CREDENCE SYSTEMS CORPORATION

Organization

FREMONT, CA, US

INSTRUMENTS FOR MEAS & TESTING OF ELECTRICITY & ELEC SIGNALS
Business Address
1421 CALIFORNIA CIRCLE MILPITAS CA 95035 408635-4300
Mailing Address
1421 CALIFORNIA CIRCLE MILPITAS CA 95035
State Location
CA
State of Incorporation
DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Multi-domain execution of tests on electronic devices
- Patent number 8,649,993
- Issue date Feb 11, 2014
- Credence Systems Corporation
- Lionel Gilet
- G01 - MEASURING TESTING
Information Patent Grant
High resolution clock signal generator
- Patent number 8,504,867
- Issue date Aug 6, 2013
- Credence Systems Corporation
- Eric B Kushnick
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Routed event test system and method
- Patent number 8,295,182
- Issue date Oct 23, 2012
- Credence Systems Corporation
- James Jula
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for correcting timing errors in high data rate au...
- Patent number 7,810,005
- Issue date Oct 5, 2010
- Credence Systems Corporation
- Jean-Yann Gazounaud
- G01 - MEASURING TESTING
Information Patent Grant
High resolution clock signal generator
- Patent number 7,805,628
- Issue date Sep 28, 2010
- Credence Systems Corporation
- Eric B. Kushnick
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test systems and methods for integrated circuit devices
- Patent number 7,765,443
- Issue date Jul 27, 2010
- Credence Systems Corporation
- Ahmed Rashid Syed
- G01 - MEASURING TESTING
Information Patent Grant
Test and diagnosis of semiconductors
- Patent number 7,761,751
- Issue date Jul 20, 2010
- Credence Systems Corporation
- Burnell G. West
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for jitter testing an IC
- Patent number 7,627,790
- Issue date Dec 1, 2009
- Credence Systems Corporation
- Arnold M. Frisch
- G01 - MEASURING TESTING
Information Patent Grant
Loadboard enhancements for automated test equipment
- Patent number 7,615,990
- Issue date Nov 10, 2009
- Credence Systems Corporation
- Masashi Shimanouchi
- G01 - MEASURING TESTING
Information Patent Grant
LRL vector calibration to the end of the probe needles for non-stan...
- Patent number 7,532,014
- Issue date May 12, 2009
- Credence Systems Corporation
- Steffen Chladek
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment operating architecture
- Patent number 7,496,467
- Issue date Feb 24, 2009
- Credence Systems Corporation
- William A. Fritzsche
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for enabling the measurement of device under test...
- Patent number 7,492,181
- Issue date Feb 17, 2009
- Credence Systems Corporation
- Laurence Crosby
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the improvement of material/voltage contrast
- Patent number 7,488,937
- Issue date Feb 10, 2009
- Credence Systems Corp.
- Erwan Le Roy
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit tester with interchangeable tester...
- Patent number 7,471,100
- Issue date Dec 30, 2008
- Credence Systems Corporation
- Wayne H. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Serializer clock synthesizer
- Patent number 7,471,753
- Issue date Dec 30, 2008
- Credence Systems Corporation
- Samuel Walker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan stream sequencing for testing integrated circuits
- Patent number 7,454,678
- Issue date Nov 18, 2008
- Credence Systems Corporation
- Jamie S. Cullen
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for test socket calibration using composite waveform
- Patent number 7,439,728
- Issue date Oct 21, 2008
- Credence Systems Corporation
- Robert L. Hickling
- G01 - MEASURING TESTING
Information Patent Grant
D-optimized switching converter
- Patent number 7,430,130
- Issue date Sep 30, 2008
- Credence Systems Corporation
- William Devey
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Clock based voltage deviation detector
- Patent number 7,414,438
- Issue date Aug 19, 2008
- Credence Systems Corporation
- Thomas Nulsen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System for measuring characteristics of a digital signal
- Patent number 7,409,617
- Issue date Aug 5, 2008
- Credence Systems Corporation
- Thomas Arthur Almy
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,400,154
- Issue date Jul 15, 2008
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Edge selecting triggering circuit
- Patent number 7,389,449
- Issue date Jun 17, 2008
- Credence Systems Corporation
- Thomas Arthur Almy
- G01 - MEASURING TESTING
Information Patent Grant
High speed, out-of-band differential pin driver
- Patent number 7,372,302
- Issue date May 13, 2008
- Credence Systems Corporation
- Atsushi Ohshima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit testing with ring-connected test instrument modules
- Patent number 7,370,255
- Issue date May 6, 2008
- Credence Systems Corporation
- Michael F. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining coherent test conditions
- Patent number 7,353,126
- Issue date Apr 1, 2008
- Credence Systems Corporation
- Chris Oberhauser
- G01 - MEASURING TESTING
Information Patent Grant
Programmable multi-function module for automatic test equipment sys...
- Patent number 7,343,538
- Issue date Mar 11, 2008
- Credence Systems Corporation
- Paolo Dalla Ricca
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Reduced pin count test method and apparatus
- Patent number 7,336,066
- Issue date Feb 26, 2008
- Credence Systems Corporation
- Burnell G. West
- G01 - MEASURING TESTING
Information Patent Grant
Light beam apparatus and method for orthogonal alignment of specimen
- Patent number 7,327,452
- Issue date Feb 5, 2008
- Credence Systems Corporation
- Jonathan Frank
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,323,862
- Issue date Jan 29, 2008
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Method for local wafer thinning and reinforcement
- Patent number 7,314,767
- Issue date Jan 1, 2008
- Credence Systems Corporation
- Richard A. Portune
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
HIGH RESOLUTION CLOCK SIGNAL GENERATOR
- Publication number 20110234271
- Publication date Sep 29, 2011
- Credence Systems Corporation
- Eric B. Kushnick
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AUTOMATED TEST SYSTEM AND METHOD
- Publication number 20100023294
- Publication date Jan 28, 2010
- Credence Systems Corporation
- Yung Daniel Fan
- G01 - MEASURING TESTING
Information Patent Application
ROUTED EVENT TEST SYSTEM AND METHOD
- Publication number 20090076761
- Publication date Mar 19, 2009
- Credence Systems Corporation
- James Jula
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR RESOLVING PHOTOEMISSION FROM SEMICONDUCTOR DE...
- Publication number 20080174770
- Publication date Jul 24, 2008
- Credence Systems Corporation
- Neeraj KHURANA
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS OF PERFORMING DEVICE FAILURE ANALYSIS, ELECTRIC...
- Publication number 20080142711
- Publication date Jun 19, 2008
- CREDENCE SYSTEMS CORPORATION
- Theodore R. Lundquist
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FORMING A CONTACT TO SILICIDE AND A CONTACT TO...
- Publication number 20080090403
- Publication date Apr 17, 2008
- Credence Systems Corporation
- Rudolf Schlangen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for identifying events in FIB
- Publication number 20080073580
- Publication date Mar 27, 2008
- Credence Systems Corporation
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT TESTER WITH INTERCHANGEABLE TESTER...
- Publication number 20080061813
- Publication date Mar 13, 2008
- Credence Systems Corporation
- Wayne H. Miller
- G01 - MEASURING TESTING
Information Patent Application
LRL VECTOR CALIBRATION TO THE END OF THE PROBE NEEDLES FOR NON-STAN...
- Publication number 20080036469
- Publication date Feb 14, 2008
- Credence Systems Corporation
- Steffen Chladek
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INTEGRATED CIRCUIT DESIGN FOR CIRCUIT EDIT
- Publication number 20080028345
- Publication date Jan 31, 2008
- Credence Systems Corporation
- Hitesh Suri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for thermal management and gradient reduction
- Publication number 20070290702
- Publication date Dec 20, 2007
- Credence Systems Corporation
- Birk Lee
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR OPTICAL INTERFERENCE FRINGE BASED INTEGRAT...
- Publication number 20070293052
- Publication date Dec 20, 2007
- Credence Systems Corporation
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lens housing with integrated thermal management
- Publication number 20070291361
- Publication date Dec 20, 2007
- Credence Systems Corporation
- Birk Lee
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR VOLTAGE NOISE AND JITTER MEASUREMENT USING TI...
- Publication number 20070236206
- Publication date Oct 11, 2007
- Credence Systems Corporation
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
Message system for logical synchronization of multiple tester chips
- Publication number 20070220380
- Publication date Sep 20, 2007
- CREDENCE SYSTEMS CORPORATION
- Mamikon Ohanyan
- G01 - MEASURING TESTING
Information Patent Application
TIME RESOLVED NON-INVASIVE DIAGNOSTICS SYSTEM
- Publication number 20070206846
- Publication date Sep 6, 2007
- Credence Systems Corporation
- Daniel Murdoch COTTON
- G01 - MEASURING TESTING
Information Patent Application
BI-CONVEX SOLID IMMERSION LENS
- Publication number 20070205795
- Publication date Sep 6, 2007
- Credence Systems Corporation
- Nader PAKDAMAN
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING PROBING LOCATIONS ON IC
- Publication number 20070179736
- Publication date Aug 2, 2007
- Credence Systems Corporation
- Hitesh Suri
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING PROBING LOCATIONS ON IC
- Publication number 20070179731
- Publication date Aug 2, 2007
- Credence Systems Corporation
- Hitesh Suri
- G01 - MEASURING TESTING
Information Patent Application
Method for in-line testing of semiconductor wafers
- Publication number 20070111340
- Publication date May 17, 2007
- Credence Systems Corporation
- Itzik Goldberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser probing system for integrated circuits
- Publication number 20070046947
- Publication date Mar 1, 2007
- Credence Systems Corporation
- William Lo
- G01 - MEASURING TESTING
Information Patent Application
System and method for modulation mapping
- Publication number 20070046301
- Publication date Mar 1, 2007
- Credence Systems Corporation
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
Generic software interface architecture
- Publication number 20070011690
- Publication date Jan 11, 2007
- CREDENCE SYSTEMS CORPORATION
- Lionel Gilet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for measuring high-bandwidth electrical signal...
- Publication number 20070002328
- Publication date Jan 4, 2007
- Credence Systems Corporation
- Gary Woods
- G01 - MEASURING TESTING
Information Patent Application
Method for local wafer thinning and reinforcement
- Publication number 20060267009
- Publication date Nov 30, 2006
- CREDENCE SYSTEMS CORPORATION
- Richard A. Portune
- G01 - MEASURING TESTING
Information Patent Application
Collection optics integrating an objective and a SIL
- Publication number 20060261829
- Publication date Nov 23, 2006
- Credence Systems Corporation
- John Hanson
- G02 - OPTICS
Information Patent Application
Apparatus and method for circuit operation definition
- Publication number 20060261043
- Publication date Nov 23, 2006
- Credence Systems Corporation
- Martin Betz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Bit synchronization for high-speed serial device testing
- Publication number 20060245291
- Publication date Nov 2, 2006
- CREDENCE SYSTEMS CORPORATION
- Kris Sakaitani
- G11 - INFORMATION STORAGE
Information Patent Application
GUI-based API for test systems
- Publication number 20060236327
- Publication date Oct 19, 2006
- CREDENCE SYSTEMS CORPORATION
- Ziyang Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS
- Publication number 20060219949
- Publication date Oct 5, 2006
- Credence Systems Corporation
- Vladimir V. Makarov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

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Trademarklast 30 trademarks

Information Trademark
78451356 - SAPPHIRE
- Serial number 78451356
- Registration number 3245357
- Filing date Jul 15, 2004
- Credence Systems Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78337248 - VISUAL STIL
- Serial number 78337248
- Filing date Dec 5, 2003
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78324859 - IDS OPTICA
- Serial number 78324859
- Registration number 2913110
- Filing date Nov 7, 2003
- NPtest, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78257198 - XTOS
- Serial number 78257198
- Registration number 2936978
- Filing date Jun 2, 2003
- NPtest, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78244117 - SAPPHIRE NP
- Serial number 78244117
- Filing date Apr 30, 2003
- NPtest, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78175606 - ISOCHRONOUS FABRIC INTERFACE
- Serial number 78175606
- Registration number 2936802
- Filing date Oct 17, 2002
- NP Test, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75757698 - VCOBOST
- Serial number 75757698
- Registration number 2520822
- Filing date Jul 22, 1999
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75757694 - PLLBOST
- Serial number 75757694
- Registration number 2507749
- Filing date Jul 22, 1999
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75693594 - RAMBOST
- Serial number 75693594
- Filing date Apr 29, 1999
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75590380 - MEMBIST
- Serial number 75590380
- Registration number 2429169
- Filing date Nov 17, 1998
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75590381 - BTMA
- Serial number 75590381
- Filing date Nov 17, 1998
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75587811 - MEMBOST
- Serial number 75587811
- Registration number 2472003
- Filing date Nov 13, 1998
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75587818 - TRITON
- Serial number 75587818
- Registration number 2311361
- Filing date Nov 13, 1998
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75587814 - MEMBIRA
- Serial number 75587814
- Filing date Nov 13, 1998
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75587812 - BOST
- Serial number 75587812
- Filing date Nov 13, 1998
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75587813 - MEMBISR
- Serial number 75587813
- Filing date Nov 13, 1998
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75562071 - MEMTVG
- Serial number 75562071
- Filing date Sep 30, 1998
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75562072 - FIRE PIN
- Serial number 75562072
- Registration number 2331443
- Filing date Sep 30, 1998
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75403118 - KALOS
- Serial number 75403118
- Registration number 2354157
- Filing date Dec 9, 1997
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75403110 - KITE
- Serial number 75403110
- Registration number 2393878
- Filing date Dec 9, 1997
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75306193 - VALSTAR
- Serial number 75306193
- Registration number 2430191
- Filing date Jun 10, 1997
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75250530 - CREDENCE
- Serial number 75250530
- Registration number 2152177
- Filing date Mar 3, 1997
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75059451 - CONCURRENT ALGORITHMIC TEST NETWORK
- Serial number 75059451
- Filing date Feb 20, 1996
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75059758 - CATNET
- Serial number 75059758
- Filing date Feb 20, 1996
- CREDENCE SYSTEMS CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

CREDENCE SYSTEMS CORPORATION

Organization

Business Address

Mailing Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Multi-domain execution of tests on electronic devices

High resolution clock signal generator

Routed event test system and method

Method and system for correcting timing errors in high data rate au...

High resolution clock signal generator

Test systems and methods for integrated circuit devices

Test and diagnosis of semiconductors

Apparatus for jitter testing an IC

Loadboard enhancements for automated test equipment

LRL vector calibration to the end of the probe needles for non-stan...

Automatic test equipment operating architecture

Method and device for enabling the measurement of device under test...

Method and apparatus for the improvement of material/voltage contrast

Semiconductor integrated circuit tester with interchangeable tester...

Serializer clock synthesizer

Scan stream sequencing for testing integrated circuits

System and method for test socket calibration using composite waveform

D-optimized switching converter

Clock based voltage deviation detector

System for measuring characteristics of a digital signal

Apparatus and method for detecting photon emissions from transistors

Edge selecting triggering circuit

High speed, out-of-band differential pin driver

Circuit testing with ring-connected test instrument modules

Method of determining coherent test conditions

Programmable multi-function module for automatic test equipment sys...

Reduced pin count test method and apparatus

Light beam apparatus and method for orthogonal alignment of specimen

Apparatus and method for detecting photon emissions from transistors

Method for local wafer thinning and reinforcement

Patents Applicationslast 30 patents

HIGH RESOLUTION CLOCK SIGNAL GENERATOR

AUTOMATED TEST SYSTEM AND METHOD

ROUTED EVENT TEST SYSTEM AND METHOD

SYSTEM AND METHOD FOR RESOLVING PHOTOEMISSION FROM SEMICONDUCTOR DE...

METHODS AND SYSTEMS OF PERFORMING DEVICE FAILURE ANALYSIS, ELECTRIC...

APPARATUS AND METHOD FORMING A CONTACT TO SILICIDE AND A CONTACT TO...

Method and system for identifying events in FIB

SEMICONDUCTOR INTEGRATED CIRCUIT TESTER WITH INTERCHANGEABLE TESTER...

LRL VECTOR CALIBRATION TO THE END OF THE PROBE NEEDLES FOR NON-STAN...

APPARATUS AND METHOD FOR INTEGRATED CIRCUIT DESIGN FOR CIRCUIT EDIT

System and method for thermal management and gradient reduction

APPARATUS AND METHOD FOR OPTICAL INTERFERENCE FRINGE BASED INTEGRAT...

Lens housing with integrated thermal management

SYSTEM AND METHOD FOR VOLTAGE NOISE AND JITTER MEASUREMENT USING TI...

Message system for logical synchronization of multiple tester chips

TIME RESOLVED NON-INVASIVE DIAGNOSTICS SYSTEM

BI-CONVEX SOLID IMMERSION LENS

SYSTEM AND METHOD FOR DETERMINING PROBING LOCATIONS ON IC

SYSTEM AND METHOD FOR DETERMINING PROBING LOCATIONS ON IC

Method for in-line testing of semiconductor wafers

Laser probing system for integrated circuits

System and method for modulation mapping

Generic software interface architecture

Method and apparatus for measuring high-bandwidth electrical signal...

Method for local wafer thinning and reinforcement

Collection optics integrating an objective and a SIL

Apparatus and method for circuit operation definition

Bit synchronization for high-speed serial device testing

GUI-based API for test systems

FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS

Trademarklast 30 trademarks

78451356 - SAPPHIRE

78337248 - VISUAL STIL

78324859 - IDS OPTICA

78257198 - XTOS

78244117 - SAPPHIRE NP

78175606 - ISOCHRONOUS FABRIC INTERFACE

75757698 - VCOBOST

75757694 - PLLBOST

75693594 - RAMBOST

75590380 - MEMBIST

75590381 - BTMA