ANDO ELECTRIC CO., LTD.

Organization

Ota-ku, JP

Business Address
197 KAMATA 4 CHOME OTA-KU TOKYO JAPAN 144 TOKYO 2128585200
Mailing Address
19-7 KAMATA 4-CHOME OTA-KU TOKYO JAPAN 144 TOKYO M0

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring characteristics of optical fibers
- Patent number 7,180,582
- Issue date Feb 20, 2007
- Yokogawa Electric Corporation
- Tetsuo Yano
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength monitor
- Patent number 6,980,297
- Issue date Dec 27, 2005
- Ando Electric Co., Ltd.
- Minoru Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Pattern synchronous circuit
- Patent number 6,928,089
- Issue date Aug 9, 2005
- Ando Electric Co., Ltd.
- Keiji Negi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wavelength-variable light source apparatus
- Patent number 6,922,418
- Issue date Jul 26, 2005
- Ando Electric Co., Ltd.
- Seiji Funakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data log acquisition circuit and data log acquisition method
- Patent number 6,915,470
- Issue date Jul 5, 2005
- Ando Electric Co., Ltd.
- Masataka Aoshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase locked loop circuit using fractional frequency divider
- Patent number 6,914,464
- Issue date Jul 5, 2005
- Ando Electric Co., Ltd.
- Minoru Maeda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Moving image communication evaluation system and moving image commu...
- Patent number 6,910,221
- Issue date Jun 21, 2005
- Ando Electric Co., Ltd.
- Yoshizou Honda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wavelength dependence measuring system
- Patent number 6,900,883
- Issue date May 31, 2005
- Ando Electric Co., Ltd.
- Kiyohisa Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Noise figure-measuring device and noise figure-measuring method
- Patent number 6,898,001
- Issue date May 24, 2005
- Ando Electric Co., Ltd.
- Gentaro Ishihara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
IC measuring device
- Patent number 6,892,333
- Issue date May 10, 2005
- Ando Electric Co., Ltd.
- Toshiyuki Ohtaki
- G01 - MEASURING TESTING
Information Patent Grant
Tunable filter
- Patent number 6,892,000
- Issue date May 10, 2005
- Ando Electric Co., Ltd.
- Tomoo Ito
- G02 - OPTICS
Information Patent Grant
Filter processing system for the output signal of optical time doma...
- Patent number 6,882,410
- Issue date Apr 19, 2005
- Ando Electric Co., Ltd.
- Yoshimitsu Asahina
- G01 - MEASURING TESTING
Information Patent Grant
Monochromator and optical spectrum analyzer using the same
- Patent number 6,879,396
- Issue date Apr 12, 2005
- Ando Electric Co., Ltd.
- Tsutomu Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Monochromator and optical spectrum analyzer
- Patent number 6,853,450
- Issue date Feb 8, 2005
- Ando Electric Co., Ltd.
- Takashi Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength tunable light source
- Patent number 6,850,545
- Issue date Feb 1, 2005
- Ando Electric Co., Ltd.
- Keisuke Asami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable-wavelength light source unit
- Patent number 6,850,688
- Issue date Feb 1, 2005
- Ando Electric Co., Ltd.
- Nobuaki Ema
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical fiber measuring apparatus
- Patent number 6,839,130
- Issue date Jan 4, 2005
- Ando Electric Co., Ltd.
- Tetsuya Araki
- G01 - MEASURING TESTING
Information Patent Grant
Noise generator
- Patent number 6,831,955
- Issue date Dec 14, 2004
- Ando Electric Co., Ltd.
- Masayuki Takahashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical fiber chromatic dispersion distribution measuring apparatus...
- Patent number 6,819,473
- Issue date Nov 16, 2004
- Ando Electric Co., Ltd.
- Shoichi Aoki
- G01 - MEASURING TESTING
Information Patent Grant
IC test system and storage medium for the same
- Patent number 6,807,647
- Issue date Oct 19, 2004
- Ando Electric Co., Ltd.
- Shintaro Mori
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of heating semiconductor devices
- Patent number 6,803,547
- Issue date Oct 12, 2004
- Ando Electric Co., Ltd.
- Tohru Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polarization dependent loss measuring apparatus
- Patent number 6,798,510
- Issue date Sep 28, 2004
- Ando Electric Co., Ltd.
- Kiyohisa Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring a phase delay characteristic
- Patent number 6,794,857
- Issue date Sep 21, 2004
- Ando Electric Co. Ltd.
- Seiji Toyoda
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength measurement apparatus
- Patent number 6,795,196
- Issue date Sep 21, 2004
- Ando Electric Co., Ltd.
- Seiji Funakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of setting gribs and/or markers in measuring apparatus
- Patent number 6,784,655
- Issue date Aug 31, 2004
- Ando Electric Co., Ltd.
- Hiroki Saito
- G01 - MEASURING TESTING
Information Patent Grant
Monitor circuit for extracting administration information in a comm...
- Patent number 6,781,958
- Issue date Aug 24, 2004
- Ando Electric Co., Ltd.
- Hiroshi Nagai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Frequency error measuring method and frequency error measuring device
- Patent number 6,782,045
- Issue date Aug 24, 2004
- Ando Electric Co., Ltd.
- Masaharu Tanai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring method and measuring apparatus of wavelength dispersion d...
- Patent number 6,781,678
- Issue date Aug 24, 2004
- Ando Electric Co., Ltd.
- Shoichi Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-variable light source
- Patent number 6,778,564
- Issue date Aug 17, 2004
- Ando Electric Co., Ltd.
- Seiji Funakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Motion picture code evaluator and related systems
- Patent number 6,778,254
- Issue date Aug 17, 2004
- Ando Electric Co., Ltd.
- Yoshizou Honda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Optical pulse testing device
- Publication number 20040223136
- Publication date Nov 11, 2004
- Kyusyu Ando Electric Company Limited
- Tetsuya Araki
- G01 - MEASURING TESTING
Information Patent Application
Optical interferometer
- Publication number 20040042016
- Publication date Mar 4, 2004
- Ando Electric Co., Ltd.,
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Application
Wavelength-variable light source apparatus
- Publication number 20030165166
- Publication date Sep 4, 2003
- ANDO ELECTRIC CO., LTD.
- Seiji Funakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit for generating time division multiplex signal
- Publication number 20030123489
- Publication date Jul 3, 2003
- Ando Electric Co., Ltd.
- Noriyuki Banno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Video distribution test system for evaluating image quality by dete...
- Publication number 20030121053
- Publication date Jun 26, 2003
- Ando Electric Co., Ltd.
- Yoshizou Honda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Polarization dependent loss measuring apparatus
- Publication number 20030117625
- Publication date Jun 26, 2003
- Ando Electric Co., Ltd.
- Kiyohisa Fujita
- G01 - MEASURING TESTING
Information Patent Application
PLL circuit and control method for PLL circuit
- Publication number 20030112043
- Publication date Jun 19, 2003
- Ando Electric Co., Ltd.
- Masayuki Takahashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Tunable filter
- Publication number 20030108293
- Publication date Jun 12, 2003
- Ando Electric Co., Ltd.
- Tomoo Ito
- G02 - OPTICS
Information Patent Application
Optical spectrum analyzer and optical spectrum measuring method
- Publication number 20030098975
- Publication date May 29, 2003
- Ando Electric Co., Ltd.
- Tohru Mori
- G01 - MEASURING TESTING
Information Patent Application
Monochromator and optical spectrum analyzer using the same
- Publication number 20030081208
- Publication date May 1, 2003
- Ando Electric Co., Ltd.
- Tsutomu Kaneko
- G01 - MEASURING TESTING
Information Patent Application
Load test system for video data distributing server
- Publication number 20030081560
- Publication date May 1, 2003
- ANDO ELECTRIC CO., LTD.
- Yoshizou Honda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MPLS packet statistical process method and statistical process appa...
- Publication number 20030065772
- Publication date Apr 3, 2003
- Ando Electric Co., Ltd.
- Gento Hata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method of manufacturing Q-value and device therefor
- Publication number 20030065993
- Publication date Apr 3, 2003
- ANDO ELECTRIC CO., LTD.
- Masanori Kaji
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Optical sampling waveform measuring apparatus
- Publication number 20030043366
- Publication date Mar 6, 2003
- Ando Electric Co., Ltd.
- Hiroshi Ohta
- G01 - MEASURING TESTING
Information Patent Application
Noise evaluation circuit for IC tester
- Publication number 20030020498
- Publication date Jan 30, 2003
- Ando Electric Co., Ltd. (Japanese)
- Masayuki Kamata
- G01 - MEASURING TESTING
Information Patent Application
Optical sampling waveform measuring apparatus
- Publication number 20030016347
- Publication date Jan 23, 2003
- ANDO ELECTRIC CO., LTD.
- Hiroshi Ohta
- G01 - MEASURING TESTING
Information Patent Application
Depolarizer and spectroscope
- Publication number 20030007149
- Publication date Jan 9, 2003
- Ando Electric Co., Ltd.
- Toshikazu Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Probe apparatus
- Publication number 20030004687
- Publication date Jan 2, 2003
- Ando Electric Co., Ltd.
- Akira Seki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method of cooling devices
- Publication number 20020170702
- Publication date Nov 21, 2002
- ANDO ELECTRIC CO., LTD.
- Youichi Ito
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
Semiconductor integrated circuit
- Publication number 20020167334
- Publication date Nov 14, 2002
- ANDO ELECTRIC CO., LTD.
- Kazuo Nakaizumi
- G01 - MEASURING TESTING
Information Patent Application
Optical fiber characteristic measuring device
- Publication number 20020154291
- Publication date Oct 24, 2002
- ANDO ELECTRIC CO., LTD.
- Haruyoshi Uchiyama
- G01 - MEASURING TESTING
Information Patent Application
Distance change output device and method
- Publication number 20020149382
- Publication date Oct 17, 2002
- ANDO ELECTRIC CO., LTD.
- Haruyuki Matsushita
- G01 - MEASURING TESTING
Information Patent Application
Data transfer circuit and data transfer method
- Publication number 20020138657
- Publication date Sep 26, 2002
- ANDO ELECTRIC CO., LTD.
- Masayuki Hirofuji
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Chromatic dispersion distribution measurement apparatus and method...
- Publication number 20020131037
- Publication date Sep 19, 2002
- Ando Electric Co., Ltd.
- Shoichi Aoki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test apparatus
- Publication number 20020133774
- Publication date Sep 19, 2002
- Ando Electric Co.,Ltd.
- Yasuyuki Inoue
- G01 - MEASURING TESTING
Information Patent Application
Chromatic dispersion distribution measuring apparatus and measuring...
- Publication number 20020122171
- Publication date Sep 5, 2002
- Ando Electric Co., Ltd.
- Shoichi Aoki
- G01 - MEASURING TESTING
Information Patent Application
Pattern data transmission device and pattern data transmission method
- Publication number 20020116672
- Publication date Aug 22, 2002
- ANDO ELECTRIC CO., LTD.
- Masatoshi Kanzaki
- G11 - INFORMATION STORAGE
Information Patent Application
Chromatic dispersion distribution measurement apparatus and method...
- Publication number 20020113956
- Publication date Aug 22, 2002
- Ando Electric Co., Ltd.
- Shoichi Aoki
- G01 - MEASURING TESTING
Information Patent Application
Inverter circuit
- Publication number 20020105371
- Publication date Aug 8, 2002
- ANDO ELECTRIC CO., LTD.
- Kazuo Nakaizumi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Chromatic dispersion distribution measurement apparatus and method...
- Publication number 20020107655
- Publication date Aug 8, 2002
- Ando Electric Co., Ltd.
- Shoichi Aoki
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
76353341 - LA ANDO
- Serial number 76353341
- Registration number 2715242
- Filing date Dec 31, 2001
- ANDO ELECTRIC CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74188858 - ANDOLAB
- Serial number 74188858
- Registration number 1787880
- Filing date Jul 26, 1991
- Ando Electric Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

