CARL ZEISS X-RAY MICROSCOPY INC

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DUBLIN, IE

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Patents Grantslast 30 patents

Information Patent Grant
Reflection target X-ray source with steered beam on target
- Patent number 12,213,238
- Issue date Jan 28, 2025
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Process parameter prediction using multivariant structural regression
- Patent number 12,148,138
- Issue date Nov 19, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High resolution light valve detector for detecting x-ray
- Patent number 12,130,392
- Issue date Oct 29, 2024
- Carl Zeiss X-ray Microscopy Inc.
- Xiaochao Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for liquid cooling isolated x-ray transmission ta...
- Patent number 12,035,451
- Issue date Jul 9, 2024
- Carl Zeiss X-ray Microscopy Inc.
- Claus Flachenecker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accessible neural network image processing workflow
- Patent number 11,972,511
- Issue date Apr 30, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fiber-optic communication for embedded electronics in x-ray generator
- Patent number 11,961,694
- Issue date Apr 16, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to acquire a 3D image of a sample structure
- Patent number 11,935,228
- Issue date Mar 19, 2024
- Carl Zeiss SMT GmbH
- Ramani Pichumani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray source with liquid cooled source coils
- Patent number 11,864,300
- Issue date Jan 2, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical three-dimensional scanning for collision avoidance in micro...
- Patent number 11,821,860
- Issue date Nov 21, 2023
- Carl Zeiss X-ray Microscopy Inc.
- Lars Omlor
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for the proscriptive determination of parameters...
- Patent number 11,816,765
- Issue date Nov 14, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection system for X-ray inspection of an object
- Patent number 11,817,231
- Issue date Nov 14, 2023
- Carl Zeiss SMT GmbH
- Johannes Ruoff
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Fluid cooled reflective x-ray source
- Patent number 11,769,647
- Issue date Sep 26, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge phase effects removal using wavelet correction and particle cl...
- Patent number 11,645,792
- Issue date May 9, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for the proscriptive determination of parameters...
- Patent number 11,138,767
- Issue date Oct 5, 2021
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray CT microscopy system and method utilizing lattice sampling
- Patent number 11,085,888
- Issue date Aug 10, 2021
- Carl Zeiss X-ray Microscopy, Inc.
- William Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for spectral characterization in computed tomogra...
- Patent number 10,859,515
- Issue date Dec 8, 2020
- Carl Zeiss X-ray Microscopy, Inc.
- Zhifeng Huang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray CT microscopy system and method utilizing lattice sampling
- Patent number 10,514,343
- Issue date Dec 24, 2019
- Carl Zeiss X-ray Microscopy, Inc.
- William Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Multi energy X-ray microscope data acquisition and image reconstruc...
- Patent number 10,335,104
- Issue date Jul 2, 2019
- Carl Zeiss X-ray Microscopy, Inc.
- Thomas A. Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Segmentation and spectrum based metal artifact reduction method and...
- Patent number 10,297,048
- Issue date May 21, 2019
- Carl Zeiss X-ray Microscopy, Inc.
- Zhifeng Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi energy X-ray microscope data acquisition and image reconstruc...
- Patent number 10,169,865
- Issue date Jan 1, 2019
- Carl Zeiss X-ray Microscopy, Inc.
- Thomas A. Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multimodality mineralogy segmentation system and method
- Patent number 10,107,769
- Issue date Oct 23, 2018
- CARL ZEISS X-RAY MICROSCOPY INC.
- Sreenivas Naga Bhattiprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined confocal X-ray fluorescence and X-ray computerised tomogra...
- Patent number 9,739,729
- Issue date Aug 22, 2017
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Grant
Stacked zone plates for pitch frequency multiplication
- Patent number 9,640,291
- Issue date May 2, 2017
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for analyzing an object and charged particle beam device for...
- Patent number 9,620,331
- Issue date Apr 11, 2017
- Carl Zeiss Microscopy Ltd.
- Sreenivas Bhattiprolu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Confocal XRF-CT system for mining analysis
- Patent number 9,488,605
- Issue date Nov 8, 2016
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Grant
Laboratory X-ray micro-tomography system with crystallographic grai...
- Patent number 9,383,324
- Issue date Jul 5, 2016
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,901
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray source with an immersion lens
- Patent number 9,142,382
- Issue date Sep 22, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- David L. Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multi energy X-ray microscope data acquisition and image reconstruc...
- Patent number 9,128,584
- Issue date Sep 8, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- Thomas A. Case
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Laboratory x-ray micro-tomography system with crystallographic grai...
- Patent number 9,110,004
- Issue date Aug 18, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High Resolution Light Valve Detector for Detecting X-Ray
- Publication number 20250020818
- Publication date Jan 16, 2025
- Carl Zeiss X-ray Microscopy, Inc.
- Xiaochao Xu
- G01 - MEASURING TESTING
Information Patent Application
IMAGING OPTICAL ARRANGEMENT TO IMAGE AN OBJECT ILLUMINATED BY X-RAYS
- Publication number 20240295507
- Publication date Sep 5, 2024
- Carl Zeiss SMT GMBH
- Johannes Ruoff
- G01 - MEASURING TESTING
Information Patent Application
Laboratory crystallographic x-ray diffraction analysis system
- Publication number 20240219328
- Publication date Jul 4, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Christian HOLZNER
- G01 - MEASURING TESTING
Information Patent Application
Reflection target X-ray source with steered beam on target
- Publication number 20240130028
- Publication date Apr 18, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Spectrally and Spatially Resolved X-Ray and Particle Detection System
- Publication number 20230165541
- Publication date Jun 1, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Xiaochao Xu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
3D Particle Analysis and Separation Using Dual Seeding
- Publication number 20230143179
- Publication date May 11, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Evan Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi-fraction sample holder for 3D particle analysis
- Publication number 20230146198
- Publication date May 11, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G01 - MEASURING TESTING
Information Patent Application
Method and system for analytical X-ray calibration, reconstruction...
- Publication number 20230143112
- Publication date May 11, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fluid cooled reflective x-ray source
- Publication number 20230135447
- Publication date May 4, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO ACQUIRE A 3D IMAGE OF A SAMPLE STRUCTURE
- Publication number 20230127194
- Publication date Apr 27, 2023
- Carl Zeiss SMT GmbH
- Ramani Pichumani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION SYSTEM FOR X-RAY INSPECTION OF AN OBJECT
- Publication number 20230046280
- Publication date Feb 16, 2023
- Carl Zeiss SMT GMBH
- Johannes Ruoff
- G01 - MEASURING TESTING
Information Patent Application
Edge Phase Effects Removal Using Wavelet Correction and Particle Cl...
- Publication number 20220366620
- Publication date Nov 17, 2022
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for liquid cooling isolated X-ray transmission ta...
- Publication number 20220346212
- Publication date Oct 27, 2022
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray source with liquid cooled source coils
- Publication number 20220346211
- Publication date Oct 27, 2022
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fiber-optic communication for embedded electronics in x-ray generator
- Publication number 20220346213
- Publication date Oct 27, 2022
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and Method for the Proscriptive Determination of Parameters...
- Publication number 20220028130
- Publication date Jan 27, 2022
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
High Resolution Light Valve Detector for Detecting X-Ray
- Publication number 20210311211
- Publication date Oct 7, 2021
- Carl Zeiss X-ray Microscopy, Inc.
- Xiaochao Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process parameter prediction using multivariant structural regression
- Publication number 20210182597
- Publication date Jun 17, 2021
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical three-dimensional scanning for collision avoidance in micro...
- Publication number 20210116401
- Publication date Apr 22, 2021
- Carl Zeiss X-ray Microscopy Inc.
- Lars Omlor
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray CT microscopy system and method utilizing lattice sampling
- Publication number 20200080947
- Publication date Mar 12, 2020
- CARL ZEISS X-RAY MICROSCOPY, INC.
- William Thompson
- G01 - MEASURING TESTING
Information Patent Application
System and Method for the Proscriptive Determination of Parameters...
- Publication number 20190311504
- Publication date Oct 10, 2019
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR SPECTRAL CHARACTERIZATION IN COMPUTED TOMOGRA...
- Publication number 20170276620
- Publication date Sep 28, 2017
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Zhifeng Huang
- G01 - MEASURING TESTING
Information Patent Application
Multimodality Mineralogy Segmentation System and Method
- Publication number 20170200290
- Publication date Jul 13, 2017
- Carl Zeiss X-ray Microscopy Inc.
- Sreenivas Naga Bhattiprolu
- G01 - MEASURING TESTING
Information Patent Application
Segmentation and Spectrum Based Metal Artifact Reduction Method and...
- Publication number 20170109904
- Publication date Apr 20, 2017
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Zhifeng Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...
- Publication number 20170109882
- Publication date Apr 20, 2017
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Thomas A. Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-ray CT microscopy system and method utilizing lattice sampling
- Publication number 20160252467
- Publication date Sep 1, 2016
- CARL ZEISS X-RAY MICROSCOPY, INC.
- William Thompson
- G01 - MEASURING TESTING
Information Patent Application
Zone Plate and Method for Fabricating Same Using Conformal Coating
- Publication number 20160086681
- Publication date Mar 24, 2016
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Raymond Leung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...
- Publication number 20150323474
- Publication date Nov 12, 2015
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Thomas A. Case
- G01 - MEASURING TESTING
Information Patent Application
COMBINED CONFOCAL X-RAY FLUORESCENCE AND X-RAY COMPUTERISED TOMOGRA...
- Publication number 20150253263
- Publication date Sep 10, 2015
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Application
Phase Contrast Imaging Using Patterned Illumination/Detector and Ph...
- Publication number 20150055745
- Publication date Feb 26, 2015
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Christian Holzner
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
98740156 - NAVX
- Serial number 98740156
- Filing date Sep 9, 2024
- Carl Zeiss X-Ray Microscopy, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98654800 - VERSAXRM
- Serial number 98654800
- Filing date Jul 18, 2024
- Carl Zeiss X-Ray Microscopy, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90589691 - CRYSTALCT
- Serial number 90589691
- Registration number 6932431
- Filing date Mar 19, 2021
- Carl Zeiss X-Ray Microscopy, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88198267 - VERSA
- Serial number 88198267
- Registration number 6110506
- Filing date Nov 18, 2018
- Carl Zeiss X-Ray Microscopy, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88198269 - CONTEXT
- Serial number 88198269
- Registration number 5952999
- Filing date Nov 18, 2018
- Carl Zeiss X-Ray Microscopy, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88198263 - ULTRA
- Serial number 88198263
- Registration number 6156118
- Filing date Nov 18, 2018
- Carl Zeiss X-Ray Microscopy, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

