The present invention relates to an X-ray tube and a conditioning method therefor.
Conventional X-ray tubes use a filament as a cathode and uses thermoelectrons emitted from the filament as an electron source. On the other hand, there are proposed some X-ray tubes that use a cold cathode source as an electron emission element. Such an X-ray tube is disclosed in, e.g., U.S. Pat. No. 7,778,391, U.S. Pat. No. 7,809,114, and U.S. Pat. No. 7,826,595.
However, when a cold cathode source is used as an electron emission source, there is a problem that electron emission is easily affected by the degree of vacuum of an X-ray tube during its operation because the electron emission is sensitive to a surface state of the cathode compared to a hot cathode. Particularly, it is known that in a Spindt-type cold cathode array using a molybdenum (Mo) material, a current decrease occurs due to generation of oxidizing gas in a vacuum tube being in an operating state (see J. Vac. Sci. Technol. B16, 2859 (1998), Effect of O2 on the electron emission characteristics of active molybdenum field emission cathode arrays (B. Chalamala, et al)). Thus, for some situations, there is a problem that decrease in anode current occurs by that the operation of the X-ray tube is conducted continuously.
In order to prevent such a problem, a method of gradually increasing extraction voltage is also adopted (see IVNC2013 P15, Stable, High Current Density Carbon Nanotube Field Emission Devices (D. Smith et al), Proc Of SPIE Vol.7622 76225M-1, Distributed Source X-ray technology for Tomosynthesis imaging (F. Sprender, et al)); in this case, however, a problem such as discharge may occur when the extraction voltage exceeds a predetermined value.
The object of the present invention is to provide an X-ray tube and a conditioning method therefor capable of avoiding the above problems.
An X-ray tube according to the present invention includes: an electron emission unit including an electron emission element using a cold cathode; an anode unit disposed opposite to the electron emission unit, with which electrons emitted from the electron emission unit collide; and a focus structure disposed between the electron emission unit and a target unit disposed on a surface of the anode unit that is opposed to the electron emission unit. The electron emission unit is divided into first and second regions which can independently be turned ON/OFF. The X-ray tube is focus-designed such that collision regions of electron beams emitted from the respective first and second regions substantially coincide with each other.
A conditioning method according to the present invention is a conditioning method for an X-ray tube. The X-ray tube includes: an electron emission unit including an electron emission element using a cold cathode; an anode unit disposed opposite to the electron emission unit, with which electrons emitted from the electron emission unit collide; and a focus structure disposed between the electron emission unit and a target unit disposed on an opposing surface of the anode unit to the electron emission unit. The electron emission unit is divided into first and second regions which can independently be turned ON/OFF. The X-ray tube is focus-designed such that collision regions, at the anode unit, of electron beams emitted from the respective first and second regions substantially coincide with each other. In the conditioning method, one of the first and second regions is used for conditioning and other one of them for actual operation.
The above features and advantages of the present invention will be more apparent from the following description of certain preferred embodiments taken in conjunction with the accompanying drawings, in which:
Preferred embodiments of the present invention will be explained below in detail with reference to the accompanying drawings.
The present invention controls and stabilizes a vacuum state in an X-ray tube so as to prevent current variation which occurs in the conventional cold cathode electron tubes during operation. Specifically, there is provided an emitter structure including a plurality of electron beam emission regions, and focus design is made such that an electron beam collides with the same region of the anode while independently controlling the plurality of electron beam emission regions.
This allows at least one first electron beam emission region to be used for conditioning to make an electron beam collide with the anode, making it possible to degas the electron beam collision region. At this time, a fixed potential is applied between the gate and the cathode of the second electron beam emission region not used for conditioning so as to turn OFF the second electron beam emission region. The emitter in an OFF state is inactive, so that even when degassing occurs during conditioning, there is a low probability that the surface condition of the emitter varies. After the surface of the anode is sufficiently degassed by conditioning, the second electron beam emission unit which is turned OFF during conditioning is used for actual operation. By making a focus design such that collision regions, at the anode, of the electron beams emitted from the respective first and second electron beam emission regions substantially coincide with each other, it is possible to suppress degassing during actual operation, thereby obtaining stable operation.
Hereinafter, first and second embodiments of the present invention will be described successively.
The electron emission unit 10 has an electron emission element using a cold cathode and is configured to emit electrons from the cold cathode. While details will be described later, the electron emission unit 10 is divided into two regions A and B (first and second regions). The regions A and B are grounded through transistors TA and TB, respectively.
The anode unit 11 is disposed opposite to the electron emission unit 10 and connected to a power supply P. Thus, when either of the transistors TA or TB is turned ON, current flows from the power supply P through the anode unit 11 and electron emission unit 10. At this time, a plurality of electrons are emitted from the electron emission unit 10. These electrons collide with the anode unit 11, pass therethrough, and is absorbed by the power supply P. As illustrated in
The target unit 12 is a member made of a material that generates an X-ray by receiving electrons and disposed on the opposing surface 11a. Since the target unit 12 is disposed on the opposing surface 11a, some or all of the plurality of electrons that collide with the anode unit 11 pass through the target unit 12, and an X-ray is generated in the target unit 12 during the passage. The thus generated X-ray is radiated downward owing to inclination of the opposing surface 11a.
The focus structure 13 is a structure having a function of correcting the trajectory of the electron emitted from the electron emission unit 10 and has a window 13a as illustrated in
The regions A and B are connected to the controller 2 respectively through the mutually different transistors TA and TB. The controller 2 is configured to independently turn ON/OFF the transistors TA and TB by controlling the gate potentials of the respective transistors TA and TB. Thus, the regions A and B can independently be turned ON/OFF. The ON-state means that the region A or B functions as an electron emitter, that is, a state where electrons are emitted toward the anode unit 11 from the region A or B. On the other hand, the OFF-state means that the region A or B does not function as the electron emitter, that is, a state where electrons are not emitted toward the anode unit 11 from the region A or B.
The X-ray tube 1 according to the present embodiment is focus-designed such that a collision region, at the anode unit 11 (region within the opposing surface 11a), of the electron beam emitted from the region A illustrated in
On the other hand, during actual operation, the controller 2 applies a voltage Vgc of 30 V to 40 V between the gate and the cathode of the region B (i.e., between the gate and the collector of the transistor TB) to turn ON the region B as the emitter of the electrons, while applying a voltage Vgc of 0 V to 10 V (a specific potential in an non-operating state) between the gate and the cathode of the region A (i.e., between the gate and the collector of the transistor TA) to turn OFF the region A as the emitter of the electrons. As a result, no electron is emitted from the region A, and only electrons emitted from the region B collide with the target unit 12.
According to the above control method (conditioning method), the electron beam collision regions during conditioning and during actual operation substantially coincide with each other, allowing reduction in degassing amount during actual operation, which in turn reduce current variation in the region B during actual operation. Further, it is possible to reduce a possibility of causing problems due to abnormal discharge or the like during operation.
As described above, according to the present embodiment, degassing from the electron beam collision region on the anode unit 11 of the X-ray tube 1 is suppressed to prevent current from varying even in long time operation, thereby allowing stable operation of the X-ray tube 1. Further, it is possible to reduce a probability of causing problems due to the degassing, such as abnormal discharge, allowing the service life of the X-ray tube 1 to be prolonged.
Next, the second embodiment of the present invention will be described. The second embodiment differs from the first embodiment in the dividing method of the electron emission unit 10. Other configurations are the same as those in the first embodiment. Hereinafter, a description will be given focusing on differences from the first embodiment with the same reference numerals given to the same elements as in the first embodiment.
The X-ray tube 1 according to the present embodiment is focus-designed such that a collision region, at the anode unit 11 (region within the opposing surface 11a), of the electron beam emitted from the region A illustrated in
The operation of the controller 2 in the present embodiment may be the same as the operation described in the first embodiment. That is, when the controller 2 executes the operation described in the first embodiment, the same effects as in the first embodiment can be obtained in the present embodiment. That is, degassing from the electron beam collision region on the anode unit 11 of the X-ray tube 1 is suppressed to prevent current from varying even in long time operation, thereby allowing stable operation of the X-ray tube 1. Further, it is possible to reduce a probability of occurrence of problems due to the degassing, such as abnormal discharge, allowing the service life of the X-ray tube 1 to be prolonged.
While the preferred embodiments of the present invention have been described, the present invention is not limited to the above embodiments but may be variously modified within the scope thereof.
For example, the specific dividing method of the electron emission unit 10 is not limited to those described in the first and second embodiments.
Although the areas of the regions A and B are not particularly mentioned in the second embodiment, the electron emission unit 10 may be divided so that the area of the region A (e.g., total area of one or more peripheral regions) and the area of the region B (e.g., the area of the center region) are substantially equal to each other. By doing this, current of the same amount as that during actual operation can be conveniently taken during the conditioning. Further, compatibility exists between the regions A and B, thus improving usability of the X-ray tube 1.
Number | Date | Country | |
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62316406 | Mar 2016 | US |