Wafer probe plate holder

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Information

Patent Grant
D320361

References
Source

Patent Number
D320,361
Date Filed
Friday, June 2, 1989
35 years ago
Date Issued
Tuesday, October 1, 1991
33 years ago

Inventors
- Wataru Karasawa
Original Assignees
- TOKYO ELECTRON LIMITED
Examiners
- Holtje; Nelson C.
- Davis; Antoine D.
Agents
- Oblon, Spivak, McClelland, Maier & Neustadt

US Classifications
- D10 - Measuring, testing, or signalling instruments
Field of Search
- US
- D10 46
- D10 80
- D10 103
- D08 349
- D08 399
- 324 158 F
- 324 158 P
- Term of Grant
  14Years

Information

Abstract

Description

Claims

The ornamental design for a wafer probe plate holder, as shown and described.

US Referenced Citations (7)

Number	Name	Date	Kind
4219771	Reid et al.	Aug 1980
4649338	Dugan	Mar 1987
4649339	Grangroth et al.	Mar 1987
4755747	Sato	Jul 1988
4853627	Gleason et al.	Aug 1989
4862077	Horel et al.	Aug 1989
4961052	Tada et al.	Oct 1990