ADVANCED ION BEAM TECHNOLOGY, INC.

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HSIN-CHU, TW

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Patents Grantslast 30 patents

Information Patent Grant
Ribbon beam angle adjustment in an ion implantation system
- Patent number 12,170,182
- Issue date Dec 17, 2024
- Advanced Ion Beam Technology, Inc.
- Zhimin Wan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer temperature measurement in an ion implantation system
- Patent number 11,942,343
- Issue date Mar 26, 2024
- Advanced Ion Beam Technology, Inc.
- Chien-Li Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for reduction of particle contamination by bia...
- Patent number 11,600,464
- Issue date Mar 7, 2023
- Advanced Ion Beam Technology, Inc.
- Shao-Yu Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid magnet structure
- Patent number 11,430,589
- Issue date Aug 30, 2022
- Advanced Ion Beam Technology, Inc.
- Ching-Shiang Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for monitoring the relative relationship betwe...
- Patent number 11,349,414
- Issue date May 31, 2022
- Advanced Ion Beam Technology, Inc.
- Te-Min Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer charges monitoring
- Patent number 11,062,926
- Issue date Jul 13, 2021
- Advanced Ion Beam Technology, Inc.
- Chih-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration system with at least one camera and method thereof
- Patent number 10,984,524
- Issue date Apr 20, 2021
- Advanced Ion Beam Technology, Inc.
- Chien-Li Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for monitoring the relative relationship betwe...
- Patent number 10,804,821
- Issue date Oct 13, 2020
- Advanced Ion Beam Technology, Inc.
- Te-Min Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of cleaning electrostatic chuck
- Patent number 10,699,876
- Issue date Jun 30, 2020
- Advanced Ion Beam Technology, Inc.
- Yu-Ho Ni
- B08 - CLEANING
Information Patent Grant
Wafer charges monitoring
- Patent number 10,475,678
- Issue date Nov 12, 2019
- Advanced Ion Beam Technology, Inc.
- Chih-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field fluctuation for beam smoothing
- Patent number 10,361,059
- Issue date Jul 23, 2019
- Advanced Ion Beam Technology, Inc.
- Xiao Bai
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ion source of an ion implanter
- Patent number 9,852,887
- Issue date Dec 26, 2017
- Advanced Ion Beam Technology, Inc.
- Stephen Edward Savas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deceleration apparatus for ribbon and spot beams
- Patent number 9,824,850
- Issue date Nov 21, 2017
- Advanced Ion Beam Technology, Inc.
- Nicholas White
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lower dose rate ion implantation using a wider ion beam
- Patent number 9,748,072
- Issue date Aug 29, 2017
- Advanced Ion Beam Technology, Inc.
- Zhimin Wan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation system and process
- Patent number 9,697,988
- Issue date Jul 4, 2017
- Advanced Ion Beam Technology, Inc.
- Zhimin Wan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma-based material modification using a plasma source with magne...
- Patent number 9,653,253
- Issue date May 16, 2017
- Advanced Ion Beam Technology, Inc.
- William Divergilio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Forming punch-through stopper regions in finFET devices
- Patent number 9,450,078
- Issue date Sep 20, 2016
- Advanced Ion Beam Technology, Inc.
- Daniel Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for ion implantation
- Patent number 9,431,247
- Issue date Aug 30, 2016
- Advanced Ion Beam Technology, Inc.
- Zhimin Wan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scan head and scan arm using the same
- Patent number 9,368,326
- Issue date Jun 14, 2016
- Advanced Ion Beam Technology, Inc.
- Richard F. McRay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field fluctuation for beam smoothing
- Patent number 9,340,870
- Issue date May 17, 2016
- Advanced Ion Beam Technology, Inc.
- Xiao Bai
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Single bend energy filter for controlling deflection of charged par...
- Patent number 9,281,162
- Issue date Mar 8, 2016
- Advanced Ion Beam Technology, Inc.
- Nicholas R. White
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Replacement source/drain finFET fabrication
- Patent number 9,209,278
- Issue date Dec 8, 2015
- Advanced Ion Beam Technology, Inc.
- Daniel Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extremely low temperature rotary union
- Patent number 9,190,312
- Issue date Nov 17, 2015
- Advanced Ion Beam Technology, Inc.
- Richard F. McRay
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Doping a non-planar semiconductor device
- Patent number 9,159,810
- Issue date Oct 13, 2015
- Advanced Ion Beam Technology, Inc.
- Daniel Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas mixture method and apparatus for generating ion beam
- Patent number 9,147,550
- Issue date Sep 29, 2015
- Advanced Ion Beam Technology, Inc.
- Wei-Cheng Lin
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Multi-energy ion implantation
- Patent number 9,117,629
- Issue date Aug 25, 2015
- Advanced Ion Beam Technology, Inc.
- Zhimin Wan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Implant method and implanter by using a variable aperture
- Patent number 9,057,129
- Issue date Jun 16, 2015
- Advanced Ion Beam Technology, Inc.
- Zhimin Wan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and system for moving wafer during scanning the wafer
- Patent number 9,009,939
- Issue date Apr 21, 2015
- Advanced Ion Beam Technology, Inc (TW)
- Peter Mok
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma doping a non-planar semiconductor device
- Patent number 9,006,065
- Issue date Apr 14, 2015
- Advanced Ion Beam Technology, Inc.
- Tzu-Shih Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam control assembly for ribbon beam of ions for ion implantation
- Patent number 8,993,979
- Issue date Mar 31, 2015
- Advanced Ion Beam Technology, Inc.
- Jiong Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
WAFER TEMPERATURE MEASUREMENT IN AN ION IMPLANTATION SYSTEM
- Publication number 20230054419
- Publication date Feb 23, 2023
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Chien-Li CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RIBBON BEAM ANGLE ADJUSTMENT IN AN ION IMPLANTATION SYSTEM
- Publication number 20230005701
- Publication date Jan 5, 2023
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Zhimin WAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Hybrid Magnet Structure
- Publication number 20210398722
- Publication date Dec 23, 2021
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Ching-Shiang Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TEMPERATURE MEASUREMENT IN AN ION IMPLANTATION SYSTEM
- Publication number 20210242054
- Publication date Aug 5, 2021
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Chien-Li CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR REDUCTION OF PARTICLE CONTAMINATION BY BIA...
- Publication number 20210104378
- Publication date Apr 8, 2021
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Shao-Yu HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MONITORING THE RELATIVE RELATIONSHIP BETWE...
- Publication number 20200412280
- Publication date Dec 31, 2020
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Te-Min Wang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
WAFER CHARGES MONITORING
- Publication number 20200035526
- Publication date Jan 30, 2020
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Chih-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Vacuum jacketed tube
- Publication number 20190301661
- Publication date Oct 3, 2019
- Advanced Ion Beam Technology, Inc.
- Yu-Lin Chang
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
CALIBRATION SYSTEM WITH AT LEAST ONE CAMERA AND METHOD THEREOF
- Publication number 20190197675
- Publication date Jun 27, 2019
- Advanced Ion Beam Technology, Inc.
- Chien-Li Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER CHARGES MONITORING
- Publication number 20180330973
- Publication date Nov 15, 2018
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Chih-Chiang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Ion Implantation
- Publication number 20180315605
- Publication date Nov 1, 2018
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Steven Raymond Walther
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MONITORING THE RELATIVE RELATIONSHIP BETWE...
- Publication number 20180131293
- Publication date May 10, 2018
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Te-Min Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CLEANING ELECTROSTATIC CHUCK
- Publication number 20170125211
- Publication date May 4, 2017
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Yu-Ho Ni
- B08 - CLEANING
Information Patent Application
ION IMPLANTATION SYSTEM AND PROCESS
- Publication number 20170110287
- Publication date Apr 20, 2017
- Advanced Ion Beam Technology, Inc.
- Zhimin WAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA-BASED PROCESSING SYSTEM AND OPERATION METHOD THEREOF
- Publication number 20170069467
- Publication date Mar 9, 2017
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Wei-Cheng Lin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FORMING PUNCH-THROUGH STOPPER REGIONS IN FINFET DEVICES
- Publication number 20160293734
- Publication date Oct 6, 2016
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Daniel TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA-BASED MATERIAL MODIFICATION WITH NEUTRAL BEAM
- Publication number 20160233047
- Publication date Aug 11, 2016
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Daniel TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FIELD FLUCTUATION FOR BEAM SMOOTHING
- Publication number 20160225577
- Publication date Aug 4, 2016
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Xiao BAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION IMPLANTER AND METHOD FOR ION IMPLANTATION
- Publication number 20160217970
- Publication date Jul 28, 2016
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Anwar HUSAIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND ION IMPLANTER FOR LOW TEMPERATURE IMPLANTATION
- Publication number 20160203950
- Publication date Jul 14, 2016
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Anwar HUSAIN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR ION IMPLANTATION
- Publication number 20160133469
- Publication date May 12, 2016
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Zhimin WAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRODE ASSEMBLY HAVING PIERCE ELECTRODES FOR CONTROLLING SPACE C...
- Publication number 20160111245
- Publication date Apr 21, 2016
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Kourosh SAADATMAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Deposition Apparatus and Deposition Method Using the Same
- Publication number 20160076142
- Publication date Mar 17, 2016
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Tienyu SHENG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SINGLE BEND ENERGY FILTER FOR CONTROLLING DEFLECTION OF CHARGED PAR...
- Publication number 20150380206
- Publication date Dec 31, 2015
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Nicholas R. WHITE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOWER DOSE RATE ION IMPLANTATION USING A WIDER ION BEAM
- Publication number 20150371857
- Publication date Dec 24, 2015
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Zhimin WAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA-BASED MATERIAL MODIFICATION USING A PLASMA SOURCE WITH MAGNE...
- Publication number 20150255242
- Publication date Sep 10, 2015
- ADVANCED ION BEAM TECHNOLOGY, INC.
- William DIVERGILIO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DECELERATION APPARATUS FOR RIBBON AND SPOT BEAMS
- Publication number 20150136967
- Publication date May 21, 2015
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Nicholas White
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEDIUM CURRENT RIBBON BEAM FOR ION IMPLANTATION
- Publication number 20150102233
- Publication date Apr 16, 2015
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Robert KAIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPLACEMENT SOURCE/DRAIN FINFET FABRICATION
- Publication number 20150031181
- Publication date Jan 29, 2015
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Daniel TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM CONTROL ASSEMBLY FOR RIBBON BEAM OF IONS FOR ION IMPLANTATION
- Publication number 20140261181
- Publication date Sep 18, 2014
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Jiong Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Trademarklast 30 trademarks

