Number | Name | Date | Kind |
---|---|---|---|
5103094 | Hayes et al. | Apr 1992 | |
5173605 | Hayes et al. | Dec 1992 | |
5200617 | Hayes et al. | Apr 1993 | |
5306919 | Elings et al. | Apr 1994 | |
5325010 | Besocke et al. | Jun 1994 |
Entry |
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"Dimensional metrology with scanning probe microscopes"--J. E. Griffith et al --J. Appl. Phys., vol. 74, No. 9, Nov. 1, 1993 --pp. 83-109. |