Antares Advanced Test Technologies (Suzhou) Limited

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Jiangsu, CN

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Patents Grantslast 30 patents

Information Patent Grant
Interconnect assembly for testing integrated circuit packages
- Patent number 7,402,051
- Issue date Jul 22, 2008
- Antares Advanced Test Technologies, Inc.
- Rakesh Batish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crimped tube electrical test socket pin
- Patent number 7,297,004
- Issue date Nov 20, 2007
- Antares Advanced Test Technologies, Inc.
- John M. Shuhart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnect assembly for a probe card
- Patent number 7,217,139
- Issue date May 15, 2007
- Antares Advanced Test Technologies, Inc.
- Jim Jaquette
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TESTING SOCKET
- Publication number 20240302408
- Publication date Sep 12, 2024
- Antares Advanced Test Technologies (Suzhou) Limited
- Long Zhang
- G01 - MEASURING TESTING
Information Patent Application
LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRC...
- Publication number 20240142513
- Publication date May 2, 2024
- Antares Advanced Test Technologies (Suzhou) Limited
- Jiachun Zhou
- G01 - MEASURING TESTING
Information Patent Application
LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRC...
- Publication number 20230099805
- Publication date Mar 30, 2023
- Antares Advanced Test Technologies (Suzhou) Limited
- Jiachun Zhou
- G01 - MEASURING TESTING
Information Patent Application
THERMALLY BALANCED HEAT SINKS
- Publication number 20090321901
- Publication date Dec 31, 2009
- ANTARES ADVANCED TEST TECHNOLOGIES, INC.
- Chris Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPRING PROBE
- Publication number 20090261851
- Publication date Oct 22, 2009
- ANTARES ADVANCED TEST TECHNOLOGIES, INC.
- Jiachun Zhou
- G01 - MEASURING TESTING
Information Patent Application
TEST INTERCONNECT
- Publication number 20090237097
- Publication date Sep 24, 2009
- ANTARES ADVANCED TEST TECHNOLOGIES, INC., a Washington corporation
- ILAVARASAN M. PALANIAPPA
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
77219700 - RTBI
- Serial number 77219700
- Filing date Jun 29, 2007
- ANTARES ADVANCED TEST TECHNOLOGIES, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77156699 - ISOCKET
- Serial number 77156699
- Registration number 3529396
- Filing date Apr 13, 2007
- ANTARES ADVANCED TEST TECHNOLOGIES, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments