AMBER PRECISION INSTRUMENTS, INC.

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe calibration system and method for electromagnetic compatibili...
- Patent number 11,631,927
- Issue date Apr 18, 2023
- Amber Precision Instruments, Inc.
- Hamed Kajbaf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Using computer-aided design layout in scanning system
- Patent number 10,325,057
- Issue date Jun 18, 2019
- Amber Precision Instruments, Inc.
- Giorgi Muchaidze
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Emission source microscopy for electromagnetic interference applica...
- Patent number 9,618,554
- Issue date Apr 11, 2017
- Amber Precision Instruments, Inc.
- Hamed Kajbaf
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring near field information of device un...
- Patent number 9,244,145
- Issue date Jan 26, 2016
- Amber Precision Instruments, Inc.
- Kyung Jin Min
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTICHANNEL HIGH INTENSITY ELECTROMAGNETIC INTERFERENCE DETECTION...
- Publication number 20210080495
- Publication date Mar 18, 2021
- AMBER PRECISION INSTRUMENTS, INC.
- Hamed Kajbaf
- G08 - SIGNALLING
Information Patent Application
PROBE CALIBRATION SYSTEM AND METHOD FOR ELECTROMAGNETIC COMPATIBILI...
- Publication number 20200411934
- Publication date Dec 31, 2020
- AMBER PRECISION INSTRUMENTS, INC.
- Hamed Kajbaf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USING COMPUTER-AIDED DESIGN LAYOUT IN SCANNING SYSTEM
- Publication number 20170068771
- Publication date Mar 9, 2017
- AMBER PRECISION INSTRUMENTS, INC.
- Giorgi Muchaidze
- G01 - MEASURING TESTING
Information Patent Application
EMISSION SOURCE MICROSCOPY FOR ELECTROMAGNETIC INTERFERENCE APPLICA...
- Publication number 20150177301
- Publication date Jun 25, 2015
- AMBER PRECISION INSTRUMENTS, INC.
- Hamed Kajbaf
- G01 - MEASURING TESTING

Trademarklast 30 trademarks