This disclosure generally concerns a window device.
The typical or prior art deposition temperature for physical vapor deposited vanadium oxide with significant VO2 bonding content is 500° C.
As used in the present disclosure, thermochromic material layer means that the material layer has an emittance value that varies with the temperature of the device structure material.
For example, devices can be smart window devices or infrared detector devices.
Here, deposition can occur at a temperature of below or about 115° C.
This disclosure describes devices that use low temperature deposited atomic layer deposition vanadium oxide, deposited at a temperature of about or below 115° C., and a method of making.
For example, devices can be smart window devices.
This disclosure describes devices that can use low temperature deposited atomic layer deposition vanadium oxide, deposited at a temperature at about 115° C. or below, and methods of making. For example, devices can be smart window devices or infrared detector devices.
This disclosure describes a window device structure and a method to fabricate a window device structure.
The typically deposition temperature for physical vapor deposited vanadium oxide with significant VO2 bonding content is 500° C.
As used in the present disclosure, thermochromic material layer means that the material layer has an emittance value that varies with the temperature of the device structure material.
This disclosure describes a window device structure and a method to fabricate a window device structure.
In one embodiment of the window device structure, the window device structure may have a variable emittance characteristic. The window device structure may include a transparent substrate material that may comprise a transparent glass or transparent polymer material. The transparent substrate may be a flexible substrate.
In one embodiment of the present disclosure, the window device structure may contain one or more variable emittance material layer(s) between the first surface of the substrate and the first surface of the window device structure.
The variable emittance characteristic influences the amount of thermal energy radiated into the environment from the outer surface of the window device structure. One aspect of the window device structure is that the emittance varies as a function of the temperature of the variable emittance material layers. One aspect of the window device structure is that the variable emittance material layer(s) may have themochromic characteristics. The emittance of the window device structure is not actively controlled by applying external voltage or current but has a passive control of the variable emittance value.
One aspect of the window device structures is that the window device structure may be a passive smart window device structure. The variable emittance property of the variable emittance material layer may include a lower emittance for a range of higher temperatures and higher emittance for a range of lower temperatures. The variable emittance property of the variable emittance material layer may include a gradual reduction in the emittance values as the temperature is increase from a low temperature to a high temperature. The variable emittance property of the variable emittance material layer may include a range of temperatures, switching temperature (also known as phase transition temperature) where there is a significant change in emittance value.
One aspect of the present disclosure is that the window device structure may be transparent for visible wavelengths.
One aspect of the window device structure is that the emittance is not controlled by an externally applied electric voltage or current and thus the emittance value is passively controlled.
The smart window structure may include a substrate that comprise a glass or polymer material. In some embodiments, the substrate is transparent to visible wavelengths. In some embodiments, the substrate is transparent to infrared wavelengths. In some embodiments, the substrate is transparent to ultraviolet wavelengths. In some embodiments, the glass may be a flexible glass. In some embodiments, the polymer may be a flexible polymer.
Two polymer materials that are advantageous for flexible substrates because of low linear coefficient of thermal expansion, low moisture absorption, large Young's modulus, large tensile strength are Polyethylene terephthalate (PET) and polyethylene naphthalate (PEN), however, PET and PEN have relatively low glass transition temperature and maximum process temperature. PET has a glass transition temperature of about 78° C. and PEN has a glass transition temperature of about 121° C. PET has a maximum process temperature of about 150° C. and PEN has a maximum process temperature of about 200° C. It is advantageous for the deposition process for depositing vanadium oxide material has a process temperature less than 150° C. for PET and a process temperature less than about 200° C. for PEN substrates. The low ALD deposition temperature for depositing vanadium oxide materials is advantageous for the use of PET and PEN flexible substrates. For example, Polyethylene terephthalate (PET) has a linear thermal expansion coefficient of about 15 ppm/° C. and polyethylene naphthalate (PEN) has a linear coefficient of thermal expansion of about 13 ppm/° C. at 300K. Low ALD deposition temperature enables elements on a flexible polymer material substrate with linear coefficient of expansion less than 25 ppm/° C. 1737 glass has a linear coefficient of thermal expansion of about 5 ppm/° C. PET and PEN absorb little water. The moisture absorption percentage for PET and PEN is about 0.14%. PET has a Young's modulus of about 5.3 GPa and PEN has a Young's Modulus of about 6.1 GPa. PET has a tensile strength of about 225 MPa and PEN has a Young's' Modulus of 275 MPa.
A comparison of the properties of PET and PEN compared to other plastic substrates for flexible substrate applications is given in Table 4.1 on page 78 of Flexible Electronics: Materials and Applications (2009) Springer edited by William S. Wong and Alberto Salleo.
The variable emittance material layer may comprise compounds of transition metal atoms that may include one or more of vanadium, lanthanum, manganese, titanium, or tungsten. In some embodiments, the transition metal atom is bonded with one or more oxygen atom(s). In some embodiments, the transition metal in the variable emittance material layer is bonded to one or more oxygen atoms to form a metal oxide.
In some embodiments, the variable emittance material layer may comprise a vanadium oxide material layer with VO2 bonding content within the vanadium oxide material. In some embodiments, the variable emittance material layer may comprise multiple phases of transition metal compound. In some embodiments, the variable emittance material layer may comprise composite of VO2 phase material, V2O5, phase material, V2O3, and, V6O13, and combinations thereof. In some embodiments, the variable emittance material layer comprises a composite for multiple vanadium oxide phases that is designated as VOx material.
The vanadium oxide film may comprise crystalline VO2 material structures. The crystalline VO2 material structure may comprise crystalline VO2 grains, nanocrystals, or films. The vanadium oxide film with significant percentage of VO2 crystalline material structures may have a reversible, temperature-dependent metal-to-insulator (MIT) phase transition temperature having a lower emittance values in the metal state in the insulator state. Vanadium oxide material with significant percentage of crystalline VO2 bonded material structure may have a metal-to-insulator phase transition temperature of about 68° C. Below the phase transition temperature, the material is insulating and transparent, but above the phase transition temperature, the vanadium oxide film becomes metallic and reflective. A variable emittance layer with a lower emittance value in one state and a higher emittance value in a second state is sometimes known as a two-step variable emittance layer. The metal-to-insulator phase transition temperature can be reduced by doping the variable emittance material layer(s) with dopant atoms that may include, but not be limited to, tungsten or molybdenum atoms.
In some embodiments, low temperature processes such as atomic layer deposition may be used to deposit the variable emittance material layer. In one embodiment, the one or more variable emittance material layer can optionally be an atomic layer deposition (ALD) deposited vanadium oxide material layer that has VO2 bonding content within the vanadium oxide material. In one embodiment, the one or more variable emittance material layer can be an atomic layer deposition (ALD) deposited vanadium oxide material layer that has VO2 bonding content within the vanadium oxide material and that comprise dopant atoms such as tungsten atoms have the advantage of modifying the phase transition temperature. In one embodiment, the variable emittance material layer may be deposited using sputtering approach or physical vapor deposition techniques.
The vanadium oxide film may comprise amorphous material. The vanadium oxide film may comprise amorphous material with a high VO2 bonding content. A vanadium oxide amorphous film with a high VO2 content may have a gradual change in emittance or resistance value with operation temperature. For certain fabrication process using selected precursor material, a vanadium oxide film deposited by atomic layer deposition at 150° C. is an amorphous material film with a high VO2 content and has a gradual change in emittance and resistance values with operating temperature.
In some embodiments, the variable emittance layer has a gradual change in emittance values as a function of temperature. In some embodiments, the variable emittance layer has a gradual change in emittance properties and resistance value between 500° K and 77° K.
The window device structure may contain one or more optional transparent low emittance material layer between the second side of the variable emittance layer and the first surface of the substrate such that the transparent low emittance material layer has an emittance value that is lower than the emittance value of the variable emittance material layer(s). The transparent low emittance material layer with selected emittance value can lower the overall emittance value of the smart window structures.
The window device structure may comprise an optional transparent strain optimizing material layer on the second side of the variable emittance layer that optimizes the strain in the variable emittance material layer. The process of optimizing the strain in the variable emittance material layer may modify the switching temperature (phase transition temperature) of the variable emittance layer. The process of optimizing the strain in the variable emittance material layer may lower the switching temperature (phase transition temperature) to a lower switching temperature (phase transition temperature value). The transparent strain optimizing material layer may also comprise a protection material layer. The protection material layer would provide protection from oxidation and humidity on the second side of the variable emittance layer.
In an embodiment, a transparent material layer may be deposited on the first surface (first side) of the variable emittance layer to provide protection from oxidation and humidity. In an embodiment, a transparent material layer may be coated on the first surface of the variable emittance layer to provide protection from being etched by acids used in the fabrication process.
The window device structure may include one or more optional antireflection material layer(s) on the first side of the variable emittance layer between the variable emittance layer and the air or vacuum outside environment.
The window device structure may include an optional hydrophobic coating layer on the outer surface that may reduce dust buildup on the window.
Optically Transparent Material Layer(s) with Selected Emittance Value
The smart window material structure may include one or more optical transparent material layer(s) with selected emittance value. The optical transparent material layer (s) will typically be one of the material layers between the glass substrate and the variable emittance material layer.
In some embodiments, the optical transparent material layer(s) may comprise a metal layer, a metal layer with plasmonic properties, a transparent conductive oxide layer, a transparent conductive oxide layer with plasmonic properties, a semiconductor material, a semiconductor material with plasmonic properties, a layer of metal nanowires, a layer of metal nanowires with plasmonic properties, a layer of transparent conductive oxide nanowires, a layer of transparent conductive oxide nanowires with plasmonic properties, a layer of semiconductor nanowires, a layer semiconductor nanowires with plasmonic properties, a layer of metal nanoparticle, a layer of metal nanoparticles with plasmonic properties, a layer of transparent conductive oxide nanoparticle, a layer of transparent conductive oxide nanoparticles with plasmonic properties, a layer of semiconductor nanoparticles, a layer of semiconductor nanoparticles with plasmonic properties.
Optical Transparent Material Layer with Plasmonic Material Properties
The window material structure may include one or more optical transparent material layer(s) with selected emittance value. The optical transparent material layer (s) will typically be one of the material layers between the glass substrate and the variable emittance material layer. In some embodiments, the optical transparent material layer(s) may comprise a metal layer with plasmonic properties, a transparent conductive oxide layer with plasmonic properties, a semiconductor material with plasmonic properties, a layer of metal nanowires with plasmonic properties, a layer of transparent conductive oxide nanowires with plasmonic properties, a layer semiconductor nanowires with plasmonic properties, a layer of metal nanoparticles with plasmonic properties, a layer of transparent conductive oxide nanoparticles with plasmonic properties, or a layer of semiconductor nanoparticles with plasmonic properties.
The smart window structure may include optional material layer(s) between the substrate and the optically transparent material layer(s) with selected emittance value. The optional material layers may comprise material layers that are designed to be hermetic, improve adhesion, improve nucleation, or accommodate strain differences. In addition, the optional material layers may include transparent low emittance material layer, strain optimizing material layer, variable emittance material layer, oxidation protection material layer, acid protection material layer, anti-reflecting layer, and hydrophobic coating
In some embodiments, the variable emittance material layer is deposited on the first surface of a substrate. The substrate may be a transparent substrate that is optionally flexible. The substrate may comprise a glass, a polymer, or a composite material. An optional protection material layer may be deposited on the first surface of the variable emittance material layer. An optional hydrophobic material layer may be deposited on the optional protection material layer or alternately on the surface of the variable emittance material layer.
