DFT Microsystems, Inc.

Organization

Burlington, MA, US

Business Address
1312 HELLER DRIVE YARDLEY PA 19067 6106404216
State Location
PA
State of Incorporation

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
High-speed transceiver tester incorporating jitter injection
- Patent number 8,327,204
- Issue date Dec 4, 2012
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods of parametric testing in digital circuits
- Patent number 8,244,492
- Issue date Aug 14, 2012
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for testing and diagnosing delay faults and for...
- Patent number 7,917,319
- Issue date Mar 29, 2011
- DFT Microsystems Inc.
- Mohamed M. Hafed
- G01 - MEASURING TESTING
Information Patent Grant
High-speed signal testing system having oscilloscope functionality
- Patent number 7,813,297
- Issue date Oct 12, 2010
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- G01 - MEASURING TESTING
Information Patent Grant
Signal integrity measurement systems and methods using a predominan...
- Patent number 7,681,091
- Issue date Mar 16, 2010
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating a jittered test signal
- Patent number 7,315,574
- Issue date Jan 1, 2008
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for testing integrated circuits
- Patent number 7,242,209
- Issue date Jul 10, 2007
- DFT Microsystems, Inc.
- Gordon W. Roberts
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods of Parametric Testing in Digital Circuits
- Publication number 20110161755
- Publication date Jun 30, 2011
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- G01 - MEASURING TESTING
Information Patent Application
Signal Integrity Measurement Systems and Methods Using a Predominan...
- Publication number 20100138695
- Publication date Jun 3, 2010
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Testing and Diagnosing Delay Faults and For...
- Publication number 20090198461
- Publication date Aug 6, 2009
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Physical-Layer Testing of High-Speed Serial L...
- Publication number 20080192814
- Publication date Aug 14, 2008
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

DFT Microsystems, Inc.

Organization

Business Address

State Location

State of Incorporation

Patents Grantslast 30 patents

High-speed transceiver tester incorporating jitter injection

Methods of parametric testing in digital circuits

Systems and methods for testing and diagnosing delay faults and for...

High-speed signal testing system having oscilloscope functionality

Signal integrity measurement systems and methods using a predominan...

System and method for generating a jittered test signal

System and method for testing integrated circuits

Patents Applicationslast 30 patents

Methods of Parametric Testing in Digital Circuits

Signal Integrity Measurement Systems and Methods Using a Predominan...

Systems and Methods for Testing and Diagnosing Delay Faults and For...

System and Method for Physical-Layer Testing of High-Speed Serial L...

Trademarklast 30 trademarks