Claims
- 1. A method for calibrating a temperature probe for a thermometry apparatus, said method comprising the steps of:
characterizing the transient heat rise behavior of a temperature probe used with said apparatus; and storing characteristic data on an EEPROM associated with each probe.
- 2. A method as recited in claim 1, including the step of applying the stored characteristic data to an algorithm for predicting temperature.
- 3. A method as recited in claim 3, including the steps of comparing the characteristic data of a said temperature probe to that of a nominal temperature probe and normalizing said characteristic data based on said comparison prior to said applying step.
- 4. A method for calibrating a temperature probe for a thermometry apparatus, said method comprising the steps of:
characterizing the preheating data of a temperature probe used with said apparatus; and storing said characteristic preheating data on an EEPROM associated with said apparatus.
- 5. A method as recited in claim 4, including the step of applying the stored characteristic preheating data into an algorithm for preheating the probe to a predetermined temperature.
- 6. A method as recited in claim 5, including the steps of comparing the preheating characteristics of a said temperature probe to that of a nominal temperature probe and normalizing said characteristic data based on said comparison prior to said applying step.
CROSS REFERENCE TO RELATED APPLICATION
[0001] This application is a continuation-in-part application of U.S. Ser. No. 10/269,461 entitled: THERMOMETRY PROBE CALIBRATION METHOD, filed Oct. 11, 2002, the entire contents of which are incorporated by reference.
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
10269461 |
Oct 2002 |
US |
Child |
10683206 |
Oct 2003 |
US |