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97359142 - AIBT ADVANCED ION BEAM TECHNOLOGY, INC.
- Serial number 97359142
- Registration number 7124765
- Filing date Apr 12, 2022
- ADVANCED ION BEAM TECHNOLOGY, INC.
- 7 - Machines and machine tools
Information Trademark
97322034 - IPULSAR PLUS
- Serial number 97322034
- Registration number 7245679
- Filing date Mar 21, 2022
- ADVANCED ION BEAM TECHNOLOGY, INC.
- 7 - Machines and machine tools
Information Trademark
90133445 - IBLAZAR
- Serial number 90133445
- Filing date Aug 24, 2020
- ADVANCED ION BEAM TECHNOLOGY, INC.
- 7 - Machines and machine tools
Information Trademark
86381305 - IPULSAR
- Serial number 86381305
- Registration number 4918964
- Filing date Aug 29, 2014
- ADVANCED ION BEAM TECHNOLOGY, INC.
- 7 - Machines and machine tools
Information Trademark
86381311 - IPAT
- Serial number 86381311
- Filing date Aug 29, 2014
- ADVANCED ION BEAM TECHNOLOGY, INC.
- 7 - Machines and machine tools
Information Trademark
78429270 - AIBT
- Serial number 78429270
- Registration number 3172113
- Filing date Jun 3, 2004
- Advanced Ion Beam Technology, Inc.
- 7 - Machines and machine tools
Information Trademark
78429267 - AIBT
- Serial number 78429267
- Registration number 3172112
- Filing date Jun 3, 2004
- Advanced Ion Beam Technology, Inc.
- 37 - Building construction
Information Trademark
78423236 - ISTAR
- Serial number 78423236
- Registration number 3119165
- Filing date May 21, 2004
- Advanced Ion Beam Technology, Inc.
- 7 - Machines and machine tools

ADVANCED ION BEAM TECHNOLOGY, INC.

