Claims
- 1. A method of analyzing a substance in a mass spectrometer apparatus comprising an ion source, a quadrupole ion guide, and a linear ion trap, the method comprising the steps of:
(a) ionizing the substance to generate a stream of ions; (b) supplying the stream of ions to the quadrupole ion guide to select ions within a broad range of mass-to-charge ratios; (c) providing the stream of ions from the quadrupole ion guide to the linear ion trap for the generation and accumulation of fragment ions; (d) simultaneously with step (c) applying a first notched broadband waveform having a first notch width to the linear ion trap to select fragment ions within a predetermined mass range; and (e) analyzing the fragment ion spectrum after accumulation.
- 2. A method as claimed in claim 1, wherein step (c) comprises the step of applying radio frequency potential and a collision gas to the fragmented ions within the linear ion trap.
- 3. A method as claimed in claim 1, wherein step (d) includes selecting the first notch width such that the first notched broadband waveform excludes the range of resonant frequencies associated with the predetermined mass range.
- 4. A method as claimed in claim 1, wherein step (d) further comprises the step of adjusting the amplitude of the notched broadband waveform so as to promote the collision activated dissociation of ions whose fragmentation pathway involves the formation of fragment ions within the predetermined mass range.
- 5. A method as claimed in claim 4, wherein the step of adjusting the amplitude of the notched broadband waveform consists of ramping the amplitude of the notched broadband waveform through a predetermined range of values.
- 6. A method as claimed in claim 1, wherein step (d) is the initial step in the isolation of the fragment ion for the purposes of tandem mass spectrometry.
- 7. A method as claimed in claim 1, wherein step (d) is followed by the application of a second notched broadband waveform after the accumulation of the fragment ions within the linear ion trap is complete, said second notched broadband waveform having a second notch width that is less than the first notch width of the first notched broadband waveform.
- 8. A method as claimed in claim 1, wherein the fragment ion spectrum is analyzed after accumulation using a quadrupole mass detector.
- 9. A method as claimed in claim 1, wherein the fragment ion spectrum is analyzed after accumulation using a time-of-flight mass analyzer.
- 10. An apparatus for analyzing a substance, the apparatus comprising:
(a) an ion source for generating a stream of ions; (b) a quadrupole ion guide for receiving the stream of ions and for selecting ions within a broad range of mass-to-charge ratios; (c) a linear ion trap to receive the selected ions from the quadrupole ion guide and to generate and accumulate fragment ions from the stream of ions; (d) means for generating and applying a notched broadband waveform to the linear ion trap during the accumulation of fragment ions, said means being coupled to said quadrupole ion guide for selection of a mass range of fragment ions; and (e) a mass analyzer connected to the quadrupole ion guide, for receiving fragment ions from the linear ion guide and for analyzing the ion spectrum.
An apparatus as claimed in claim 10, further comprising means for providing radio frequency radiation and a collision gas to the fragmented ions within the second quadrupole ion guide.
- 11. An apparatus as claimed in claim 10, wherein the means for generating and applying a notched broadband waveform provides a first notched broadband waveform with a first notch width and a second notched broadband waveform with a second notch width, said second notch width being less than said first notch width.
- 12. An apparatus as claimed in claim 10, wherein the linear ion trap is a collision cell having a entrance plate and an exit plate, each of which is applied a blocking potential.
- 13. An apparatus as claimed in claim 10, wherein the mass analyzer comprises a quadrupole mass detector.
- 14. An apparatus as claimed in claim 10, wherein the mass analyzer comprises a time-of-flight mass analyzer.
Parent Case Info
[0001] This application claims priority from U.S. provisional patent application No. 60/341,751 filed Dec. 21, 2001.
Provisional Applications (1)
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Number |
Date |
Country |
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60341751 |
Dec 2001 |
US |