The present invention relates to a vapor chamber.
In recent years, devices have been subjected to higher degree of integration and upgrading for high performance, which results in an increase in heat emission. On the other hand, products have become smaller in size, which causes heat generation density to increase. Dissipating heat has become an important issue. This situation is found especially in the field of mobile terminals, such as smartphones and tablet devices. In recent years, a graphite sheet or the like has been often adopted as a heat dissipating member. However, the heat transport capacity of the graphite sheet is not large enough. Accordingly, application of various other heat dissipating members has been studied. In particular, use of a vapor chamber, which is a tabularly shaped heat pipe that can transport heat very efficiently, has been progressively studied.
The vapor chamber has a structure that includes a housing within which a working medium and a wick structure are disposed. The wick structure transports the working medium by using capillary forces. The working medium absorbs heat at an evaporation section of the vapor chamber that receives heat from a device that generates the heat. The working medium evaporates in the vapor chamber and moves to a condensation section where the working medium is cooled and returns to a liquid phase. The working medium after returning to the liquid phase moves toward the device that generates heat (i.e., toward the evaporation section) due to the capillary forces of the wick structure and cools the device. By repeating this process self-supportedly without using external power, the vapor chamber can quickly dissipate heat two-dimensionally by utilizing the latent heat of vaporization and condensation of the working medium.
A known vapor chamber of this type, for example, includes a sheet-like container, a wick structure enclosed in the container, and a working medium enclosed in the container (see Patent Document 1).
Patent Document 1: International Publication No. 2016/151916
Such a vapor chamber can be incorporated in various types of electronic devices. In an electronic device, other components may be disposed around the vapor chamber. When other components are present around the vapor chamber, a vapor chamber 101 may need to have a through hole 102 or a notch 103 formed therein so as to avoid interference with the components (see
Thus, an object of the present invention is to provide a vapor chamber that can suppress the likelihood of interference with other components while minimizing the deterioration in the heat transport capacity of the vapor chamber when the vapor chamber is mounted in an electronic device.
As the results of intensive studies to solve the above-described problems, the inventors provide a vapor chamber having a thin portion in order to avoid interference with other components disposed around the vapor chamber to complete the invention.
According to a first aspect of the invention, a vapor chamber includes a housing defining an internal space, and a working medium and a wick structure in the internal space of the housing. As viewed in a plan view, the vapor chamber has a first region with a first thickness and a second region with a second thickness, the second thickness being smaller than the first thickness.
According to a second aspect of the invention, a heat radiation device includes the vapor chamber of the present invention.
According to a third aspect of the invention, an electronic device includes the vapor chamber of the present invention or the heat radiation device of the present invention.
According to the present invention, by reducing the thickness of a portion of the vapor chamber, the interference with other components around the vapor chamber can be avoided while the deterioration in the heat transport capacity of the vapor chamber is minimized.
The following describes a vapor chamber according to the present invention in detail.
As illustrated in
As illustrated in
As illustrated in
Due to the second region having a smaller thickness as described above, the vapor chamber according to the present invention can be mounted in an electronic device while avoiding interference with other components being present around the vapor chamber to be mounted. In the second region 17, the first sheet 2 and the second sheet 3 are not joined, in other words, not in close and tight contact with each other although some portions may be in contact. Here, “close and tight contact” means a contact state in which the working medium enclosed in the vapor chamber in the second region 17 cannot enter the contact portion whether the working medium is in a liquid phase or in a gas phase. The second region 17 may have a heat transport capacity smaller than that of the first region 16 but does not totally lose the heat transport capacity. Thus, the vapor chamber according to the present invention includes the second region having a smaller thickness. This can suppress the likelihood of the vapor chamber interfering with other components being present around the vapor chamber when the vapor chamber is mounted in an electronic device and also can minimize deterioration in the heat transport capacity of the vapor chamber.
The vapor chamber 1a is generally formed into a tabular shape. In other words, the housing 4 generally has a tabular shape. Here, the “tabular shape” may include a shape like a panel or a shape like a sheet, which is a shape having the length and the width substantially greater than the height (thickness), for example, 10 or more times greater than the thickness, or preferably 100 or more times greater than the thickness.
The size of the vapor chamber 1a, in other words, the size of the housing 4, is not specifically limited here. The length (indicated by L in
The thickness T of the vapor chamber la in the first region 16 is not specifically limited, either, but may be preferably 100 μm or more and 600 μm or less, more preferably 200 μm or more and 500 μm or less.