In some embodiments, the variable emittance material layer is deposited on the first surface of a substrate. The substrate may be a transparent substrate that is optionally flexible. The substrate may comprise a glass, a polymer, or a composite material. An optional protection material layer may be deposited on the first surface of the variable emittance material layer. An optional antireflection material layer may be deposited on the optional protection material layer or alternately on the surface of the variable emittance material layer.
In some embodiments, the substrate may be a transparent substrate that is optionally flexible. The substrate may comprise a glass, a polymer, or a composite material. An optional transparent strain optimizing material layer to optimize strain in the variable emittance layer to optimize the phase transition temperature of the variable emittance material layer may be deposited on the substrate. The variable emittance material layer may be deposited on the surface of the optional transparent strain optimizing material layer to optimize strain in the variable emittance layer. An optional protection material layer may be deposited on the first surface of the variable emittance material layer. An optional antireflection material layer may be deposited on the optional protection material layer or alternately on the surface of the variable emittance material layer.
In some embodiments, the substrate may be a transparent substrate that is optionally flexible. The substrate may comprise a glass, a polymer, or a composite material. An optional transparent conductive oxide (for example fluorine doped tin oxide, antimony oxide, gallium doped ZnO, or aluminum doped ZnO may be deposited on the substrate. An optional transparent strain optimizing material layer to optimize strain in the variable emittance layer to optimize the phase transition temperature of the variable emittance material layer may be deposited on the optional transparent conductive oxide or the substrate. The variable emittance material layer may be deposited on the surface of the optional transparent strain optimizing material layer to optimize strain in the variable emittance layer. An optional protection material layer may be deposited on the first surface of the variable emittance material layer. An optional antireflection material layer may be deposited on the optional protection material layer or alternately on the surface of the variable emittance material layer.
In some embodiments, the substrate may be a transparent substrate that is optionally flexible. The substrate may comprise a glass, a polymer, or a composite material. A transparent low emittance material layer comprising a metal (for example PVD deposited platinum metal, ALD deposited platinum metal, electroless deposited platinum metal, electroless deposited silver metal, electroless deposited ruthenium metal, ALD deposited silver metal, ALD deposited ruthenium metal, gold nanoparticles, silver nanoparticles, or platinum nanoparticles may be deposited on the substrate. The variable emittance material layer may be deposited on the surface of the transparent low emittance material layer. An optional protection material layer may be deposited on the first surface of the variable emittance material layer. An optional antireflection material layer may be deposited on the optional protection material layer or alternately on the surface of the variable emittance material layer.
In some embodiments, the substrate may be a transparent substrate that is optionally flexible. The substrate may comprise a glass, a polymer, or a composite material. The variable emittance material layer may be deposited on the surface of the substrate or optionally on the surface of a transparent strain optimizing material layer. An optional protection material layer may be deposited on the first surface of the variable emittance material layer. An optional antireflection material layer may be deposited on the optional protection material layer or alternately on the surface of the variable emittance material layer. A transparent low emittance material layer comprising a metal (for example PVD deposited platinum metal, ALD deposited platinum metal, electroless deposited platinum metal, electroless deposited silver metal, electroless deposited ruthenium metal, ALD deposited silver metal, ALD deposited ruthenium metal, gold nanoparticles, silver nanoparticles, or platinum nanoparticles may be deposited on the second surface of the substrate.
In the Etched Copper Foil Substrate method, the process steps may include:
In the Adhere Transparent Substrate and Peel method, the process steps may include:
In the Transfer of Film Layer to Transparent Substrate method, process steps may include:
In the Laser Anneal of Variable Emittance Thermochromic Film method, the process steps may include:
The method to fabricate the smart window structure may include low temperature processes.
The low temperature processes may comprise atomic layer deposition to deposit the variable emittance material layer, atomic layer deposition to deposit the optical transparent material layer with selected emittance value, atomic layer deposition to deposit the transparent strain optimizing material layer, atomic layer deposition of the optical transparent material layer with selected emittance, physical vapor deposition of the optical transparent material layer with selected emittance value, laser annealing of one or more of the material layers, rapid thermal annealing of one or more of the material layers, or deposition of nanoparticles to form the optical transparent material layer with selected emittance value. The variable emittance layer as deposited by atomic layer deposition or physical vapor deposition can have a gradual change emittance value with temperature. Annealing can convert an atomic layer deposition or physical vapor deposited variable emittance layer into a crystalline, polycrystalline, of nanocrystalline material that has a two-step metal-to-insulator transition with a lower emittance value in one state and a higher emittance value with a gradual transition in emittance value between the two states. A typical annealing condition to achieve a two-step vanadium oxide variable emittance layer is annealing in a low oxygen pressure ambient at temperature in the range of about 450° C. to about 600° C. The laser anneal of the variable emittance layer can crystallize the variable emittance layer into a crystalline, polycrystalline, of nanocrystalline material that has a two-step metal-to-insulator transition. The laser anneal deposits heat primarily into the variable emittance material layer and does not increase the temperature of the substrate. Thus, laser annealing of the variable emittance layer is compatible with a two-step metal-to-insulator variable emittance layer on a flexible polymer substrate. One advantage of low process temperature is that variable on a flexible polymer substrate or a flexible glass substrate.
The transparent low emittance material layer, transparent strain optimizing material layer, variable emittance material layer, oxidation protection material layer, acid protection material layer, anti-reflecting layer, and optional hydrophobic coating layer may be deposited in the same ALD growth system
The method to fabricate the smart window structure may include low temperature processes. The low temperature processes may comprise atomic layer deposition (ALD) to deposit the variable emittance material layer, atomic layer deposition to deposit the optical transparent material layer with selected emittance value, laser annealing, rapid thermal annealing, or deposition of nanoparticles to form the optical transparent material layer with selected emittance value.
The ALD growth system may be a roll-to-roll growth system.
In some embodiments, an optional anneal process may be used to optimize the properties of the variable emittance material. In one embodiment, the optional anneal process may increase the VO2 bonding content in the variable emittance material layer. In one embodiment, an optional anneal process may be used to increase the VO2 bonding content within the vanadium oxide material. In one embodiment, an optional laser anneal process may be used to optimize the properties of the variable emittance material layer. In one embodiment, the optional laser anneal process may increase the VO2 bonding content in the variable emittance material layer. In one embodiment, the optional laser anneal may convert an amorphous film to a crystalline film, a polycrystalline film, or a nanocrystalline film. In one embodiment, an optional rapid thermal anneal process may be used to optimize the properties of the variable emittance material layer. In one embodiment, the optional rapid thermal anneal process may increase the VO2 bonding content in the variable emittance material layer.
In some embodiments, the variable emittance material layer is grown by atomic layer deposition.
In one example, vanadium oxide films were deposited by atomic layer deposition (ALD) at 150° C. using tetrakis(ethylmethyl)amido vanadium (TEMAV, Air Liquide Electronics) and ozone precursors with film thicknesses ranging from 7-34 nm. This particular vanadium precursor may help facilitate the preferential formation of VO2 since it is already in the 4+ oxidation state. Optimized pulse and purge sequences resulted in a growth rate of 0.7-0.9 Å/cycle, consistent with previous reports. X-ray photoelectron spectroscopy was performed to determine the quality, stoichiometry, and depth uniformity of the amorphous films. All films exhibited adventitious carbon contamination on the surface of the films due to atmospheric transfer from the ALD chamber. In addition, the top ˜1 nm of the film exhibited two V2p peaks at 517.7 and 516.3 eV correlating to V2O5 and VO2 components of the film, respectively. However after removing the top surface, no residual carbon contamination was detected and the films had only a single VO2 peak. The full-width-at-half-max of the single VO2 peak ranged from 2-2.7 eV, which is smaller than typically seen for VO2 films, and is indicative of the high uniformity and quality of these films. By depth profiling through the film, a shoulder on the low binding energy side of the V2p peak (513.5 eV) was revealed near the VOx/Si interface, suggesting that the initial film is highly oxygen deficient.
