ADE Corporation

Organization

Westwood, MA, US

INSTRUMENTS FOR MEAS & TESTING OF ELECTRICITY & ELEC SIGNALS
Business Address
80 WILSON WAY WESTWOOD MA 02090 6174673500
Mailing Address
77 ROWE ST NEWTON MA 02166
State Location
MA
State of Incorporation
MA

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Defect size projection
- Patent number 7,302,360
- Issue date Nov 27, 2007
- ADE Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Grant
Detection of a wafer edge using collimated light
- Patent number 7,280,200
- Issue date Oct 9, 2007
- ADE Corporation
- Mark P. Plemmons
- G01 - MEASURING TESTING
Information Patent Grant
Extended defect sizing
- Patent number 7,184,928
- Issue date Feb 27, 2007
- ADE Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Grant
Wafer gripping fingers to minimize distortion
- Patent number 7,175,214
- Issue date Feb 13, 2007
- ADE Corporation
- Jaydeep K. Sinha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen topography reconstruction
- Patent number 7,136,519
- Issue date Nov 14, 2006
- ADE Corporation
- Jaydeep Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shaped non-contact capacitive displacement sensors for measuring sh...
- Patent number 7,114,399
- Issue date Oct 3, 2006
- ADE Corporation
- Roy E. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Ring chuck to hold 200 and 300 mm wafer
- Patent number 6,954,269
- Issue date Oct 11, 2005
- ADE Corporation
- Christopher Gaal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for classifying defects occurring at or near a...
- Patent number 6,760,100
- Issue date Jul 6, 2004
- ADE Corporation
- Vladimir I. Ivakhnenko
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for mapping surface topography of a substrate
- Patent number 6,621,581
- Issue date Sep 16, 2003
- ADE Corporation
- James David Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Wafer shape accuracy using symmetric and asymmetric instrument erro...
- Patent number 6,594,002
- Issue date Jul 15, 2003
- ADE Corporation
- William Drohan
- G01 - MEASURING TESTING
Information Patent Grant
Method for facilitating the field replacement of sensors
- Patent number 6,560,555
- Issue date May 6, 2003
- ADE Corporation
- Roy E. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Separation of periodic and non-periodic signal components
- Patent number 6,556,941
- Issue date Apr 29, 2003
- ADE Corporation
- Roy E. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Ring chuck to hold 200 and 300 mm wafer
- Patent number 6,538,733
- Issue date Mar 25, 2003
- ADE Corporation
- Christopher Gaal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vector kerr magnetometry
- Patent number 6,501,269
- Issue date Dec 31, 2002
- ADE Corporation
- Ferenc Vajda
- G01 - MEASURING TESTING
Information Patent Grant
Edge gripping end effector wafer handling apparatus
- Patent number 6,491,330
- Issue date Dec 10, 2002
- ADE Corporation
- Anil Mankame
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for discriminating between holes in and particles on a film...
- Patent number 6,486,946
- Issue date Nov 26, 2002
- ADE Corporation
- John C. Stover
- G01 - MEASURING TESTING
Information Patent Grant
Self-bootstrapping transducer interface
- Patent number 6,476,621
- Issue date Nov 5, 2002
- ADE Corporation
- Roy E. Mallory
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Capacitive displacement sensor for measuring thin targets
- Patent number 6,400,162
- Issue date Jun 4, 2002
- ADE Corporation
- Roy E. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Centrifugal gripper mechanism for dynamic force compensation
- Patent number 6,260,899
- Issue date Jul 17, 2001
- ADE Corporation
- Anil Mankame
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor for measuring degree of flatness
- Patent number 6,255,664
- Issue date Jul 3, 2001
- Super Silicon Crystal Research Institute Corp.
- Shinji Okawa
- G01 - MEASURING TESTING
Information Patent Grant
Nonlinear current mirror for loop-gain control
- Patent number 6,181,142
- Issue date Jan 30, 2001
- ADE Corporation
- Roy E. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for measurement system calibration
- Patent number 6,025,787
- Issue date Feb 15, 2000
- ADE Corporation
- Noel S. Poduje
- G01 - MEASURING TESTING
Information Patent Grant
Transducer Bootstrapping apparatus
- Patent number 5,786,698
- Issue date Jul 28, 1998
- ADE Corporation
- Roy E. Mallory
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing system with real time/off line functionality allocation
- Patent number 5,750,908
- Issue date May 12, 1998
- ADE Corproation
- William Drohan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for emulation of a linear variable differentia...
- Patent number 5,708,368
- Issue date Jan 13, 1998
- ADE Corporation
- Roy E. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing and self-calibration system
- Patent number 5,642,298
- Issue date Jun 24, 1997
- ADE Corporation
- Roy E. Mallory
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for measurement system calibration
- Patent number 5,557,267
- Issue date Sep 17, 1996
- ADE Corporation
- Noel S. Poduje
- G01 - MEASURING TESTING
Information Patent Grant
Wafer handling and processing system
- Patent number 5,511,005
- Issue date Apr 23, 1996
- ADE Corporation
- Robert C. Abbe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robot prealigner
- Patent number 5,456,561
- Issue date Oct 10, 1995
- ADE Corporation
- Noel S. Poduje
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Robot prealigner
- Patent number 5,332,352
- Issue date Jul 26, 1994
- ADE Corporation
- Noel S. Poduje
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Patents Applicationslast 30 patents

Information Patent Application
Display devices and methods of displaying objects
- Publication number 20100326019
- Publication date Dec 30, 2010
- ADE, Inc.
- Jason C. Lofgren
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Application
Volume based extended defect sizing system
- Publication number 20070179740
- Publication date Aug 2, 2007
- ADE CORPORATION
- Ernest Bell
- G01 - MEASURING TESTING
Information Patent Application
Defect size projection
- Publication number 20060178855
- Publication date Aug 10, 2006
- ADE CORPORATION
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Application
Suspension packages
- Publication number 20060042995
- Publication date Mar 2, 2006
- ADE, Inc.
- Michael T. McGrath
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
Suspension packages and systems, and methods of using same
- Publication number 20060000743
- Publication date Jan 5, 2006
- ADE, Inc.
- Lewis C. Lofgren
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
Suspension packages and systems, cushioning panels, and methods of...
- Publication number 20050252825
- Publication date Nov 17, 2005
- ADE, Inc.
- Lewis C. Lofgren
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
200 MM notched/flatted wafer edge gripping end effector
- Publication number 20050110287
- Publication date May 26, 2005
- ADE CORPORATION
- Anthony Florindi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Extended defect sizing
- Publication number 20050114091
- Publication date May 26, 2005
- ADE CORPORATION
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Application
Wafer gripping fingers to minimize distortion
- Publication number 20050029823
- Publication date Feb 10, 2005
- ADE CORPORATION
- Jaydeep K. Sinha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for classifying defects occurring at a surface of...
- Publication number 20040258295
- Publication date Dec 23, 2004
- ADE CORPORATION
- Timothy R. Tiemeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for analyzing and tracking defects among a plural...
- Publication number 20040252879
- Publication date Dec 16, 2004
- ADE CORPORATION
- Timothy R. Tiemeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Shaped non-contact capacitive displacement sensors for measuring sh...
- Publication number 20040182168
- Publication date Sep 23, 2004
- ADE CORPORATION
- Roy E. Mallory
- G01 - MEASURING TESTING
Information Patent Application
Suspension packages and systems, and methods of using same
- Publication number 20040178113
- Publication date Sep 16, 2004
- ADE, Inc.
- Lewis C. Lofgren
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
Method for high-accuracy non-contact capacitive displacement measur...
- Publication number 20030141881
- Publication date Jul 31, 2003
- ADE CORPORATION
- Roy E. Mallory
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for classifying defects occurring at or near a...
- Publication number 20020154295
- Publication date Oct 24, 2002
- ADE Corporation
- Vladimir I. Ivakhnenko
- G01 - MEASURING TESTING
Information Patent Application
Ring chuck to hold 200 and 300 mm wafer
- Publication number 20020024174
- Publication date Feb 28, 2002
- ADE CORPORATION
- Christopher Gaal
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
78958106 - AFS
- Serial number 78958106
- Registration number 3352444
- Filing date Aug 22, 2006
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78958139 - AWIS
- Serial number 78958139
- Registration number 3398593
- Filing date Aug 22, 2006
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76664449 - WAFERXAM
- Serial number 76664449
- Registration number 3464877
- Filing date Aug 10, 2006
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76664448 - NANOXAM
- Serial number 76664448
- Registration number 3252721
- Filing date Aug 10, 2006
- ADE Corporation
- 7 - Machines and machine tools
Information Trademark
76501260 - FABVISION
- Serial number 76501260
- Registration number 3139455
- Filing date Mar 17, 2003
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76342051 - NANOSTANDARD
- Serial number 76342051
- Filing date Nov 26, 2001
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76327695 - FIT
- Serial number 76327695
- Registration number 2863209
- Filing date Oct 19, 2001
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76327744 - E-SQUARED
- Serial number 76327744
- Registration number 2609693
- Filing date Oct 19, 2001
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76199043 - OPENADC
- Serial number 76199043
- Filing date Jan 24, 2001
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76180051 - AUTOGAGER
- Serial number 76180051
- Filing date Dec 13, 2000
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76116879 - WAFER REPORT CARD
- Serial number 76116879
- Filing date Aug 25, 2000
- ADE Corporation
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
75808283 - AFS-300
- Serial number 75808283
- Registration number 2379499
- Filing date Sep 24, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75807675 - AWIS-300
- Serial number 75807675
- Registration number 2379493
- Filing date Sep 24, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75749442 - FABTYE
- Serial number 75749442
- Filing date Jul 13, 1999
- ADE Corporation
- 35 - Advertising
Information Trademark
75706166 - WAFERANALYZER
- Serial number 75706166
- Filing date May 13, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703372 - NANOSTRUCTURE
- Serial number 75703372
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703510 - NANOMETROLOGY
- Serial number 75703510
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703514 - NANOFLATNESS
- Serial number 75703514
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703515 - NANOSENSE
- Serial number 75703515
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703802 - ADE FACTORY
- Serial number 75703802
- Filing date May 12, 1999
- ADE Corporation
- 37 - Building construction
Information Trademark
75703508 - NANOTOPOLOMETER
- Serial number 75703508
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703803 - NANOMORPHOLOGY
- Serial number 75703803
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703804 - DMS
- Serial number 75703804
- Registration number 2351725
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703509 - NANOFLAT
- Serial number 75703509
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703511 - NANOMASTER
- Serial number 75703511
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703512 - NANOTOPOMETER
- Serial number 75703512
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703516 - NANOSTANDARD
- Serial number 75703516
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703507 - ADE FACTORY
- Serial number 75703507
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75703513 - NANOTOPOLOGY
- Serial number 75703513
- Filing date May 12, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75688219 - MICROSENSE II
- Serial number 75688219
- Registration number 2340946
- Filing date Apr 21, 1999
- ADE Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

