This application relates to cooling of semiconductor devices, and, more particularly, to two-phase cooling devices to cool semiconductor devices, power electronics, batteries, and other devices.
Electronics employing various semiconductor devices and integrated circuits are may be subjected to various environmental stresses. Applications of such electronics are extremely widespread, and utilize different semiconductor materials.
Many electronic environments, such as mobile devices or laptop computers may have thin/planar configurations, where many components are efficiently packed into a very confined space. As a result, cooling solutions that conform to thin/planar configurations may be beneficial. Charging ports that protrude substantially beyond the actual cooling device may occupy additional space. The additional space requirements for such charging ports may make them undesirable for many space constrained applications.
Low-profile charging ports disclosed herein may in some cases provide efficient space utilization to cool semiconductor devices in a large range of applications, including but not limited to aircraft, satellites, laptop computers, desktop computers, mobile devices, electric vehicles, and data centers.
The present application discloses two-phase cooling devices with low-profile ports. Two-phase cooling devices are a class of devices that can transfer heat with very high efficiency, and may include: heat pipes, thermal ground planes, vapor chambers and thermosiphons, and the like. Two-phase cooling devices may be ‘charged’ with one or more working fluids that exist in a liquid/vapor state, where the fluid adsorbs and releases thermal energy due to a phase change between the liquid and vapor state. It may be desirable to remove any contaminants while optionally leaving a small predetermined amount of non-condensable gas, during the charging process. Once the two-phase cooling device is charged through the port, the port may be hermetically sealed.
In some embodiments, the present application provides two-phase cooling devices with low-profile ports. In some embodiments, the two-phase device may comprise a predetermined amount of at least one working fluid, where the working fluid adsorbs or rejects heat by changing phases between liquid and vapor. In some embodiments, the two-phase device may further comprise a cavity formed from a metal structure or a metal alloy structure with at least one opening formed in at least one surface of the structure, wherein said opening may be configured as a port for partial filling of the cavity with the predetermined amount of at least one working fluid. In some embodiments, the two-phase device further may comprise at least one cover for said opening. In some embodiments, the cover may be configured to seal the cavity, to prevent the working fluid from leaving the cavity, and to prevent contaminants and non-condensable gas from entering the cavity.
In some embodiments, the application further provides a method for charging two-phase cooling devices with low profile ports, by first forming a cavity from a metal structure or a metal alloy structure. At least one opening may then be formed in the structure. A predetermined amount of working fluid may then be added through the opening to the inside of the cavity. The entire structure may then be exposed to a sufficiently low temperature, thereby freezing the working fluid inside the cavity. Once frozen, the structure may be exposed to low ambient pressure to extract contaminants, while optionally leaving a small predetermined amount of non-condensable gas in the cavity. The opening may then be covered by at least one cover. The cover maybe bonded to the structure, thereby sealing the cavity to prevent the working fluid from leaving the cavity, and to prevent contaminants and non-condensable gas from entering the cavity.
Referring now to the drawings in which like reference numbers represent corresponding parts throughout:
a, b, c and d show schematics of various illustrative device embodiments.
In the following description of the preferred embodiment, reference is made to the accompanying drawings which form a part hereof, and in which is shown by way of illustration a specific embodiment in which the embodiment may be practiced. It is to be understood that other embodiments may be utilized and structural changes may be made without departing from the scope of the present application.
In some embodiments, a two phase cooling device may be provided that is thinner and lighter than what is capable with the current state of art.
In some embodiments, a two phase cooling device may be provided that is more accurately charged with a predetermined amount of at least one suitable working fluid, wherein the predetermined amount of working fluid may be controlled with greater accuracy and repeatability.
In some embodiments, a two phase cooling device may be provided that is more accurately charged with a predetermined amount of at least one suitable working fluid, wherein a smaller fraction of contaminants and optionally a small predetermined amount of non-condensable gas, are contained within the cavity after charging.
In some embodiments, a two phase cooling device may be provided with a low profile and minimal lateral extent, where at least one minimally obtrusive port is located in the surface of the device, as opposed to a port protruding from the edge of the device, which is the current state of the art.
In some embodiments, a two phase cooling device may be provided that forms a sub-millimeter thin thermal ground plane.
In some embodiments, a two-phase cooling device is provided that comprises a charging port that contains substantially less dead volume inside the device, compared to the current state of the art.
In some embodiments, a two-phase cooling device may be provided that comprises a titanium metal structure containing a highly accurate and predetermined amount of suitable working fluid, and comprises a high-quality bond that seals the cavity and is less prone to leaking.
In some embodiments, a two-phase cooling device may be provided that comprises a titanium metal structure containing a predetermined amount of at least one working fluid, which is charged with a method that is compatible with titanium manufacturing processes.
In some embodiments, a two-phase cooling device may be provided that comprises a metal structure that is charged with a method that does not require direct mechanical contact between the cooling device charging port and the charging station, during the charging process.
