application claims the benefit of prior filed copending U.S. provisional application serial No. 60/022,853, filed Jul. 31, 1996.
STATEMENT OF GOVERNMENTAL INTEREST
[0002] This invention was made with Government support under Contract No. N00039-94-C-0001 awarded by the Department of the Navy. The Government has certain rights in the invention.
Provisional Applications (1)
|
Number |
Date |
Country |
|
60022853 |
Jul 1996 |
US |
Continuations (1)
|
Number |
Date |
Country |
Parent |
08902932 |
Jul 1997 |
US |
Child |
09931589 |
Aug 2001 |
US |