Electrical performance of these amorphous films, on both sapphire and SiO2/Si insulating substrates, was assessed from 77-500K. The deposited amorphous vanadium oxide films showed an exponential change in resistance of ten orders of magnitude over the entire temperature range from 77K to 500K. This data results in an average activation energy of −0.20 eV and temperature coefficient of resistance of 2.39% at 310K. This shows the potential to use amorphous vanadium oxide films, which are not as structurally ordered, to induce more gradually electrical and optical changes.
While the above description provides example embodiments, it will be appreciated that the present invention is susceptible to modification and change without departing from the fair meaning and scope of the accompanying claims. Accordingly, what has been described is merely illustrative of the application of aspects of embodiments of the invention and numerous modifications and variations of the present invention are possible in light of the above teachings.
An advantage is that the ALD vanadium oxide film can be deposited at low temperatures The ALD vanadium oxide film can be deposited at a temperature as low as 115° C. The low deposition temperature capability enables the ALD vanadium oxide film to be deposited on polymer substrate material. The low deposition temperature is advantageous to enable the deposition on a greater number of polymer material types then would be possible for higher deposition temperature approach. The low deposition temperature of the ALD vanadium oxide film deposition is advantageous to enable the deposition on a greater number of glass material type then would be possible for a higher deposition temperature deposition approach. The polymer substrate material or the glass substrate material can be flexible.
An advantage is that transparent low emittance material layer, transparent strain optimizing material layer, variable emittance material layer, oxidation protection material layer, acid protection material layer, anti-reflecting layer, and optional hydrophobic coating layer may be deposited in the same ALD growth system.
An advantage is that the ALD process is a very uniform deposition, has repeatable emittance properties, and is pinhole free.
An advantage is that the ALD process can be a manufacturable process and can be implemented using role to role processing.
An advantage is that the ALD process is economical because the ALD process uses small amounts of precursor material.
The ALD vanadium oxide film can be deposited at low temperatures The ALD vanadium oxide film can be deposited at as low as 115° C. The low deposition temperature capability enables the ALD vanadium oxide film to be deposited on polymer material. The low deposition temperature of the ALD vanadium oxide film deposition is advantageous to enable the deposition on a greater number of glass material type then would be possible for a higher deposition temperature deposition approach.
The ALD vanadium oxide film can be deposited on three-dimensional surfaces. The ability to deposit on three dimensional surface enable a larger effective thickness of the vanadium oxide material for increasing infrared electromagnetic absorption for infrared sensing applications or a larger effective thickness for increasing terahertz electromagnetic absorption for terahertz absorption
The ALD vanadium oxide film offers advantages in a variety of applications including electrochemical applications, energy storage and conversion processes, thermoelectric devices, Mott transistors, and smart windows. Integrating solar cells that can efficiently harness and store solar energy into windows that require the material to be transparent has remained challenging.
Many modifications and variations of the present invention are possible in light of the above teachings. It is therefore to be understood that the claimed invention may be practiced otherwise than as specifically described. Any reference to claim elements in the singular, e.g., using the articles “a,” “an,” “the,” or “said” is not construed as limiting the element to the singular.
This application claims priority to and the benefits of U.S. Patent Application No. 62/012,600 filed on Jun. 16, 2014, the entirety of which is herein incorporated by reference.
Number | Date | Country | |
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62012600 | Jun 2014 | US |
Number | Date | Country | |
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Parent | 14729441 | Jun 2015 | US |
Child | 14731235 | US |