In some embodiments, a two-phase cooling device may be provided that comprises a metal structure containing a predetermined amount of at least one working fluid that is charged with a method that does not require direct mechanical contact between the cooling device charging port and the charging station, during the charging process.
In some embodiments, a two-phase cooling device may be provided that comprises a metal structure that is charged with a method that allows the working fluid to be frozen during the charging process.
In some embodiments, a two-phase cooling device may be provided that comprises a metal structure that is charged with a method that allows the structure and predetermined amount of at least one working fluid to be exposed to low pressure after the working fluid is placed in the cavity, but before the cavity is sealed.
Two phase cooling devices are used in many semiconductor cooling applications, such as heat pipes in desktop and laptop computers. Heat pipes are typically 0.5 mm or significantly thicker and commonly manufactured using copper, aluminum, and respective alloys. In order for a two-phase cooling device to function properly, it must be charged with a suitable working fluid. This is commonly accomplished in heat pipes by: (1) physically connecting the end of a heat pipe to a charging station, (2) applying a vacuum to remove contaminants and non-condensable gas from the heat pipe, (3) flowing working fluid under controlled pressure into the heat pipe, (4) cold welding the end of the heat pipe (i.e. clamping the end shut), and (5) severing the connection between the heat pipe and charging station.
An example from this type of charging is shown in
Another example of prior art is shown in
In embodiments disclosed herein, two-phase cooling devices with low-profile ports are described including low-profile two-phase cooling devices that are less than 1 mm in thickness, and do not have ports that substantially protrude from the cooling device. The charging ports in existing methods have not achieved this goal, as exemplified by the implementations shown in
The two-phase thermal ground plane could be ‘charged’ by placing a predetermined amount of a working fluid into the cavity, removing undesirable contaminants, while optionally leaving a small predetermined amount of non-condensable gas, and then sealing the cavity. Opening 401 serves as a port where a predetermined amount of at least one working fluid can be placed into the open cavity. The working fluid can be water, ammonia, ethanol, methanol, liquid helium, mercury, sodium, indium, and other fluids, that are chosen based upon the desired operating conditions of the two-phase cooling device. In one embodiment, high-purity water is chosen as the working fluid. The two-phase cooling device can be exposed to a low-pressure to remove contaminants, while optionally leaving a small pre-determined amount of non-condensable gas. As shown in
In an illustrative embodiment, the working fluid may be placed in the cavity under a variety of chosen ambient pressures. For example, in one embodiment the ambient pressure can be chosen to be atmospheric pressure. In other embodiments, the pressure can be much higher or much lower than atmospheric pressure, depending upon the chosen working fluid.
In some embodiments, the two-phase cooling device port may be optionally not required to be in physical communication with a charging station, when the working fluid is being injected into the cavity. This provides flexibility in the methods that can be used for injecting a predetermined amount of working fluid into the cavity. For example, one can use pipette-type devices, inkjets, precision syringes and needles, microfluidic devices, and other fluid injection devices. This allows one to accurately and reliably inject anywhere from 10−4 grams to 102 grams of working fluid with higher tolerance and higher repeatability than can be accomplished with current cooler charging methods.
In one embodiment, the vacuum chamber access port 507 is opened, the thermal ground plane 500 metal structure containing the cavity 503, e.g. an uncharged TGP, is placed in the vacuum chamber 506, and the cover 504 is positioned next to the opening in the surface, as shown in
In other embodiments, the metal structure can be exposed to a low temperature by a variety of methods, including but not limited to, large heat sinks, thermal-electric coolers, refrigeration, gas expansion, and any other type of cooling process.
Once the working fluid is at a sufficiently low temperature (e.g. cryogenically frozen, as is the case for some embodiments), the metal structure can be exposed to low pressure by connecting the vacuum chamber to a vacuum pump. The low pressure can range greatly, between several atmospheres of pressure to pico-Torr levels of pressure, for example, depending upon the chosen working fluid and other manufacturing preferences. In a preferred embodiment, where the chosen working fluid is water, and the water has been cryogenically frozen, the low-pressure level can be chosen to be at the micro-Torr or milli-Torr range. The advantage of optionally deep freezing the working fluid and optionally choosing the low-pressure to be in the micro-Torr to milli-Torr range is that this process can remove significant amounts of contaminants, while optionally leaving a small pre-determined amount of non-condensable gas, in the cavity, while losing negligible amounts of working fluid through the process of sublimation, which provides a very accurate amount of working fluid contained within the cavity of the two-phase cooling device. In addition, the process of applying a low temperature before applying a low pressure to the structure can significantly reduce unwanted condensation of the working fluid onto the outside of the metal structure. This can be important for obtaining a high-quality bond between the cover and the metal structure, which is discussed below. Exact charging process temperatures and pressures will vary with the cooler design, the working fluid and the chosen large-scale manufacturing process.
