Membership
Tour
Register
Log in
BRUKER AXS ANALYTICAL X-RAY SYSTEMS GMBH
Follow
Organization
KARLSRUHE, DE
Organizations
Overview
Industries
People
People
Information
Transactions
Events
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
X-ray analysis device with X-ray optical semi-conductor constructio...
Patent number
6,477,226
Issue date
Nov 5, 2002
Bruker AXS Analytical X-ray Systems GmbH
Volker Lehmann
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Compact X-ray spectrometer
Patent number
6,233,307
Issue date
May 15, 2001
Bruker AXS Analytical X-ray Systems GmbH
Rainer Golenhofen
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analysis apparatus with a graded multilayer mirror
Patent number
6,226,349
Issue date
May 1, 2001
Bruker AXS Analytical X-ray Systems GmbH
Manfred Schuster
G01 - MEASURING TESTING
Information
Patent Grant
Simultaneous x-ray fluorescence spectrometer
Patent number
6,226,347
Issue date
May 1, 2001
Bruker AXS Analytical X-ray Systems GmbH
Rainer Golenhofen
G01 - MEASURING TESTING
Information
Patent Grant
Automatic sample changer for an X-ray diffractometer
Patent number
6,111,930
Issue date
Aug 29, 2000
Bruker AXS Analytical X-Ray Systems GmbH
Rolf Schipper
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Trademark
last 30 trademarks
Information
Trademark
75585787 - D8
Serial number
75585787
Registration number
2403302
Filing date
Nov 9, 1998
Bruker Axs Analytical X-ray Systems GmbH
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments