GENED CO., LTD.

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Cheonan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Probe pin
- Patent number 11,630,128
- Issue date Apr 18, 2023
- GENED CO., LTD.
- Byung Sung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe pin
- Patent number D983056
- Issue date Apr 11, 2023
- GENED CO., LTD.
- Byung Sung Lee
- D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

Information Patent Application
PROBE PIN
- Publication number 20220317156
- Publication date Oct 6, 2022
- GENED CO., LTD.
- Byung Sung LEE
- G01 - MEASURING TESTING
Information Patent Application
REPLACEABLE SINGLE-TYPE PROBE PIN
- Publication number 20200393494
- Publication date Dec 17, 2020
- GENED CO., LTD.
- Jung Hyun SHIN
- G01 - MEASURING TESTING
Information Patent Application
REPLACEABLE DOUBLE-TYPE PROBE PIN
- Publication number 20200393495
- Publication date Dec 17, 2020
- GENED CO.,LTD.
- Jung Hyun SHIN
- G01 - MEASURING TESTING

Trademarklast 30 trademarks