The structure is exposed to low temperature and low pressure for a specified period of time, which can range from several seconds to a tens of minutes, depending upon many factors, including: the chosen working fluid, the predetermined amount of working fluid required, the size of the opening in the metal surface, the level of low temperature, the level of low pressure, and many other design factors. In some embodiments, the specified period of time can range from several seconds to several minutes.
After the specified period of time, and while the structure is still being exposed to low temperature and low pressure, the cover may be positioned directly above the opening in the surface. In an example embodiment, the cover is positioned from being in close proximity to the opening (as shown in
Once the cover 504 is positioned to encompass the opening 501 in the surface (as shown in
A low-profile port two-phase cooling device according to this disclosure was built and tested. The cooling device was made by wet etching titanium, and was of a size suitable for a personal computer application (for example, a mobile electronic device), 10 cm long, 3 cm wide, and 800 microns thick. The cooling device was charged with 800 milli-grams of lab grade pure water, and then placed in a liquid nitrogen bath (77 Kelvin) for approximately 20 minutes. Then a vacuum of approximately one micro-Torr was applied for approximately 20 minutes, followed by welding a cover over the opening, producing a working very low profile two-phase cooling device.
In some embodiments, the cover and structure can be bonded by other welding techniques, including but not limited to: diffusion bonding, friction stir, oxy-fuel, resistance welding, ultrasonic, magnetic pulse, exothermic, high frequency, hot pressure, induction welding, roll welding, brazing, soldering, shielded metal arc, flux-cored arc, gas tungsten arc, gas metal arc, submerged arc, electroslag, and using energy sources, including but not limited to, gas flame, electric arc, electron beam, friction, ultrasound, and many others, without loss of generality.
In some embodiments, the metal structure can optionally comprise a variety of metals, for example, scandium, titanium, vanadium, chromium, manganese, iron, cobalt, nickel, copper, zinc, yttrium, zirconium, niobium, molybdenum, technetium, ruthenium, rhodium, palladium, silver, cadmium, hafnium, tantalum, tungsten, rhenium, osmium, iridium, platinum, gold, mercury, rutherfordium, dubnium, seaborgium, bohrium, hassium, copernicium, aluminum, gallium, indium, tin, thallium, lead, bismuth, polonium, germanium, and their associated alloys.
In some embodiments, the structure can optionally comprise: ceramics, glass, polymers, liquid crystal polymers, and other structural materials.
Optionally in several embodiments, the cover can be thin and/or the structure surface recessed so that the cover is nearly flush (typically to within 0-250 microns) with the structure surface.
Optionally in yet another embodiment, the cover can be thinned and/or the structure surface can be recessed so that the cover becomes nearly flush (typically to within 0-250 microns) with the structure surface.
In a one method embodiment, the metal structure and cover are fabricated from titanium and/or a titanium alloy. The working fluid is chosen to be a predetermined amount of 10−6 to 103 grams (with accuracy ranging between micro-grams to milli-grams to grams) of pure water. The low temperature is chosen to be between 0° C. and cryogenic levels. The low pressure is chosen to be in the micro-Torr to milli-Torr range. The titanium cover is pulsed-laser micro-welded to the titanium structure, so that the cavity is hermetically sealed.
The embodiments shown in
An insulator device could be formed according to the method shown in
The embodiments described herein are exemplary. Modifications, rearrangements, substitute elements and processes, etc. may be made to these embodiments and still be encompassed within the teachings set forth herein.
This application claims priority to U.S. Provisional Application 62/017,455, filed Jun. 26, 2014. The following co-pending, with common inventorship and common ownership, U.S. patent applications are incorporated by reference in their entirety: U.S. Patent Application Ser. No. 61/082,437, filed on Jul. 21, 2008, by Noel C. MacDonald et al., entitled “TITANIUM-BASED THERMAL GROUND PLANE,” which application is incorporated by reference herein. U.S. patent application Ser. No. 13/685,579, filed on Nov. 26, 2012, by Payam Bozorgi et al., entitled “TITANIUM-BASED THERMAL GROUND PLANE,” which application is incorporated by reference herein. PCT Application No. PCT/US2012/023303, filed on Jan. 31, 2012, by Payam Bozorgi and Noel C. MacDonald, entitled “USING MILLISECOND PULSED LASER WLEDING IN MEMS PACKAGING,” which application is incorporated by reference herein.
This application is partially based on work accomplished with Government support under Grant (or contract) No. W9113M-04-01-0001 and Grant No. W31P4Q-10-1-0010 awarded by the U.S. Army. The Government has certain rights in this invention.
Number | Date | Country | |
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62017455 | Jun 2014 | US |
Number | Date | Country | |
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Parent | 14749439 | Jun 2015 | US |
Child | 15706706 | US |