Organization

Patents Grantslast 30 patents

Ribbon beam angle adjustment in an ion implantation system

Wafer temperature measurement in an ion implantation system

Apparatus and method for reduction of particle contamination by bia...

Hybrid magnet structure

Apparatus and method for monitoring the relative relationship betwe...

Wafer charges monitoring

Calibration system with at least one camera and method thereof

Apparatus and method for monitoring the relative relationship betwe...

Method of cleaning electrostatic chuck

Wafer charges monitoring

Magnetic field fluctuation for beam smoothing

Ion source of an ion implanter

Deceleration apparatus for ribbon and spot beams

Lower dose rate ion implantation using a wider ion beam

Ion implantation system and process

Plasma-based material modification using a plasma source with magne...

Forming punch-through stopper regions in finFET devices

Method for ion implantation

Scan head and scan arm using the same

Magnetic field fluctuation for beam smoothing

Single bend energy filter for controlling deflection of charged par...

Replacement source/drain finFET fabrication

Extremely low temperature rotary union

Doping a non-planar semiconductor device

Gas mixture method and apparatus for generating ion beam

Multi-energy ion implantation

Implant method and implanter by using a variable aperture

Method and system for moving wafer during scanning the wafer

Plasma doping a non-planar semiconductor device

Beam control assembly for ribbon beam of ions for ion implantation

Patents Applicationslast 30 patents

WAFER TEMPERATURE MEASUREMENT IN AN ION IMPLANTATION SYSTEM

RIBBON BEAM ANGLE ADJUSTMENT IN AN ION IMPLANTATION SYSTEM

Hybrid Magnet Structure

WAFER TEMPERATURE MEASUREMENT IN AN ION IMPLANTATION SYSTEM

APPARATUS AND METHOD FOR REDUCTION OF PARTICLE CONTAMINATION BY BIA...

APPARATUS AND METHOD FOR MONITORING THE RELATIVE RELATIONSHIP BETWE...

WAFER CHARGES MONITORING

Vacuum jacketed tube

CALIBRATION SYSTEM WITH AT LEAST ONE CAMERA AND METHOD THEREOF

WAFER CHARGES MONITORING

Method for Ion Implantation

APPARATUS AND METHOD FOR MONITORING THE RELATIVE RELATIONSHIP BETWE...

METHOD OF CLEANING ELECTROSTATIC CHUCK

ION IMPLANTATION SYSTEM AND PROCESS

PLASMA-BASED PROCESSING SYSTEM AND OPERATION METHOD THEREOF

FORMING PUNCH-THROUGH STOPPER REGIONS IN FINFET DEVICES

PLASMA-BASED MATERIAL MODIFICATION WITH NEUTRAL BEAM

MAGNETIC FIELD FLUCTUATION FOR BEAM SMOOTHING

ION IMPLANTER AND METHOD FOR ION IMPLANTATION

METHOD AND ION IMPLANTER FOR LOW TEMPERATURE IMPLANTATION

METHOD FOR ION IMPLANTATION

ELECTRODE ASSEMBLY HAVING PIERCE ELECTRODES FOR CONTROLLING SPACE C...

Deposition Apparatus and Deposition Method Using the Same

SINGLE BEND ENERGY FILTER FOR CONTROLLING DEFLECTION OF CHARGED PAR...

LOWER DOSE RATE ION IMPLANTATION USING A WIDER ION BEAM

PLASMA-BASED MATERIAL MODIFICATION USING A PLASMA SOURCE WITH MAGNE...

DECELERATION APPARATUS FOR RIBBON AND SPOT BEAMS

MEDIUM CURRENT RIBBON BEAM FOR ION IMPLANTATION

REPLACEMENT SOURCE/DRAIN FINFET FABRICATION

BEAM CONTROL ASSEMBLY FOR RIBBON BEAM OF IONS FOR ION IMPLANTATION

Trademarklast 30 trademarks

97359142 - AIBT ADVANCED ION BEAM TECHNOLOGY, INC.

97322034 - IPULSAR PLUS

90133445 - IBLAZAR

86381305 - IPULSAR

86381311 - IPAT

78429270 - AIBT

78429267 - AIBT

78423236 - ISTAR