BRUKER-FRANZEN ANALYTIK GMBH

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BREMEN, DE

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Patents Grantslast 30 patents

Information Patent Grant
Exact mass determination with maldi time-of-flight mass spectrometers
- Patent number 5,869,830
- Issue date Feb 9, 1999
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer with vacuum-external ion generation
- Patent number 5,859,433
- Issue date Jan 12, 1999
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Virtual impactors with slit shaped nozzles without slit ends
- Patent number 5,858,043
- Issue date Jan 12, 1999
- Bruker-Franzen Analytik, GmbH
- Hans-Ulrich Geise
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Device and method for introduction of sample supports into a mass s...
- Patent number 5,841,136
- Issue date Nov 24, 1998
- Bruker-Franzen Analytik, GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for matrix-assisted laser desorption ionization
- Patent number 5,828,063
- Issue date Oct 27, 1998
- Bruker-Franzen Analytik, GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Introduction of ions from ion sources into mass spectrometers
- Patent number 5,825,026
- Issue date Oct 20, 1998
- Bruker-Franzen Analytik, GmbH
- Gokhan Baykut
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for injection of ions into an ion trap
- Patent number 5,818,055
- Issue date Oct 6, 1998
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temporary storage of ions for mass spectrometric analyses
- Patent number 5,811,800
- Issue date Sep 22, 1998
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for orthogonal ion injection into a time-of-fligh...
- Patent number 5,763,878
- Issue date Jun 9, 1998
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for the introduction of ions into the gas stream...
- Patent number 5,747,799
- Issue date May 5, 1998
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of improving mass resolution in time-of-flight mass spectrom...
- Patent number 5,742,049
- Issue date Apr 21, 1998
- Bruker-Franzen Analytik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for the introduction of ions into quadrupole ion...
- Patent number 5,739,530
- Issue date Apr 14, 1998
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for the improved mass resolution of time-of-fligh...
- Patent number 5,739,529
- Issue date Apr 14, 1998
- Bruker-Franzen Analytik GmbH
- Frank Laukien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for transport of ions in gas through a capillary
- Patent number 5,736,740
- Issue date Apr 7, 1998
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for time-of-flight mass spectrometry of daughter ions
- Patent number 5,734,161
- Issue date Mar 31, 1998
- Bruker-Franzen Analytik, GmbH
- Claus Koster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling the ion generation rate for mass selective l...
- Patent number 5,710,427
- Issue date Jan 20, 1998
- Bruker-Franzen Analytik GmbH
- Michael Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for the transport of ions in vacuum
- Patent number 5,708,268
- Issue date Jan 13, 1998
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the ionization of heavy molecules at atmospheric pressure
- Patent number 5,663,561
- Issue date Sep 2, 1997
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for exciting the oscillations of ions in ion traps with freq...
- Patent number 5,654,542
- Issue date Aug 5, 1997
- Bruker-Franzen Analytik GmbH
- Michael Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass resolution in time-of-flight mass spectrometers with reflectors
- Patent number 5,654,545
- Issue date Aug 5, 1997
- Bruker-Franzen Analytik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improved mass resolution with a TOF-LD source
- Patent number 5,641,959
- Issue date Jun 24, 1997
- Bruker-Franzen Analytik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrospraying method for mass spectrometric analysis
- Patent number 5,608,217
- Issue date Mar 4, 1997
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- G01 - MEASURING TESTING
Information Patent Grant
Method for mass spectrometric analysis of samples from electrophore...
- Patent number 5,595,636
- Issue date Jan 21, 1997
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for the reflection of charged particles on surfaces
- Patent number 5,572,035
- Issue date Nov 5, 1996
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of automatically controlling the space charge in ion traps
- Patent number 5,559,325
- Issue date Sep 24, 1996
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Virtual impactor
- Patent number 5,533,406
- Issue date Jul 9, 1996
- Bruker-Franzen Analytik GmbH
- Hans-Ulrich Geise
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Collisionally induced decomposition of ions in nonlinear ion traps
- Patent number 5,528,031
- Issue date Jun 18, 1996
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of selecting reaction paths in ion traps
- Patent number 5,521,379
- Issue date May 28, 1996
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Device and method for mass spectrometric analysis of substance mixt...
- Patent number 5,505,832
- Issue date Apr 9, 1996
- Bruker-Franzen Analytik GmbH
- Frank Laukien
- G01 - MEASURING TESTING
Information Patent Grant
Method of ionizing atoms or molecules by electrospraying
- Patent number 5,504,329
- Issue date Apr 2, 1996
- Bruker-Franzen Analytik GmbH
- Matthias Mann
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
75287644 - AUTOFLEX
- Serial number 75287644
- Registration number 2223667
- Filing date May 6, 1997
- Bruker-Franzen Analytik GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75287528 - GENFLEX
- Serial number 75287528
- Filing date May 6, 1997
- Bruker-Franzen Analytik GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74335682 - BENCH TOF
- Serial number 74335682
- Filing date Nov 30, 1992
- Bruker-Franzen Analytik GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74246005 - REFLEX
- Serial number 74246005
- Registration number 1839868
- Filing date Feb 13, 1992
- Bruker-Franzen Analytik GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73745615 - CHROMSTAR
- Serial number 73745615
- Registration number 1817751
- Filing date Aug 10, 1988
- BRUKER-FRANZEN ANALYTIK GMBH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73737306 - BIOTOF
- Serial number 73737306
- Registration number 1543350
- Filing date Jun 30, 1988
- BRUKER-FRANZEN ANALYTIK GMBH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

BRUKER-FRANZEN ANALYTIK GMBH

Organization

Patents Grantslast 30 patents

Exact mass determination with maldi time-of-flight mass spectrometers

Ion trap mass spectrometer with vacuum-external ion generation

Virtual impactors with slit shaped nozzles without slit ends

Device and method for introduction of sample supports into a mass s...

Method for matrix-assisted laser desorption ionization

Introduction of ions from ion sources into mass spectrometers

Method and device for injection of ions into an ion trap

Temporary storage of ions for mass spectrometric analyses

Method and device for orthogonal ion injection into a time-of-fligh...

Method and device for the introduction of ions into the gas stream...

Method of improving mass resolution in time-of-flight mass spectrom...

Method and device for the introduction of ions into quadrupole ion...

Device and method for the improved mass resolution of time-of-fligh...

Method and device for transport of ions in gas through a capillary

Method for time-of-flight mass spectrometry of daughter ions

Method for controlling the ion generation rate for mass selective l...

Method and device for the transport of ions in vacuum

Method for the ionization of heavy molecules at atmospheric pressure

Method for exciting the oscillations of ions in ion traps with freq...

Mass resolution in time-of-flight mass spectrometers with reflectors

Method for improved mass resolution with a TOF-LD source

Electrospraying method for mass spectrometric analysis

Method for mass spectrometric analysis of samples from electrophore...

Method and device for the reflection of charged particles on surfaces

Method of automatically controlling the space charge in ion traps

Virtual impactor

Collisionally induced decomposition of ions in nonlinear ion traps

Method of selecting reaction paths in ion traps

Device and method for mass spectrometric analysis of substance mixt...

Method of ionizing atoms or molecules by electrospraying

Trademarklast 30 trademarks

75287644 - AUTOFLEX

75287528 - GENFLEX

74335682 - BENCH TOF

74246005 - REFLEX

73745615 - CHROMSTAR

73737306 - BIOTOF