CHENG YUN TECHNOLOGY CO., LTD.

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New Taipei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit test device and integrated circuit test equipment
- Patent number 9,726,720
- Issue date Aug 8, 2017
- CHENG YUN TECHNOLOGY CO., LTD.
- Yun-Meng Yeh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT TEST DEVICE AND INTEGRATED CIRCUIT TEST EQUIPMENT
- Publication number 20170123002
- Publication date May 4, 2017
- CHENG YUN TECHNOLOGY CO., LTD.
- Yun-Meng YEH
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING PROBE NEEDLE
- Publication number 20140266277
- Publication date Sep 18, 2014
- CHENG YUN TECHNOLOGY CO., LTD.
- Yun-Meng YEH
- G01 - MEASURING TESTING
Information Patent Application
PROBE NEEDLE
- Publication number 20140266278
- Publication date Sep 18, 2014
- CHENG YUN TECHNOLOGY CO., LTD.
- Yun-Meng YEH
- G01 - MEASURING TESTING

Trademarklast 30 trademarks