The thickness t of the vapor chamber la in the second region 17 is not specifically limited insofar as it is smaller than the thickness T but may be preferably 500 μm or less, more preferably 300 μm or less, even more preferably 200 μm or less, still even more preferably 100 μm or less. For example, the thickness t may be 50 μm or more and 500 μm or less, or alternatively, 100 μm or more and 300 μm or less. The smaller the thickness t, the less interference with other components. The greater the thickness t, the more the heat transport of the vapor chamber 1a.
The difference between the thickness T and the thickness t may be preferably 10 μm or more, more preferably 50 μm or more, even more preferably 100 μm or more. For example, the difference may be 200 μm or more or may be 300 μm or more. For example, the difference between the thickness T and the thickness t may be 10 μm or more and 500 μm or less, or alternatively, 100 μm or more and 300 μm or less.
The ratio of the thickness t to the thickness T (t/T) is not specifically limited here but may be preferably 0.95 or less, more preferably 0.80 or less, even more preferably 0.60 or less. For example, the ratio may be 0.50 or less, 0.30 or less, or 0.20 or less. For example, the ratio of the thickness t to the thickness T may be 0.10 or more and 0.95 or less, 0.20 or more and 0.80 or less, or alternatively, 0.30 or more and 0.50 or less.
The materials of the first sheet 2 and the second sheet 3 are not specifically limited here insofar as they have characteristics appropriate for the vapor chamber, for example, thermal conductivity, strength, elasticity, and flexibility. The materials of the first sheet 2 and the second sheet 3 may be preferably a metal, for example, copper, nickel, aluminum, magnesium, titan, iron, or alloys thereof. The material may be more preferably copper. The first sheet 2 and the second sheet 3 may be formed of the same material or of different materials. However, the first sheet 2 and the second sheet 3 may preferably be formed of the same material.
The thickness of the first sheet 2 and the thickness of the second sheet 3 are not specifically limited here but may be preferably 10 μm or more and 200 μm or less, more preferably 30 μm or more and 100 μm or less. For example, the thickness may be 40 μm or more and 60 μm or less. The first sheet 2 and the second sheet 3 may have the same thickness or may have different thicknesses. Each of the first sheet 2 and the second sheet 3 may have a uniform thickness or may have a thinner portion. In the present embodiment, the first sheet 2 and the second sheet 3 may preferably have the same thickness. Moreover, each of the first sheet 2 and the second sheet 3 may preferably have a uniform thickness.
The first sheet 2 and the second sheet 3 are joined to each other at the peripheral portion thereof. The joining method is not specifically limited here but may be, for example, laser welding, resistance welding, diffusion bonding, soldering, TIG arc welding (tungsten inert-gas arc welding), ultrasonic bonding, and plastic molding. Laser welding, resistance welding, and soldering may be preferably used for joining.
First pillars 7 are disposed between the first sheet 2 and the second sheet 3. A plurality of the first pillars 7 are disposed on a major surface of the first sheet 2 that faces the internal space 5. The first pillars 7 support the first sheet 2 and the second sheet 3 from inside so as to maintain a predetermined distance therebetween. In other words, the first pillars 7 function as columns to support the first sheet 2 and the second sheet 3 of the vapor chamber. By disposing the first pillars 7 inside the housing 4, deformation of the housing can be suppressed in such a case that the inside of the housing is depressurized or an external pressure is applied to the housing from outside.
Second pillars 8 are disposed between the first sheet 2 and the second sheet 3. A plurality of the second pillars 8 are disposed on a major surface of the second sheet 3 that faces the internal space 5. By disposing a plurality of the second pillars, a working medium can be retained between the second pillars, which makes it easier to hold an increased amount of the working medium in the vapor chamber of the present invention. Increasing the amount of the working medium improves the heat transport capacity of the vapor chamber. Here, “second pillars” refers to relatively high portions raised from the nearby surface, which may include portions that protrude from the major surface. In addition to pillars or the like protruding from the major surface, the second pillars may include relatively high portions that are formed, for example, by recesses such as grooves in the major surface.
The height of the first pillars 7 are greater than the height of the second pillars 8. In an embodiment, the height of the first pillars 7 may be preferably 1.5 times or more and 100 times or less of the height of the second pillars 8. More preferably, with respect to the height of the second pillars 8, the height of the first pillars 7 may be 2 times or more and 50 times or less, even more preferably 3 times or more and 20 times or less, still even more preferably 3 times or more and 10 times or less.
The shape of each of the first pillars 7 is not specifically limited here insofar as the first sheet 2 and the second sheet 3 can be supported. However, each first pillar 7 may be preferably formed into a columnar shape, for example, a circular column, a rectangular column, a truncated cone, or a truncated pyramid.
The material of the first pillars 7 is not specifically limited here but may be, for example, a metal, such as copper, nickel, aluminum, magnesium, titan, iron, or alloys thereof. The material may be preferably copper. In some preferred embodiments, the material of the first pillars 7 may be the same as one or both of the materials of the first sheet 2 and the second sheet 3.
The height of the first pillars 7 may be set appropriately in accordance with the thickness of a desired vapor chamber. The height may be preferably 50 μm or more and 500 μm or less, more preferably 100 μm or more and 400 μm or less, even more preferably 100 μm or more and 200 μm or less. For example, the height may be 125 μm or more and 150 μm or less. Here, the height of the first pillars is the height measured in the thickness direction of the vapor chamber. Note that as described above, in the vapor chamber 1a, the height of the first pillars 22 (7) in the second region 17 is smaller than the height of the first pillars 21 (7) in the first region 16. In other words, in the vapor chamber 1a, the height of the first pillars is not uniform but may vary according to requirements of a location where the vapor chamber la is installed.
The thickness of each of the first pillars 7 is not specifically limited insofar as it provides a strength enough to suppress deformation of the housing of the vapor chamber. However, a circle equivalent diameter of a section of each first pillar 7 taken perpendicular to the vertical direction may be, for example, 100 μm or more and 2000 μm or less, preferably 300 μm or more and 1000 μm or less. Increasing the circle equivalent diameter of the first pillar can better suppress the deformation of the housing of the vapor chamber. On the other hand, decreasing the circle equivalent diameter of the first pillar can provide a larger space in which the vapor of the working medium moves.
The pattern of arranging the first pillars 7 is not specifically limited but may be preferably an equidistant arrangement, in other words, a grid-like pattern in which, for example, first pillars 7 are disposed on equidistant grid points. The equidistant arrangement of the first pillars provides a uniform strength over the entire vapor chamber.
The number of the first pillars 7 and the distance therebetween in this arrangement are not specifically limited here. However, the number of the first pillars 7 per 1 mm2 of major surface area of one of the sheets defining the internal space of the vapor chamber may be preferably 0.125 pillars or more and 0.5 pillars or less, more preferably 0.2 pillars or more and 0.3 pillars or less. Increasing the number of the first pillars can better suppress deformation of the vapor chamber (or the housing). On the other hand, decreasing the number of the first pillars can provide a larger space in which the vapor of the working medium moves.
The first pillars 7 may be formed integrally with the first sheet 2. Alternatively, the first pillars 7 may be formed separately and thereafter fixed to the first sheet 2 at predetermined positions.
The height of each of the second pillars 8 is not specifically limited here but may be preferably 1 μm or more and 100 μm or less, more preferably 5 μm or more and 50 μm or less, and even more preferably 15 μm or more and 30 μm or less. Increasing the height of each second pillar can increase the amount of the working medium retained therein. On the other hand, decreasing the height of each second pillar can provide a larger space in which the vapor of the working medium moves (i.e., a larger space on the side of the first pillars). Accordingly, adjusting the height of the second pillars can adjust the heat transport capacity of the vapor chamber.
The distance between adjacent second pillars 8 is not specifically limited but may be preferably 1 μm or more and 500 μm or less, more preferably 5 μm or more and 300 μm or less, even more preferably 15 μm or more and 150 μm or less. Decreasing the distance between adjacent second pillars can increase capillary forces. Increasing the distance between adjacent second pillars can improve permeability.
The shape of each second pillar 8 is not specifically limited here but may be formed into a circular column, a rectangular column, a truncated cone, or a truncated pyramid. Moreover, each second pillar 8 may be shaped like a wall, in other words, such a shape that a groove is formed between adjacent second pillars 8.
The second pillars 8 may be formed integrally with the second sheet 3. Alternatively, the second pillars 8 may be formed separately and thereafter fixed to the second sheet 3 at predetermined positions.
