Claims
- 1. A method for soldering on a reflow side of a work-piece by bringing the work-piece into contact with a wave molten solder, wherein a soldering process is performed while controlling an immersion depth of the work-piece into the wave molten solder to be constant.
- 2. The method of claim 1, wherein the immersion depth is controlled by steps of:detecting a displacement amount of the work-piece in a direction perpendicular to the reflow side; and adjusting one of a height position of the work-piece and a wave height of the wave molten solder in a vertical direction based on the displacement amount.
- 3. The method of claim 2, wherein:the step of detecting the displacement amount includes steps of detecting the displacement amount at a plurality of points of the work-piece and computing a warp amount of the work-piece based on the displacement amount; and the one of the height position of the work-piece and the wave height of the wave molten solder is adjusted based on the warp amount.
- 4. The method of claim 3, wherein the displacement amount is detected at least at three points of the work-piece.
- 5. The method of claim 1, wherein the immersion depth is controlled by steps of:emitting a measurement light onto an irradiation position of one of the wave molten solder and the reflow side so that the measurement light is reflected by the wave molten solder and the reflow side, respectively, as a reflected light, the irradiation position being adjacent to a contact portion between the wave molten solder and the reflow side and facing another one of the wave molten solder and the reflow side; and controlling one of a height position of the work-piece and a wave height of the wave molten solder so that an optical path of the reflected light becomes constant.
- 6. The method of claim 5, wherein the measurement light is a laser beam.
- 7. The method of claim 5, wherein the measurement light is a pulsed light.
- 8. The method of claim 1, wherein the immersion depth is controlled by steps of:emitting a measurement light onto a first irradiation position of one of the wave molten solder and the reflow side so that the measurement light is reflected at the first irradiation position and then is reflected by a second irradiation position of another one of the wave molten solder and the reflow side; detecting the first and second irradiation positions; and controlling one of a height position of the work-piece and a wave height of the wave molten solder so that an interval between the first and second irradiation positions becomes constant.
- 9. The method of claim 8, wherein the measurement light is a laser beam.
- 10. The method of claim 8, wherein the measurement light is a pulsed light.
- 11. The method of claim 1, wherein the immersion depth is controlled by steps of:detecting a wave height of the wave molten solder; and controlling one of a height position of the work-piece and the wave height of the wave molten solder based on the detected wave height.
Priority Claims (2)
Number |
Date |
Country |
Kind |
10-17992 |
Jan 1998 |
JP |
|
10-365261 |
Dec 1998 |
JP |
|
Parent Case Info
This is a Divisional National application Ser. No. 09/229,444 filed Jan. 13, 1999; allowed Apr. 23, 2001.
US Referenced Citations (5)
Number |
Name |
Date |
Kind |
4512508 |
Pachschwoll |
Apr 1985 |
A |
4602730 |
Murakami et al. |
Jul 1986 |
A |
4801065 |
Colquitt et al. |
Jan 1989 |
A |
5533663 |
Massini, Jr. et al. |
Jul 1996 |
A |
5979740 |
Rooks |
Nov 1999 |
A |
Foreign Referenced Citations (3)
Number |
Date |
Country |
60-160193 |
Aug 1985 |
JP |
2-37964 |
Feb 1990 |
JP |
7-131143 |
May 1995 |
JP |