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Entry |
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“Mechanism of Resist Pattern Collapse during Development Process”, Toshihiko Takana et al., Jul. 7, 1993, Jpn. J. Appl. Phys. vol. 32 (1993) pp. 6059-6064. |
“Semiconductor Lithography” Wayne M. Moreau, Jan. 1988, Chapters 10 and 11. |