Wafer prober

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Information

Patent Grant
D383683

References
Source

Patent Number
D383,683
Date Filed
Thursday, April 25, 1996
28 years ago
Date Issued
Tuesday, September 16, 1997
26 years ago

Inventors
Original Assignees
- TOKYO ELECTRON LIMITED
Examiners
- Davis; Antoine Duval
Agents
- Ladas & Parry

US Classifications
- D10 - Measuring, testing, or signalling instruments
Field of Search
- US
- D10 46
- D10 75
- 269 13
- 269 14
- 269 20
- 269 21
- 269 296
- 269 903
- 324 1581
- 324 754
- 324 762
- 324 761
International Classifications
- 1004
- Term of Grant
  14Years

Information

Abstract

Description

Claims

The ornamental design for wafer prober, as shown.

US Referenced Citations (4)

Number	Name	Date	Kind
D264873	Olson et al.	Jun 1982
D350490	Takao	Sep 1994
5107206	Yanagi et al.	Apr 1992
5506512	Tozawa et al.	Apr 1996