ADE Corporation

Organization

Business Address

Mailing Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Defect size projection

Detection of a wafer edge using collimated light

Extended defect sizing

Wafer gripping fingers to minimize distortion

Specimen topography reconstruction

Shaped non-contact capacitive displacement sensors for measuring sh...

Ring chuck to hold 200 and 300 mm wafer

Method and apparatus for classifying defects occurring at or near a...

Method and apparatus for mapping surface topography of a substrate

Wafer shape accuracy using symmetric and asymmetric instrument erro...

Method for facilitating the field replacement of sensors

Separation of periodic and non-periodic signal components

Ring chuck to hold 200 and 300 mm wafer

Vector kerr magnetometry

Edge gripping end effector wafer handling apparatus

Method for discriminating between holes in and particles on a film...

Self-bootstrapping transducer interface

Capacitive displacement sensor for measuring thin targets

Centrifugal gripper mechanism for dynamic force compensation

Sensor for measuring degree of flatness

Nonlinear current mirror for loop-gain control

Apparatus and methods for measurement system calibration

Transducer Bootstrapping apparatus

Testing system with real time/off line functionality allocation

Method and apparatus for emulation of a linear variable differentia...

Wafer testing and self-calibration system

Apparatus and methods for measurement system calibration

Wafer handling and processing system

Robot prealigner

Robot prealigner

Patents Applicationslast 30 patents

Display devices and methods of displaying objects

Volume based extended defect sizing system

Defect size projection

Suspension packages

Suspension packages and systems, and methods of using same

Suspension packages and systems, cushioning panels, and methods of...

200 MM notched/flatted wafer edge gripping end effector

Extended defect sizing

Wafer gripping fingers to minimize distortion

Method and system for classifying defects occurring at a surface of...

Method and system for analyzing and tracking defects among a plural...

Shaped non-contact capacitive displacement sensors for measuring sh...

Suspension packages and systems, and methods of using same

Method for high-accuracy non-contact capacitive displacement measur...

Method and apparatus for classifying defects occurring at or near a...

Ring chuck to hold 200 and 300 mm wafer

Trademarklast 30 trademarks

78958106 - AFS

78958139 - AWIS

76664449 - WAFERXAM

76664448 - NANOXAM

76501260 - FABVISION

76342051 - NANOSTANDARD

76327695 - FIT

76327744 - E-SQUARED

76199043 - OPENADC

76180051 - AUTOGAGER

76116879 - WAFER REPORT CARD

75808283 - AFS-300

75807675 - AWIS-300

75749442 - FABTYE

75706166 - WAFERANALYZER

75703372 - NANOSTRUCTURE

75703510 - NANOMETROLOGY

75703514 - NANOFLATNESS

75703515 - NANOSENSE

75703802 - ADE FACTORY

75703508 - NANOTOPOLOMETER

75703803 - NANOMORPHOLOGY

75703804 - DMS

75703509 - NANOFLAT

75703511 - NANOMASTER