BRUKER AXS ANALYTICAL X-RAY SYSTEMS GMBH

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KARLSRUHE, DE

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis device with X-ray optical semi-conductor constructio...
- Patent number 6,477,226
- Issue date Nov 5, 2002
- Bruker AXS Analytical X-ray Systems GmbH
- Volker Lehmann
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Compact X-ray spectrometer
- Patent number 6,233,307
- Issue date May 15, 2001
- Bruker AXS Analytical X-ray Systems GmbH
- Rainer Golenhofen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus with a graded multilayer mirror
- Patent number 6,226,349
- Issue date May 1, 2001
- Bruker AXS Analytical X-ray Systems GmbH
- Manfred Schuster
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous x-ray fluorescence spectrometer
- Patent number 6,226,347
- Issue date May 1, 2001
- Bruker AXS Analytical X-ray Systems GmbH
- Rainer Golenhofen
- G01 - MEASURING TESTING
Information Patent Grant
Automatic sample changer for an X-ray diffractometer
- Patent number 6,111,930
- Issue date Aug 29, 2000
- Bruker AXS Analytical X-Ray Systems GmbH
- Rolf Schipper
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
75585787 - D8
- Serial number 75585787
- Registration number 2403302
- Filing date Nov 9, 1998
- Bruker Axs Analytical X-ray Systems GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments