Accretech USA, Inc.

Organization

Bloomfield Hills, MI, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Automatic wafer edge inspection and review system
- Patent number 7,508,504
- Issue date Mar 24, 2009
- Accretech USA, Inc.
- Ju Jin
- G01 - MEASURING TESTING
Information Patent Grant
Polishing machine and method
- Patent number 6,875,076
- Issue date Apr 5, 2005
- Accretech USA, Inc.
- Edmond Abrahamians
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Method for Wafer Edge Exclusion Measurement
- Publication number 20090122304
- Publication date May 14, 2009
- Accretech USA, Inc.
- Ju Jin
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Wafer Edge Defects Detection
- Publication number 20090116727
- Publication date May 7, 2009
- Accretech USA, Inc.
- Ju Jin
- G01 - MEASURING TESTING
Information Patent Application
Wafer processing apparatus and method
- Publication number 20080190558
- Publication date Aug 14, 2008
- Accretech USA, Inc.
- Joel Brad Bailey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automatic wafer edge inspection and review system
- Publication number 20080030731
- Publication date Feb 7, 2008
- Accretech USA, Inc.
- Ju Jin
- G01 - MEASURING TESTING
Information Patent Application
Clean ignition system for wafer substrate processing
- Publication number 20080017316
- Publication date Jan 24, 2008
- Accretech USA, Inc.
- Joel Brad Bailey
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for cleaning a wafer substrate
- Publication number 20080010845
- Publication date Jan 17, 2008
- Accretech USA, Inc.
- Joel Brad Bailey
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for cleaning a wafer substrate
- Publication number 20080011332
- Publication date Jan 17, 2008
- Accretech USA, Inc.
- Joel Brad Bailey
- G01 - MEASURING TESTING
Information Patent Application
Processing chamber having labyrinth seal
- Publication number 20080011421
- Publication date Jan 17, 2008
- Accretech USA, Inc.
- Joel Brad Bailey
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
77042269 - FACE
- Serial number 77042269
- Registration number 3419158
- Filing date Nov 13, 2006
- Accretech USA, Inc.
- 7 - Machines and machine tools
Information Trademark
78864871 - CRYSTAL EDGE
- Serial number 78864871
- Registration number 3424527
- Filing date Apr 19, 2006
- Accretech USA, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78852584 - HABANERO
- Serial number 78852584
- Registration number 3337025
- Filing date Apr 3, 2006
- Accretech USA, Inc.
- 7 - Machines and machine tools

Accretech USA, Inc.

Organization

Patents Grantslast 30 patents

Automatic wafer edge inspection and review system

Polishing machine and method

Patents Applicationslast 30 patents

Apparatus and Method for Wafer Edge Exclusion Measurement

Apparatus and Method for Wafer Edge Defects Detection

Wafer processing apparatus and method

Automatic wafer edge inspection and review system

Clean ignition system for wafer substrate processing

Apparatus for cleaning a wafer substrate

Method and apparatus for cleaning a wafer substrate

Processing chamber having labyrinth seal

Trademarklast 30 trademarks

77042269 - FACE

78864871 - CRYSTAL EDGE

78852584 - HABANERO