NANOX IMAGING PLC

Follow

Organization

GIBRALTAR, GI

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Electron emitting construct configured with ion bombardment resistant
- Patent number 10,269,527
- Issue date Apr 23, 2019
- NANOX IMAGING PLC
- Hidenori Kenmotsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices having an electron emitting structure
- Patent number 10,242,836
- Issue date Mar 26, 2019
- NANOX IMAGING PLC
- Koichi Iida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICES HAVING AN ELECTRON EMITTING STRUCTURE
- Publication number 20190189383
- Publication date Jun 20, 2019
- NANOX IMAGING PLC
- Koichi Iida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY TUBE AND A CONTROLLER THEREOF
- Publication number 20180075997
- Publication date Mar 15, 2018
- NANOX IMAGING PLC
- Hidenori KENMOTSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY TUBE AND A CONDITIONING METHOD THEREOF
- Publication number 20170301505
- Publication date Oct 19, 2017
- NANOX IMAGING PLC
- Hidenori KENMOTSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Emitting Construct Configured with Ion Bombardment Resistant
- Publication number 20170004949
- Publication date Jan 5, 2017
- NANOX IMAGING PLC
- Hidenori Kenmotsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image Capture Device
- Publication number 20150206698
- Publication date Jul 23, 2015
- NANOX IMAGING PLC
- Tetsuo Hori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES HAVING AN ELECTRON EMITTING STRUCTURE
- Publication number 20150092923
- Publication date Apr 2, 2015
- NANOX IMAGING PLC
- Koichi Iida
- G01 - MEASURING TESTING

Trademarklast 30 trademarks