Erwin Sick GmbH

Organization

Waldkirch, DE

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Monitoring apparatus in machines
- Patent number 5,486,691
- Issue date Jan 23, 1996
- Erwin Sick GmbH Optik-Eletronik
- Gerhard Dieterle
- G02 - OPTICS
Information Patent Grant
Optical sensor arrangement for presence detection with variable pul...
- Patent number 5,416,316
- Issue date May 16, 1995
- Erwin Sick GmbH Optik-Electronik
- Otmar Kappeler
- G01 - MEASURING TESTING
Information Patent Grant
Mirror collimator having a large aperture ratio
- Patent number 5,298,736
- Issue date Mar 29, 1994
- Erwin Sick GmbH
- Hubertus Dreher
- G02 - OPTICS
Information Patent Grant
Light curtain apparatus
- Patent number 4,875,761
- Issue date Oct 24, 1989
- Erwin Sick GmbH Optik-Electronik
- Gunter Fetzer
- G01 - MEASURING TESTING
Information Patent Grant
Scanner for the optical scanning of objects
- Patent number 4,848,864
- Issue date Jul 18, 1989
- Erwin Sick GmbH Optik-Electronik
- Klaus Ostertag
- G02 - OPTICS
Information Patent Grant
Resilient sectional strip for mounting to a closure edge
- Patent number 4,684,768
- Issue date Aug 4, 1987
- Erwin Sick GmbH Optik-Electronik
- Karl H. Sackmann
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Grant
Rotatable mirror arrangement for generating a scanning beam which i...
- Patent number 4,632,500
- Issue date Dec 30, 1986
- Erwin Sick GmbH
- Gunter Fetzer
- G02 - OPTICS
Information Patent Grant
Optical fault seeking apparatus
- Patent number 4,357,071
- Issue date Nov 2, 1982
- Erwin Sick GmbH, Optik-Elektronic
- Siegfried Mankel
- D06 - TREATMENT OF TEXTILES OR THE LIKE LAUNDERING FLEXIBLE MATERIALS NOT OTH...
Information Patent Grant
Change of distance measuring apparatus
- Patent number 4,336,997
- Issue date Jun 29, 1982
- Erwin Sick GmbH Optik-Electronik
- Dieter Ross
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for monitoring for faults in translucent strip material
- Patent number 4,310,250
- Issue date Jan 12, 1982
- Erwin Sick GmbH
- Erwin Sick
- G01 - MEASURING TESTING
Information Patent Grant
Light beam switch housing structure
- Patent number 4,021,665
- Issue date May 3, 1977
- Erwin Sick GmbH Optik-Electronik
- Klaus Dieter Haas
- H03 - BASIC ELECTRONIC CIRCUITRY

Erwin Sick GmbH

Organization

Patents Grantslast 30 patents

Monitoring apparatus in machines

Optical sensor arrangement for presence detection with variable pul...

Mirror collimator having a large aperture ratio

Light curtain apparatus

Scanner for the optical scanning of objects

Resilient sectional strip for mounting to a closure edge

Rotatable mirror arrangement for generating a scanning beam which i...

Optical fault seeking apparatus

Change of distance measuring apparatus

Apparatus for monitoring for faults in translucent strip material

Light beam switch housing structure

Patents Applicationslast 30 patents

Trademarklast 30 trademarks