ANDO ELECTRIC CO., LTD.

Organization

Business Address

Mailing Address

Patents Grantslast 30 patents

Apparatus and method for measuring characteristics of optical fibers

Wavelength monitor

Pattern synchronous circuit

Wavelength-variable light source apparatus

Data log acquisition circuit and data log acquisition method

Phase locked loop circuit using fractional frequency divider

Moving image communication evaluation system and moving image commu...

Wavelength dependence measuring system

Noise figure-measuring device and noise figure-measuring method

IC measuring device

Tunable filter

Filter processing system for the output signal of optical time doma...

Monochromator and optical spectrum analyzer using the same

Monochromator and optical spectrum analyzer

Wavelength tunable light source

Variable-wavelength light source unit

Optical fiber measuring apparatus

Noise generator

Optical fiber chromatic dispersion distribution measuring apparatus...

IC test system and storage medium for the same

Apparatus for and method of heating semiconductor devices

Polarization dependent loss measuring apparatus

Apparatus and method for measuring a phase delay characteristic

Wavelength measurement apparatus

Method of setting gribs and/or markers in measuring apparatus

Monitor circuit for extracting administration information in a comm...

Frequency error measuring method and frequency error measuring device

Measuring method and measuring apparatus of wavelength dispersion d...

Wavelength-variable light source

Motion picture code evaluator and related systems

Patents Applicationslast 30 patents

Optical pulse testing device

Optical interferometer

Wavelength-variable light source apparatus

Circuit for generating time division multiplex signal

Video distribution test system for evaluating image quality by dete...

Polarization dependent loss measuring apparatus

PLL circuit and control method for PLL circuit

Tunable filter

Optical spectrum analyzer and optical spectrum measuring method

Monochromator and optical spectrum analyzer using the same

Load test system for video data distributing server

MPLS packet statistical process method and statistical process appa...

Method of manufacturing Q-value and device therefor

Optical sampling waveform measuring apparatus

Noise evaluation circuit for IC tester

Optical sampling waveform measuring apparatus

Depolarizer and spectroscope

Probe apparatus

Method of cooling devices

Semiconductor integrated circuit

Optical fiber characteristic measuring device

Distance change output device and method

Data transfer circuit and data transfer method

Chromatic dispersion distribution measurement apparatus and method...

Semiconductor test apparatus

Chromatic dispersion distribution measuring apparatus and measuring...

Pattern data transmission device and pattern data transmission method

Chromatic dispersion distribution measurement apparatus and method...

Inverter circuit

Chromatic dispersion distribution measurement apparatus and method...

Trademarklast 30 trademarks

76353341 - LA ANDO

74188858 - ANDOLAB