CARL ZEISS X-RAY MICROSCOPY INC

Organization

Patents Grantslast 30 patents

Reflection target X-ray source with steered beam on target

Process parameter prediction using multivariant structural regression

High resolution light valve detector for detecting x-ray

Method and system for liquid cooling isolated x-ray transmission ta...

Accessible neural network image processing workflow

Fiber-optic communication for embedded electronics in x-ray generator

Method to acquire a 3D image of a sample structure

X-ray source with liquid cooled source coils

Optical three-dimensional scanning for collision avoidance in micro...

System and method for the proscriptive determination of parameters...

Detection system for X-ray inspection of an object

Fluid cooled reflective x-ray source

Edge phase effects removal using wavelet correction and particle cl...

System and method for the proscriptive determination of parameters...

X-ray CT microscopy system and method utilizing lattice sampling

Method and system for spectral characterization in computed tomogra...

X-ray CT microscopy system and method utilizing lattice sampling

Multi energy X-ray microscope data acquisition and image reconstruc...

Segmentation and spectrum based metal artifact reduction method and...

Multi energy X-ray microscope data acquisition and image reconstruc...

Multimodality mineralogy segmentation system and method

Combined confocal X-ray fluorescence and X-ray computerised tomogra...

Stacked zone plates for pitch frequency multiplication

Method for analyzing an object and charged particle beam device for...

Confocal XRF-CT system for mining analysis

Laboratory X-ray micro-tomography system with crystallographic grai...

X-ray diffraction method of mapping grain structures in a crystalli...

X-ray source with an immersion lens

Multi energy X-ray microscope data acquisition and image reconstruc...

Laboratory x-ray micro-tomography system with crystallographic grai...

Patents Applicationslast 30 patents

High Resolution Light Valve Detector for Detecting X-Ray

IMAGING OPTICAL ARRANGEMENT TO IMAGE AN OBJECT ILLUMINATED BY X-RAYS

Laboratory crystallographic x-ray diffraction analysis system

Reflection target X-ray source with steered beam on target

Spectrally and Spatially Resolved X-Ray and Particle Detection System

3D Particle Analysis and Separation Using Dual Seeding

Multi-fraction sample holder for 3D particle analysis

Method and system for analytical X-ray calibration, reconstruction...

Fluid cooled reflective x-ray source

METHOD TO ACQUIRE A 3D IMAGE OF A SAMPLE STRUCTURE

DETECTION SYSTEM FOR X-RAY INSPECTION OF AN OBJECT

Edge Phase Effects Removal Using Wavelet Correction and Particle Cl...

Method and system for liquid cooling isolated X-ray transmission ta...

X-ray source with liquid cooled source coils

Fiber-optic communication for embedded electronics in x-ray generator

System and Method for the Proscriptive Determination of Parameters...

High Resolution Light Valve Detector for Detecting X-Ray

Process parameter prediction using multivariant structural regression

Optical three-dimensional scanning for collision avoidance in micro...

X-ray CT microscopy system and method utilizing lattice sampling

System and Method for the Proscriptive Determination of Parameters...

METHOD AND SYSTEM FOR SPECTRAL CHARACTERIZATION IN COMPUTED TOMOGRA...

Multimodality Mineralogy Segmentation System and Method

Segmentation and Spectrum Based Metal Artifact Reduction Method and...

Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...

X-ray CT microscopy system and method utilizing lattice sampling

Zone Plate and Method for Fabricating Same Using Conformal Coating

Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...

COMBINED CONFOCAL X-RAY FLUORESCENCE AND X-RAY COMPUTERISED TOMOGRA...

Phase Contrast Imaging Using Patterned Illumination/Detector and Ph...

Trademarklast 30 trademarks

98740156 - NAVX

98654800 - VERSAXRM

90589691 - CRYSTALCT

88198267 - VERSA

88198269 - CONTEXT

88198263 - ULTRA