4D TECHNOLOGIES, LLC

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BEDFORD, NH, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for determining competency deficiencies and match...
- Patent number 11,093,875
- Issue date Aug 17, 2021
- 4D Technologies, LLC
- James Hancock
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic updating interactive query answering and feature training...
- Patent number 11,087,254
- Issue date Aug 10, 2021
- 4D Technologies, LLC
- James Hancock
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for providing optimized matching between projects...
- Patent number 11,037,079
- Issue date Jun 15, 2021
- 4D Technologies, LLC
- James Hancock
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single-step interferometric radius-of-curvature measurements utiliz...
- Patent number 9,857,169
- Issue date Jan 2, 2018
- 4D Technology Corporation
- Michael North Morris
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution in-line metrology for roll-to-roll processing opera...
- Patent number 9,746,316
- Issue date Aug 29, 2017
- 4D Technology Corporation
- Brad Kimbrough
- G01 - MEASURING TESTING
Information Patent Grant
Linear-carrier phase-mask interferometer
- Patent number 8,351,048
- Issue date Jan 8, 2013
- 4D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Linear-carrier phase-mask interferometer
- Patent number 7,777,895
- Issue date Aug 17, 2010
- 4D Technology Corporation
- Brian S. Medower
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Synchronous frequency-shift mechanism in Fizeau interferometer
- Patent number 7,675,628
- Issue date Mar 9, 2010
- 4D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic compensation in Fizeau interferometer
- Patent number 7,580,135
- Issue date Aug 25, 2009
- 4D Technology Corporation
- John Hayes
- G01 - MEASURING TESTING
Information Patent Grant
Pixelated phase-mask interferometer
- Patent number 7,230,717
- Issue date Jun 12, 2007
- 4D Technology Corporation
- Neal J. Brock
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous phase-shifting fizeau interferometer
- Patent number 7,230,718
- Issue date Jun 12, 2007
- 4D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Calibration and error correction in multi-channel imaging
- Patent number 7,079,251
- Issue date Jul 18, 2006
- 4D Technology Corporation
- James E. Millerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Common optical-path testing of high-numerical-aperture wavefronts
- Patent number 7,057,737
- Issue date Jun 6, 2006
- 4D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
System and Methods for Quickly Identifying an Individual's Knowledg...
- Publication number 20230394393
- Publication date Dec 7, 2023
- 4D Technologies, LLC
- James Hancock
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Determining Competency Deficiencies and Match...
- Publication number 20190066029
- Publication date Feb 28, 2019
- 4D Technologies, LLC
- James Hancock
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic Updating Interactive Query Answering and Feature Training...
- Publication number 20190066031
- Publication date Feb 28, 2019
- 4D Technologies, LLC
- James Hancock
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Providing Optimized Matching Between Projects...
- Publication number 20190066030
- Publication date Feb 28, 2019
- 4D Technologies, LLC
- James Hancock
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LINEAR-CARRIER PHASE-MASK INTERFEROMETER
- Publication number 20100309476
- Publication date Dec 9, 2010
- 4D TECHNOLOGY CORPORATION
- JAMES E. MILLERD
- G01 - MEASURING TESTING
Information Patent Application
SYNCHRONOUS FREQUENCY-SHIFT MECHANISM IN FIZEAU INTERFEROMETER
- Publication number 20100134801
- Publication date Jun 3, 2010
- 4D TECHNOLOGY CORPORATION
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Application
Synchronous frequency-shift mechanism in Fizeau interferometer
- Publication number 20080062428
- Publication date Mar 13, 2008
- 4D TECHNOLOGY CORPORATION
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Application
Chromatic compensation in Fizeau interferometer
- Publication number 20070296978
- Publication date Dec 27, 2007
- 4D TECHNOLOGY CORPORATION
- John Hayes
- G01 - MEASURING TESTING
Information Patent Application
Linear-carrier phase-mask interferometer
- Publication number 20070211256
- Publication date Sep 13, 2007
- 4D TECHNOLOGY CORPORATION
- Brian S. Medower
- G06 - COMPUTING CALCULATING COUNTING

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Trademarklast 30 trademarks

Information Trademark
86809046 - 4D INSPEC
- Serial number 86809046
- Registration number 5030369
- Filing date Nov 4, 2015
- 4D Technology Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86806950 - 4D TECHNOLOGY
- Serial number 86806950
- Registration number 5107699
- Filing date Nov 2, 2015
- 4D Technology Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86804743 - 4D
- Serial number 86804743
- Registration number 5006420
- Filing date Oct 30, 2015
- 4D Technology Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85553699 - PHASECAM
- Serial number 85553699
- Registration number 4217591
- Filing date Feb 27, 2012
- 4D Technology Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85329292 - ACCUFIZ
- Serial number 85329292
- Registration number 4080058
- Filing date May 24, 2011
- 4D Technology Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77331482 - DYNAMIC INTERFEROMETER
- Serial number 77331482
- Filing date Nov 16, 2007
- 4D Technology Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77181852 - DYNAMIC INTERFEROMETRY
- Serial number 77181852
- Registration number 3573301
- Filing date May 15, 2007
- 4D Technology Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

4D TECHNOLOGIES, LLC

Organization

Patents Grantslast 30 patents

System and method for determining competency deficiencies and match...

Automatic updating interactive query answering and feature training...

System and method for providing optimized matching between projects...

Single-step interferometric radius-of-curvature measurements utiliz...

High-resolution in-line metrology for roll-to-roll processing opera...

Linear-carrier phase-mask interferometer

Linear-carrier phase-mask interferometer

Synchronous frequency-shift mechanism in Fizeau interferometer

Chromatic compensation in Fizeau interferometer

Pixelated phase-mask interferometer

Simultaneous phase-shifting fizeau interferometer

Calibration and error correction in multi-channel imaging

Common optical-path testing of high-numerical-aperture wavefronts

Patents Applicationslast 30 patents

System and Methods for Quickly Identifying an Individual's Knowledg...

System and Method for Determining Competency Deficiencies and Match...

Automatic Updating Interactive Query Answering and Feature Training...

System and Method for Providing Optimized Matching Between Projects...

LINEAR-CARRIER PHASE-MASK INTERFEROMETER

SYNCHRONOUS FREQUENCY-SHIFT MECHANISM IN FIZEAU INTERFEROMETER

Synchronous frequency-shift mechanism in Fizeau interferometer

Chromatic compensation in Fizeau interferometer

Linear-carrier phase-mask interferometer

Trademarklast 30 trademarks

86809046 - 4D INSPEC

86806950 - 4D TECHNOLOGY

86804743 - 4D

85553699 - PHASECAM

85329292 - ACCUFIZ

77331482 - DYNAMIC INTERFEROMETER

77181852 - DYNAMIC INTERFEROMETRY