Erwin Sick GmbH

Organization

Waldkirch, DE

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Monitoring apparatus in machines
- Patent number 5,486,691
- Issue date Jan 23, 1996
- Erwin Sick GmbH Optik-Eletronik
- Gerhard Dieterle
- G02 - OPTICS
Information Patent Grant
Optical sensor arrangement for presence detection with variable pul...
- Patent number 5,416,316
- Issue date May 16, 1995
- Erwin Sick GmbH Optik-Electronik
- Otmar Kappeler
- G01 - MEASURING TESTING
Information Patent Grant
Mirror collimator having a large aperture ratio
- Patent number 5,298,736
- Issue date Mar 29, 1994
- Erwin Sick GmbH
- Hubertus Dreher
- G02 - OPTICS
Information Patent Grant
Light curtain apparatus
- Patent number 4,875,761
- Issue date Oct 24, 1989
- Erwin Sick GmbH Optik-Electronik
- Gunter Fetzer
- G01 - MEASURING TESTING
Information Patent Grant
Scanner for the optical scanning of objects
- Patent number 4,848,864
- Issue date Jul 18, 1989
- Erwin Sick GmbH Optik-Electronik
- Klaus Ostertag
- G02 - OPTICS
Information Patent Grant
Resilient sectional strip for mounting to a closure edge
- Patent number 4,684,768
- Issue date Aug 4, 1987
- Erwin Sick GmbH Optik-Electronik
- Karl H. Sackmann
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Grant
Rotatable mirror arrangement for generating a scanning beam which i...
- Patent number 4,632,500
- Issue date Dec 30, 1986
- Erwin Sick GmbH
- Gunter Fetzer
- G02 - OPTICS
Information Patent Grant
Optical fault seeking apparatus
- Patent number 4,357,071
- Issue date Nov 2, 1982
- Erwin Sick GmbH, Optik-Elektronic
- Siegfried Mankel
- D06 - TREATMENT OF TEXTILES OR THE LIKE LAUNDERING FLEXIBLE MATERIALS NOT OTH...
Information Patent Grant
Change of distance measuring apparatus
- Patent number 4,336,997
- Issue date Jun 29, 1982
- Erwin Sick GmbH Optik-Electronik
- Dieter Ross
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for monitoring for faults in translucent strip material
- Patent number 4,310,250
- Issue date Jan 12, 1982
- Erwin Sick GmbH
- Erwin Sick
- G01 - MEASURING TESTING
Information Patent Grant
Light beam switch housing structure
- Patent number 4,021,665
- Issue date May 3, 1977
- Erwin Sick GmbH Optik-Electronik
- Klaus Dieter Haas
- H03 - BASIC ELECTRONIC CIRCUITRY

Erwin Sick GmbH

Organization

Patents Grantslast 30 patents

Monitoring apparatus in machines

Optical sensor arrangement for presence detection with variable pul...

Mirror collimator having a large aperture ratio

Light curtain apparatus

Scanner for the optical scanning of objects

Resilient sectional strip for mounting to a closure edge

Rotatable mirror arrangement for generating a scanning beam which i...

Optical fault seeking apparatus

Change of distance measuring apparatus

Apparatus for monitoring for faults in translucent strip material

Light beam switch housing structure