ADVANTEST TEST SOLUTIONS, INC

Organization

SAN JOSE, CA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 12,345,756
- Issue date Jul 1, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Wafer scale active thermal interposer for device testing
- Patent number 12,320,841
- Issue date Jun 3, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Passive carrier-based device delivery for slot-based high-volume se...
- Patent number 12,320,852
- Issue date Jun 3, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Parallel test cell with self actuated sockets
- Patent number 12,235,314
- Issue date Feb 25, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Test system support component exchange system and method
- Patent number 12,235,315
- Issue date Feb 25, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Grant
Active thermal interposer device
- Patent number 12,216,154
- Issue date Feb 4, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Thermal array with gimbal features and enhanced thermal performance
- Patent number 12,210,056
- Issue date Jan 28, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 12,203,979
- Issue date Jan 21, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Shielded socket and carrier for high-volume test of semiconductor d...
- Patent number 12,203,958
- Issue date Jan 21, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Ergonomic loading for a test interface board (TIB) / burn-in-board...
- Patent number 12,174,248
- Issue date Dec 24, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Thermal solution for massively parallel testing
- Patent number 11,940,487
- Issue date Mar 26, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 11,852,678
- Issue date Dec 26, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Active thermal interposer device
- Patent number 11,846,669
- Issue date Dec 19, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Thermal array with gimbal features and enhanced thermal performance
- Patent number 11,835,549
- Issue date Dec 5, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Grant
Shielded socket and carrier for high-volume test of semiconductor d...
- Patent number 11,821,913
- Issue date Nov 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Passive carrier-based device delivery for slot-based high-volume se...
- Patent number 11,808,812
- Issue date Nov 7, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Test system including active thermal interposer device
- Patent number 11,774,492
- Issue date Oct 3, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
DUT placement and handling for active thermal interposer device
- Patent number 11,754,620
- Issue date Sep 12, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Carrier based high volume system level testing of devices with pop...
- Patent number 11,742,055
- Issue date Aug 29, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer scale active thermal interposer for device testing
- Patent number 11,674,999
- Issue date Jun 13, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
High current device testing apparatus and systems
- Patent number 11,656,273
- Issue date May 23, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Grant
Active thermal interposer device
- Patent number 11,609,266
- Issue date Mar 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Carrier based high volume system level testing of devices with pop...
- Patent number 11,587,640
- Issue date Feb 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 11,573,262
- Issue date Feb 7, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G05 - CONTROLLING REGULATING
Information Patent Grant
Testing system including active thermal interposer device
- Patent number 11,567,119
- Issue date Jan 31, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Thermal solution for massively parallel testing
- Patent number 11,549,981
- Issue date Jan 10, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 11,493,551
- Issue date Nov 8, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
High volume system level testing of devices with pop structures
- Patent number 10,656,200
- Issue date May 19, 2020
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING
- Publication number 20250130276
- Publication date Apr 24, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
- Publication number 20250102565
- Publication date Mar 27, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
MULTI-USER DEVELOPMENT SYSTEM FOR SYSTEM LEVEL DEVICE TESTING
- Publication number 20250102562
- Publication date Mar 27, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Jess Gillespie
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20250093408
- Publication date Mar 20, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
WAFER SCALE ACTIVE THERMAL INTERPOSER WITH THERMAL ISOLATION STRUCT...
- Publication number 20240183897
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES
- Publication number 20240183898
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
- Publication number 20240133943
- Publication date Apr 25, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE
- Publication number 20240036104
- Publication date Feb 1, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Application
SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...
- Publication number 20240027492
- Publication date Jan 25, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20240003967
- Publication date Jan 4, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
TENSION-BASED SOCKET GIMBAL FOR ENGAGING DEVICE UNDER TEST WITH THE...
- Publication number 20230393188
- Publication date Dec 7, 2023
- Advantest Test Solutions, Inc.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Application
ERGONOMIC LOADING FOR A TEST INTERFACE BOARD (TIB) / BURN-IN-BOARD...
- Publication number 20230393190
- Publication date Dec 7, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM SUPPORT COMPONENT EXCHANGE SYSTEM AND METHOD
- Publication number 20230314499
- Publication date Oct 5, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...
- Publication number 20230314512
- Publication date Oct 5, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
- Publication number 20230296667
- Publication date Sep 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G05 - CONTROLLING REGULATING
Information Patent Application
THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE
- Publication number 20230236241
- Publication date Jul 27, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Application
THERMAL SOLUTION FOR MASSIVELY PARALLEL TESTING
- Publication number 20230228812
- Publication date Jul 20, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20230197185
- Publication date Jun 22, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
HIGH CURRENT DEVICE TESTING APPARATUS AND SYSTEMS
- Publication number 20230143240
- Publication date May 11, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20230129112
- Publication date Apr 27, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
- Publication number 20230103082
- Publication date Mar 30, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL TEST CELL WITH SELF ACTUATED SOCKETS
- Publication number 20230083634
- Publication date Mar 16, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- KARTHIK RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20230062440
- Publication date Mar 2, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEM INCLUDING ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20220326299
- Publication date Oct 13, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
- Publication number 20220299563
- Publication date Sep 22, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20220284982
- Publication date Sep 8, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING
- Publication number 20220276301
- Publication date Sep 1, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20220268831
- Publication date Aug 25, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
- Publication number 20220206061
- Publication date Jun 30, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G05 - CONTROLLING REGULATING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20220187361
- Publication date Jun 16, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
99116291 - ACTIVATE360
- Serial number 99116291
- Filing date Apr 2, 2025
- Advantest Test Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