The type of the above-described wick structure 6 is not specifically limited insofar as the wick structure enables the working medium to move due to capillary forces. The capillary structure that generates capillary forces to cause the working medium to move is not specifically limited here but may be a known structure used in a known vapor chamber. For example, the above capillary structure may encompass micro structures, such as a fibrous structure, a pleated structure, or a reticular structure, which have irregularities, for example, pores, grooves, or protrusions.
The thickness of the wick structure 6 is not specifically limited here but may be, for example, 5 μm or more and 200 μm or less, preferably 10 μm or more and 80 μm or less, and more preferably 30 μm or more and 50 μm or less.
The size and the shape of the wick structure 6 is not specifically limited here. However, for example, the wick structure 6 may preferably have such a size and shape that the wick structure 6 can be disposed continuously from an evaporation section to a condensation section within the housing.
The type of working medium described above is not specifically limited insofar as it is subjected to gas-liquid phase transition in the environment inside the housing. For example, materials, such as water, an alcohol, or a chlorofluorocarbon substitute may be used. According to an embodiment, the working medium is an aqueous compound, preferably water.
The vapor chamber 1a according to an embodiment of the present invention has been described. As described above, in the vapor chamber 1a according to the present embodiment, the height of the first pillars 7 is made smaller in the second region than that in the first region, and thereby the thickness of the vapor chamber 1a in the second region is made smaller than the thickness in the first region. However, the present invention is not limited to this embodiment. As in embodiments described below, the thickness of the vapor chamber in the second region may be made smaller than that in the first region by changing the configuration of the vapor chamber instead of changing the configuration of the first pillars 7.
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The vapor chamber according to the present invention has been described through several embodiments. The vapor chamber according to the present invention includes a portion of which the thickness is reduced. Accordingly, when the vapor chamber is mounted on an electronic device or the like, the thickness-reducing portion can suppress the likelihood of the vapor chamber interfering with other components being present around the vapor chamber while the deterioration in the heat transport capacity of the vapor chamber is minimized. In a known vapor chamber, a through hole or a notch has been formed so as to avoid interference with other components. On the other hand, the vapor chamber according to the present invention can avoid interference with other components without changing its original shape such as a rectangle. This can reduce the likelihood of deterioration of mechanical strength or the likelihood of deformation or warping, which otherwise may occur to the vapor chamber when a notch or the like is formed. In addition, in the vapor chamber according to the present invention, the joint and sealing portion can be made into a simple shape, which leads to easy manufacturing of the vapor chamber and also leads to improvement in reliability.
Note that the present invention is not limited to the configurations of the above-described vapor chambers but may be subject to design change to the extent without departing from the gist of the invention.
For example, the planar shape of the vapor chamber according to the present invention (i.e., the planar shape of the housing 4) is a rectangle in the above embodiments. However, the planar shape is not limited to this shape. For example, the planar shape of the vapor chamber may be a polygon such as a triangle and a rectangle, a circle, an oval, or combinations thereof. In a preferred embodiment, the planar shape of the vapor chamber according to the present invention is a rectangle. The vapor chamber according to the present invention has the rectangular planar shape, which enables the vapor chamber to maintain a high mechanical strength and reduce overall deformation and warping. It also contributes to easy manufacturing of the vapor chamber.
In the above embodiments, as illustrated in
In an embodiment, the second region 17 may be formed so as to be surrounded by the first region 16 as illustrated in
In another embodiment, a plurality of the second regions 17, for example, two, three, four, or more of the second regions 17, may be formed. For example, as illustrated in
Moreover, the second region 17 may have any suitable shape, for example, a shape corresponding to a component of an electronic device on which the vapor chamber according to the invention is mounted.
The thickness of the vapor chamber in the second region is made small in various configurations of the above embodiments. These configurations may be combined in any suitable manner insofar as they can be combined.
For example, in an embodiment, the first embodiment (
In another embodiment, the fourth embodiment (
As illustrated in
The vapor chamber according to the present invention can be preferably applied to electronic devices having various internal configurations.
Number | Date | Country | Kind |
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JP2017-190730 | Sep 2017 | JP | national |
The present application is a continuation of International application No. PCT/JP2018/036006, filed Sep. 27, 2018, which claims priority to Japanese Patent Application No. 2017-190730, filed Sep. 29, 2017, the entire contents of each of which are incorporated herein by reference.
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Number | Date | Country | |
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Parent | PCT/JP2018/036006 | Sep 2018 | US |
Child | 16535662 | US |