Accent Optical Technologies, Inc.

Organization

Burbank, CA, US

INDUSTRIAL INSTRUMENTS FOR MEASUREMENT, DISPLAY, AND CONTROL
Business Address
131 NW HAWTHORNE AVE SUITE 207 BEND OR 97701 5413222500
State Location
OR
State of Incorporation
DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method for designing gratings
- Patent number 7,800,824
- Issue date Sep 21, 2010
- Industrial Technology Research Institute
- Shih Chun Wang
- G02 - OPTICS
Information Patent Grant
Method for measuring dimensions and optical system using the same
- Patent number 7,619,753
- Issue date Nov 17, 2009
- Industrial Technology Research Institute
- An-Shun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Multi-layer alignment and overlay target and measurement method
- Patent number 7,474,401
- Issue date Jan 6, 2009
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for correlating a structural parameter of a plurality of gra...
- Patent number 7,433,060
- Issue date Oct 7, 2008
- Industrial Technology Research Institute
- An Shun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting a grating biochip
- Patent number 7,355,713
- Issue date Apr 8, 2008
- Industrial Technology Research Institute
- Deh Ming Shyu
- G01 - MEASURING TESTING
Information Patent Grant
Determination of center of focus by parameter variability analysis
- Patent number 7,119,893
- Issue date Oct 10, 2006
- Accent Optical Technologies, Inc.
- Michael E. Littau
- G01 - MEASURING TESTING
Information Patent Grant
Determination of center of focus by cross-section analysis
- Patent number 7,110,099
- Issue date Sep 19, 2006
- Accent Optical Technologies, Inc.
- Michael E. Littau
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Differential numerical aperture methods
- Patent number 7,053,991
- Issue date May 30, 2006
- Accent Optical Technologies, Inc.
- John V. Sandusky
- G01 - MEASURING TESTING
Information Patent Grant
Line profile asymmetry measurement using scatterometry
- Patent number 6,856,408
- Issue date Feb 15, 2005
- Accent Optical Technologies, Inc.
- Christopher J. Raymond
- G01 - MEASURING TESTING
Information Patent Grant
Differential numerical aperture methods and device
- Patent number 6,750,968
- Issue date Jun 15, 2004
- Accent Optical Technologies, Inc.
- John V. Sandusky
- G01 - MEASURING TESTING
Information Patent Grant
Structure identification using scattering signatures
- Patent number 6,728,663
- Issue date Apr 27, 2004
- Accent Optical Technologies, Inc.
- Richard H. Krukar
- G01 - MEASURING TESTING
Information Patent Grant
Determination of center of focus by diffraction signature analysis
- Patent number 6,606,152
- Issue date Aug 12, 2003
- Accent Optical Technologies, Inc.
- Michael E. Littau
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Determination of center of focus by diffraction signature analysis
- Patent number 6,429,930
- Issue date Aug 6, 2002
- Accent Optical Technologies, Inc.
- Michael E. Littau
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DESIGNING GRATINGS
- Publication number 20080013176
- Publication date Jan 17, 2008
- Industrial Technology Research Institute
- Shih Chun Wang
- G02 - OPTICS
Information Patent Application
Line Profile Asymmetry Measurement
- Publication number 20070201043
- Publication date Aug 30, 2007
- Accent Optical Technologies, Inc.
- Christopher Raymond
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING DIMENSIONS AND OPTICAL SYSTEM USING THE SAME
- Publication number 20070188771
- Publication date Aug 16, 2007
- Industrial Technology Research Institute
- An-Shun Liu
- G01 - MEASURING TESTING
Information Patent Application
Apparatuses and methods for analyzing semiconductor workpieces
- Publication number 20070176119
- Publication date Aug 2, 2007
- Accent Optical Technologies, Inc.
- Steve Hummel
- G01 - MEASURING TESTING
Information Patent Application
Method for Inspecting a Grating Biochip
- Publication number 20070156349
- Publication date Jul 5, 2007
- Industrial Technology Research Institute
- Deh Ming Shyu
- G01 - MEASURING TESTING
Information Patent Application
Multi-layer Alignment and Overlay Target and Measurement Method
- Publication number 20070058169
- Publication date Mar 15, 2007
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and method for non-contact assessment of a constituent in...
- Publication number 20070048948
- Publication date Mar 1, 2007
- Accent Optical Technologies, Inc.
- Pedro Vagos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatuses and methods for detecting defects in semiconductor work...
- Publication number 20070000434
- Publication date Jan 4, 2007
- Accent Optical Technologies, Inc.
- Andrzej Buczkowski
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060289788
- Publication date Dec 28, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060289789
- Publication date Dec 28, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060289790
- Publication date Dec 28, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatuses and methods for enhanced critical dimension scatterometry
- Publication number 20060285111
- Publication date Dec 21, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060285110
- Publication date Dec 21, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060278834
- Publication date Dec 14, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060273263
- Publication date Dec 7, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060243912
- Publication date Nov 2, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Method and device for determining a characteristic of a semicondcto...
- Publication number 20060192573
- Publication date Aug 31, 2006
- Accent Optical Technologies, Inc.
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Application
Overlay measurement target
- Publication number 20060151890
- Publication date Jul 13, 2006
- Accent Optical Technologies, Inc.
- Nigel Peter Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Differential numerical aperture methods
- Publication number 20040246481
- Publication date Dec 9, 2004
- Accent Optical Technologies, Inc.
- John V. Sandusky
- G01 - MEASURING TESTING
Information Patent Application
Determination of center of focus by parameter variability analysis
- Publication number 20040233445
- Publication date Nov 25, 2004
- Accent Optical Technologies, Inc.
- Michael E. Littau
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
76184948 - ACCENT OPTICAL TECHNOLOGIES
- Serial number 76184948
- Registration number 2692112
- Filing date Dec 22, 2000
- Accent Optical Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76184947 - ACCENT
- Serial number 76184947
- Registration number 2731142
- Filing date Dec 22, 2000
- Accent Optical Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Accent Optical Technologies, Inc.

Organization

Business Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Method for designing gratings

Method for measuring dimensions and optical system using the same

Multi-layer alignment and overlay target and measurement method

Method for correlating a structural parameter of a plurality of gra...

Method for inspecting a grating biochip

Determination of center of focus by parameter variability analysis

Determination of center of focus by cross-section analysis

Differential numerical aperture methods

Line profile asymmetry measurement using scatterometry

Differential numerical aperture methods and device

Structure identification using scattering signatures

Determination of center of focus by diffraction signature analysis

Determination of center of focus by diffraction signature analysis

Patents Applicationslast 30 patents

METHOD FOR DESIGNING GRATINGS

Line Profile Asymmetry Measurement

METHOD FOR MEASURING DIMENSIONS AND OPTICAL SYSTEM USING THE SAME

Apparatuses and methods for analyzing semiconductor workpieces

Method for Inspecting a Grating Biochip

Multi-layer Alignment and Overlay Target and Measurement Method

Apparatus and method for non-contact assessment of a constituent in...

Apparatuses and methods for detecting defects in semiconductor work...

Apparatus and method for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

Apparatuses and methods for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

Method and device for determining a characteristic of a semicondcto...

Overlay measurement target

Differential numerical aperture methods

Determination of center of focus by parameter variability analysis

Trademarklast 30 trademarks

76184948 - ACCENT OPTICAL TECHNOLOGIES

76184947 - ACCENT