ADVANTEST TEST SOLUTIONS, INC

Organization

Patents Grantslast 30 patents

Integrated test cell using active thermal interposer (ATI) with par...

Wafer scale active thermal interposer for device testing

Passive carrier-based device delivery for slot-based high-volume se...

Parallel test cell with self actuated sockets

Test system support component exchange system and method

Active thermal interposer device

Thermal array with gimbal features and enhanced thermal performance

Multi-input multi-zone thermal control for device testing

Shielded socket and carrier for high-volume test of semiconductor d...

Ergonomic loading for a test interface board (TIB) / burn-in-board...

Thermal solution for massively parallel testing

Multi-input multi-zone thermal control for device testing

Active thermal interposer device

Thermal array with gimbal features and enhanced thermal performance

Shielded socket and carrier for high-volume test of semiconductor d...

Passive carrier-based device delivery for slot-based high-volume se...

Test system including active thermal interposer device

DUT placement and handling for active thermal interposer device

Carrier based high volume system level testing of devices with pop...

Wafer scale active thermal interposer for device testing

High current device testing apparatus and systems

Active thermal interposer device

Carrier based high volume system level testing of devices with pop...

Multi-input multi-zone thermal control for device testing

Testing system including active thermal interposer device

Thermal solution for massively parallel testing

Integrated test cell using active thermal interposer (ATI) with par...

High volume system level testing of devices with pop structures

Patents Applicationslast 30 patents

WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING

MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING

MULTI-USER DEVELOPMENT SYSTEM FOR SYSTEM LEVEL DEVICE TESTING

ACTIVE THERMAL INTERPOSER DEVICE

WAFER SCALE ACTIVE THERMAL INTERPOSER WITH THERMAL ISOLATION STRUCT...

ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES

INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...

THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE

SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...

ACTIVE THERMAL INTERPOSER DEVICE

TENSION-BASED SOCKET GIMBAL FOR ENGAGING DEVICE UNDER TEST WITH THE...

ERGONOMIC LOADING FOR A TEST INTERFACE BOARD (TIB) / BURN-IN-BOARD...

TEST SYSTEM SUPPORT COMPONENT EXCHANGE SYSTEM AND METHOD

PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...

MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING

THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE

THERMAL SOLUTION FOR MASSIVELY PARALLEL TESTING

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

HIGH CURRENT DEVICE TESTING APPARATUS AND SYSTEMS

ACTIVE THERMAL INTERPOSER DEVICE

MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING

PARALLEL TEST CELL WITH SELF ACTUATED SOCKETS

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

TEST SYSTEM INCLUDING ACTIVE THERMAL INTERPOSER DEVICE

INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING

ACTIVE THERMAL INTERPOSER DEVICE

MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING

ACTIVE THERMAL INTERPOSER DEVICE

Trademarklast 30 trademarks

99116291 - ACTIVATE360