Claims
- 1. A method comprising:
depositing a layer on a substrate surface; and removing said layer to form a capillary in said substrate surface.
- 2. The method of claim 1, wherein said layer is a polymer or oxide material.
- 3. A method comprising:
depositing a first layer on a substrate surface; depositing a second layer on said first layer; depositing a third layer on said second layer; and removing said second layer to form a capillary between said first and third layers.
- 4. The method of claim 3, wherein said first layer is from a group consisting of glass, quartz, polysilicon, silicon nitride, silicon dioxide, and boron nitride.
- 5. The method of claim 3, wherein said first layer is silicon dioxide.
- 6. The method of claim 3, wherein said substrate is a silica based material.
- 7. The method of claim 3, wherein said substrate is from a group consisting of glass, quartz, pyrex, silicon and polysilicon.
- 8. The method of claim 3, wherein said substrate is a polymeric based material.
- 9. The method of claim 3, wherein said substrate is from the group consisting of polymethylmethacrylate (PMMA), polycarbonate, polytetrafluoroethylene (TEFLON™), polyvinylchloride (PVC), polydimethylsiloxane (PDMS), and polysulfone.
- 10. The method of claim 3, wherein said second layer is a polymer material.
- 11. The method of claim 3, wherein said second layer is an oxide material.
- 12. The method of claim 3, wherein said first and third layers are the same material.
- 13. The method of claim 3, further comprising:
removing all of said substrate except a portion of said substrate surrounding said capillary.
- 14. A method comprising:
etching a channel in substrate surface; depositing a first layer on said channel; and depositing a second layer on said first layer.
- 15. The method of claim 14, further comprising:
depositing a third layer on said second layer; and removing said second layer to form a capillary between said first and third layers.
- 16. The method of claim 15, wherein said second layer is melted during the removing step.
- 17. A method of forming a capillary in a microfluidic device comprising:
depositing a first layer on a substrate surface; depositing a second layer on said first layer; depositing a third layer on said second layer; and removing said second layer to form a capillary between said first and third layers.
- 18. The method of claim 17, further comprising: reflowing said second layer.
- 19. A method of forming a thin film capillary in a microfluidic device comprising:
performing a first photolithographic process using a mask and a positive photoresist to develop a capillary image onto a substrate surface; etching a channel in said substrate corresponding to the capillary image; depositing a first silicon dioxide layer on said substrate surface; depositing a wax filler layer on said first silicon dioxide layer; performing a second photolithograpic process using said mask and a negative photoresist to develop an image opposite to the capillary image onto the substrate surface; etching the silicon dioxide and the wax filler layers from the substrate surface not covered by the mask; depositing a second silicon dioxide layer on said substrate surface; and melting said wax filler layer.
- 20. The method of claim 3, wherein said first layer has a melting point greater than approximately 1000 degrees Celsius.
- 21. The method of claim 20, wherein said third layer has a melting point greater than approximately 1000 degrees Celsius.
- 22. The method of claim 3, wherein said second layer has a melting point in the range of approximately 200 to 300 degrees Celsius.
- 23. The method of claim 3, wherein said second layer has a melting point in the range of approximately 200 to 250 degrees Celsius.
- 24. The method of claim 3, wherein the first and third layers have melting points greater than approximately 1000 degrees Celsius and the second layer has a melting point in the range of approximately 200 to 250 degrees Celsius.
- 25. An apparatus comprising:
a substrate having a capillary lined with a material from the group consisting of glass, quartz, polysilicon, silicon nitride, silicon dioxide, and boron nitride/silicon dioxide.
- 26. The apparatus of claim 25, wherein said substrate is from a group consisting of glass, quartz, pyrex, silicon and polysilicon.
- 27. An apparatus comprising:
a glass substrate having a capillary lined with silicon dioxide.
- 28. An apparatus comprising:
a substrate having a capillary lined with a material from the group consisting of glass, quartz, polysilicon, silicon nitride, silicon dioxide, and boron nitride; and said capillary filled with material from the group consisting of a polymer and an oxide.
- 29. The apparatus of claim 28, wherein said capillary is filled with a polymer.
- 30. The apparatus of claim 29, wherein said polymer is wax.
- 31. An apparatus comprising:
a substrate having a capillary lined with a material having a melting point greater than approximately 1000 degrees Celsius.
- 32. The apparatus of claim 31, a substrate having a capillary lined with a material; and
said material having a melting point greater than approximately 1000 degrees Celsius.
- 33. The apparatus of claim 31, wherein said capillary has a wall roughness of approximately 50 rms.
- 34. The apparatus of claim 31, wherein said substrate is a single, integrated structure.
- 35. A microfluidic device comprising:
a glass substrate having a capillary lined with silicon dioxide; and said capillary filled with a polymer or oxide.
- 36. A microfluidic device comprising:
a substrate having a smooth walled capillary lined with a material from the group consisting of glass, quartz, polysilicon, silicon nitride, silicon dioxide, and boron nitride silicon dioxide.
- 37. A microfluidic device comprising:
a substrate having a capillary lined with a material; and said material having a melting point greater than approximately 1000 degrees Celsius.
- 38. A microfluidic device comprising:
an integrated substrate having a capillary lined with a material; and said material having a melting point greater than approximately 1000 degrees Celsius.
- 39. A device made by the method of claim 1.
- 40. A device made by the method of claim 3.
- 41. A device made by the method of claim 14.
- 42. A microfluidic device made by the method of claim 1.
- 43. A microfluidic device made by the method of claim 3.
- 44. A microfluidic device made by the method of claim 14.
Government Interests
[0001] The United States Government has rights in this invention pursuant to Contract No. W-7405-ENG-48 between the United States Department of Energy and the University of California for the operation of Lawrence Livermore National Laboratory.