Number | Date | Country | Kind |
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09100091 | Jan 1991 | BEX |
This is a continuation of application Ser. No. 08/080,225, filed Jun. 21, 1993. Application Ser. No. 08/080,225 is a continuation-in-part of U.S. patent application Ser. No. 07/827,715, filed on Jan. 29, 1992. Application Ser. No. 07/827,715 abandoned claims priority of Belgium application Ser. No. 09100091 filed Jan. 31, 1991.
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4503519 | Arakawa | Mar 1985 | |
4608591 | Ipri et al. | Aug 1986 | |
4794565 | Wu et al. | Dec 1988 | |
4821236 | Hayashi et al. | Apr 1989 | |
4996668 | Paterson et al. | Feb 1991 | |
4998220 | Eitan et al. | Mar 1991 | |
5034926 | Taura et al. | Jul 1991 | |
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0228761 | Sep 1986 | EPX |
57-169005 | Sep 1982 | JPX |
58-115956 | Jun 1983 | JPX |
Entry |
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IEDM, 1988, R. Kazerounian et al., "A 5 Volt High Density Poly-Poly Erase Flash EPROM Cell," IEEE (p. 436). |
IEDM, 1987, H. Kume et al., "A Flash-Erase EEPROM Cell with an Asymmetric Source and Drain Structure," IEEE (p. 560). |
IEDM, 1986, A. T. Wu et al., "A Novel High-Speed 5-Volt Programming EPROM Structure with Source-Side Injection," IEEE (p. 584). |
IEDM, 1980, Masashi Wada et al., "Limiting Factors for Programming EPROM of Reduced Dimensions" (p. 38). |
IEEE, 1987, Transactions on Electron Devices, vol. ED-34, No. 12, Dec. 1987, Prall et al., "Characterization and Suppression of Drain Coupling in Submicrometer EPROM Cells" (p. 2463). |
Number | Date | Country | |
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Parent | 80225 | Jun 1993 |
Number | Date | Country | |
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Parent | 827715 | Jan 1992 |