INTERUNIVERSITAIR MICRO ELEKTRONICA CENTRUM VZW A BELGIUM CORPORATION

Organization

LEUVEN, BE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Insulating buffer film and high dielectric constant semiconductor d...
- Patent number 7,495,298
- Issue date Feb 24, 2009
- Panasonic Corporation
- Shigenori Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 7,465,618
- Issue date Dec 16, 2008
- Panasonic Corporation
- Shigenori Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of erasing a memory device and a method of programming a me...
- Patent number 6,246,612
- Issue date Jun 12, 2001
- Interuniversitair Micro-Elektronica Centrum, vzw (IMEC vzw)
- Jan Van Houdt
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical system with a dielectric subwavelength structure having hig...
- Patent number 6,191,890
- Issue date Feb 20, 2001
- Interuniversitair Micro-Elektronica Centrum vzw
- Roel Baets
- G02 - OPTICS
Information Patent Grant
Integrated tunable optical filter
- Patent number RE36710
- Issue date May 23, 2000
- Interuniversitair Micro-Elektronica Centrum VZW
- Roel Baets
- 385 - Optical waveguides
Information Patent Grant
Contactless array configuration for semiconductor memories
- Patent number 6,009,013
- Issue date Dec 28, 1999
- Interuniversitair Micro-Elektronica Centrum vzw
- Jan F. Van Houdt
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of erasing a flash EEPROM memory cell array optimized for lo...
- Patent number 5,969,991
- Issue date Oct 19, 1999
- Interuniversitair Micro-Elektronica Centrum vzw
- Jan F. Van Houdt
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for thermal impedance evaluation of packaged s...
- Patent number 5,795,063
- Issue date Aug 18, 1998
- Interuniversitair Micro-Elektronica Centrum VZW
- Filip Christiaens
- G01 - MEASURING TESTING
Information Patent Grant
Differential pair of optical thyristors used as an optoelectronic t...
- Patent number 5,646,760
- Issue date Jul 8, 1997
- Interuniversitair Micro-Elektronica Centrum vzw
- Maarten Kuijk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resolution-enhancing optical phase structure for a projection illum...
- Patent number 5,624,773
- Issue date Apr 29, 1997
- Interuniversitair Micro-Elektronica Centrum VZW
- Rainer Pforr
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Radiation-sensitive detector
- Patent number 5,623,147
- Issue date Apr 22, 1997
- Interuniversitair Micro-Elektronica Centrum VZW
- Christian Baert
- G01 - MEASURING TESTING
Information Patent Grant
Integrated tunable optical filter
- Patent number 5,621,828
- Issue date Apr 15, 1997
- Interuniversitair Micro-Elektronica Centrum vzw
- Roel Baets
- G02 - OPTICS
Information Patent Grant
Method for determining the resistance and carrier profile of a semi...
- Patent number 5,585,734
- Issue date Dec 17, 1996
- Interuniversitair Micro-Elektronica Centrum VZW
- Marc A. J. Meuris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for programming a semiconductor memory device
- Patent number 5,583,810
- Issue date Dec 10, 1996
- Interuniversitair Micro-Elektronica Centrum VZW
- Jan Van Houdt
- G11 - INFORMATION STORAGE
Information Patent Grant
Transistor structure for erasable and programmable semiconductor me...
- Patent number 5,583,811
- Issue date Dec 10, 1996
- Interuniversitair Micro-Elektronica Centrum VZW
- Jan Van Houdt
- G11 - INFORMATION STORAGE
Information Patent Grant
System for detecting a latent image using an alignment apparatus
- Patent number 5,496,669
- Issue date Mar 5, 1996
- Interuniversitair Micro-Elektronica Centrum vzw
- Rainer Pforr
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for resistance measurements on a semiconductor element with...
- Patent number 5,369,372
- Issue date Nov 29, 1994
- Interuniversitair Micro-Elektronica Centrum vzw
- Wilfried Vandervorst
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Circuit element with elimination of kink effect
- Patent number 5,272,369
- Issue date Dec 21, 1993
- Interuniversitair Micro-Elektronica Centrum vzw
- Jean P. Colinge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interrupted developing process for a photoresist image
- Patent number 5,223,377
- Issue date Jun 29, 1993
- Interuniversitair Micro-Elektronica Centrum VZW
- Nandasiri Samarakone
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mesa release and deposition (MRD) method for stress relief in heter...
- Patent number 5,221,637
- Issue date Jun 22, 1993
- Interuniversitair Micro-Elektronica Centrum VZW
- Johan T. M. De Boeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiaton-sensitive sensor having a plurality of radiation sensitive...
- Patent number 5,166,511
- Issue date Nov 24, 1992
- Interuniversitair Micro-Elektronica Centrum vzw
- Gregory Kreider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for optical signal processing showing transistor operation
- Patent number 5,035,479
- Issue date Jul 30, 1991
- Interuniversitair Micro-Elektronica Centrum vzw
- Roger A. Vounckx
- G02 - OPTICS
Information Patent Grant
Radiation-sensitive detector array and pre-amplification readout in...
- Patent number 5,023,455
- Issue date Jun 11, 1991
- Interuniversitair Micro-Elektronica Centrum VZW
- Guy F. R. J. Vanstraelen
- G01 - MEASURING TESTING
Information Patent Grant
Radiation transducing device with location identification
- Patent number 5,010,245
- Issue date Apr 23, 1991
- Interuniversitair Micro-Elektronica Centrum VZW
- Bart M. H. L. Dierikx
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
INSULATING BUFFER FILM AND HIGH DIELECTRIC CONSTANT SEMICONDUCTOR D...
- Publication number 20090130833
- Publication date May 21, 2009
- PANASONIC CORPORATION
- Shigenori Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of removing organic contaminants from a semiconductor surface
- Publication number 20070077769
- Publication date Apr 5, 2007
- Interuniversitair Micro-Elektronica Centrum vzw
- Stefan DeGendt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for testing electronic devices
- Publication number 20030062916
- Publication date Apr 3, 2003
- Interuniversitair Micro-Elektronica Centrum, vzw
- Hans Manhaeve
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for localized liquid treatment of the surface...
- Publication number 20020125212
- Publication date Sep 12, 2002
- Interuniversitair Micro-Elektronica Centrum, vzw
- Paul Mertens
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
75399892 - IMEC
- Serial number 75399892
- Registration number 2460655
- Filing date Dec 4, 1997
- Interuniversitair Micro-Elektronica Centrum vzw
- 35 - Advertising
Information Trademark
75982657 - HIMOS
- Serial number 75982657
- Registration number 2652368
- Filing date Dec 4, 1997
- Interuniversitair Micro-Elektronica Centrum vzw
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
75400128 - HIMOS
- Serial number 75400128
- Filing date Dec 4, 1997
- Interuniversitair Micro-Elektronica Centrum vzw
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

INTERUNIVERSITAIR MICRO ELEKTRONICA CENTRUM VZW A BELGIUM CORPORATION

Organization

Patents Grantslast 30 patents

Insulating buffer film and high dielectric constant semiconductor d...

Semiconductor device and method for fabricating the same

Methods of erasing a memory device and a method of programming a me...

Optical system with a dielectric subwavelength structure having hig...

Integrated tunable optical filter

Contactless array configuration for semiconductor memories

Method of erasing a flash EEPROM memory cell array optimized for lo...

Method and apparatus for thermal impedance evaluation of packaged s...

Differential pair of optical thyristors used as an optoelectronic t...

Resolution-enhancing optical phase structure for a projection illum...

Radiation-sensitive detector

Integrated tunable optical filter

Method for determining the resistance and carrier profile of a semi...

Method for programming a semiconductor memory device

Transistor structure for erasable and programmable semiconductor me...

System for detecting a latent image using an alignment apparatus

Method for resistance measurements on a semiconductor element with...

Circuit element with elimination of kink effect

Interrupted developing process for a photoresist image

Mesa release and deposition (MRD) method for stress relief in heter...

Radiaton-sensitive sensor having a plurality of radiation sensitive...

Device for optical signal processing showing transistor operation

Radiation-sensitive detector array and pre-amplification readout in...

Radiation transducing device with location identification

Patents Applicationslast 30 patents

INSULATING BUFFER FILM AND HIGH DIELECTRIC CONSTANT SEMICONDUCTOR D...

Method of removing organic contaminants from a semiconductor surface

Method and apparatus for testing electronic devices

Method and apparatus for localized liquid treatment of the surface...

Trademarklast 30 trademarks

75399892 - IMEC

75982657 - HIMOS

75400128 - HIMOS