| Number | Name | Date | Kind |
|---|---|---|---|
| 556604 | Willie | Mar 1896 | A |
| 1049896 | Miller | Jan 1913 | A |
| 5474877 | Suzuki | Dec 1995 | A |
| 6001418 | DeSimone et al. | Dec 1999 | A |
| 6277753 | Mullee et al. | Aug 2001 | B1 |
| 6401734 | Morita et al. | Jun 2002 | B1 |
| Entry |
|---|
| “Mechanism of Resist Pattern Collapse during Development Process”, Toshihiko Takana et al., Jul. 7, 1993, Jpn. J. Appl. Phys. vol. 32 (1993) pp. 6059-6064. |
| “Semiconductor Lithography” Wayne M. Moreau, Jan. 1988, Chapters 10 and 11. |