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CARL ZEISS NTS, LLC.
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Peabody, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Nanopore fabrication and applications thereof
Patent number
8,894,796
Issue date
Nov 25, 2014
The University of North Carolina at Greensboro
Adam R Hall
G01 - MEASURING TESTING
Information
Patent Grant
Cross-section systems and methods
Patent number
8,384,029
Issue date
Feb 26, 2013
Carl Zeiss NTS, LLC
Rainer Knippelmeyer
G01 - MEASURING TESTING
Information
Patent Grant
Multiple current charged particle methods
Patent number
8,227,753
Issue date
Jul 24, 2012
Carl Zeiss NTS, LLC
John A. Notte, IV
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Increasing current in charged particle sources and systems
Patent number
8,124,941
Issue date
Feb 28, 2012
Carl Zeiss NTS, LLC
John A. Notte, IV
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion beam stabilization
Patent number
8,093,563
Issue date
Jan 10, 2012
Carl Zeiss NTS, LLC
FHM-Faridur Rahman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample decontamination
Patent number
8,013,300
Issue date
Sep 6, 2011
Carl Zeiss NTS, LLC
Lewis A. Stern
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS
Publication number
20130175444
Publication date
Jul 11, 2013
CARL ZEISS NTS, LLC.
John A. Notte
G01 - MEASURING TESTING
Information
Patent Application
COOLED CHARGED PARTICLE SYSTEMS AND METHODS
Publication number
20130118184
Publication date
May 16, 2013
CARL ZEISS NTS, LLC.
Alexander Groholski
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Application
ION SOURCES, SYSTEMS AND METHODS
Publication number
20120241640
Publication date
Sep 27, 2012
CARL ZEISS NTS, LLC.
Billy W. Ward
F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information
Patent Application
SAMPLE PREPARATION
Publication number
20120199737
Publication date
Aug 9, 2012
CARL ZEISS NTS, LLC.
Diederik Jan Maas
G01 - MEASURING TESTING
Information
Patent Application
GAS DELIVERY IN A MICROSCOPE SYSTEM
Publication number
20120145896
Publication date
Jun 14, 2012
CARL ZEISS NTS, LLC.
Billy W. Ward
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VARIABLE ENERGY CHARGED PARTICLE SYSTEMS
Publication number
20120138815
Publication date
Jun 7, 2012
CARL ZEISS NTS, LLC.
Raymond Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION BEAM STABILIZATION
Publication number
20120097849
Publication date
Apr 26, 2012
CARL ZEISS NTS, LLC.
FHM-Faridur Rahman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CROSS-SECTION SYSTEMS AND METHODS
Publication number
20120085906
Publication date
Apr 12, 2012
CARL ZEISS NTS, LLC.
Rainer Knippelmeyer
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR HEATING A TIP APEX OF A CHARGED PARTICLE SO...
Publication number
20120074318
Publication date
Mar 29, 2012
CARL ZEISS NTS, LLC.
John Notte, IV
G05 - CONTROLLING REGULATING
Information
Patent Application
GAS FIELD ION MICROSCOPES HAVING MULTIPLE OPERATION MODES
Publication number
20120068067
Publication date
Mar 22, 2012
CARL ZEISS NTS, LLC.
Lawrence Scipioni
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE DETECTORS
Publication number
20120068068
Publication date
Mar 22, 2012
CARL ZEISS NTS, LLC.
Raymond Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCAN METHOD
Publication number
20120057015
Publication date
Mar 8, 2012
CARL ZEISS NTS, LLC.
Billy W. Ward
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION SOURCES, SYSTEMS AND METHODS
Publication number
20110240853
Publication date
Oct 6, 2011
CARL ZEISS NTS, LLC.
Richard Comunale
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ALIGNING CHARGED PARTICLE BEAMS
Publication number
20110180722
Publication date
Jul 28, 2011
CARL ZEISS NTS, LLC.
Raymond Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON DETECTION SYSTEMS AND METHODS
Publication number
20110127428
Publication date
Jun 2, 2011
CARL ZEISS NTS, LLC.
Raymond Hill
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE INSPECTION METHODS, SYSTEMS AND COMPONENTS
Publication number
20110121176
Publication date
May 26, 2011
CARL ZEISS NTS, LLC.
Sybren Sijbrandij
G01 - MEASURING TESTING
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