GENED CO., LTD.

Organization

  • Cheonan-si, KR

Patents Grantslast 30 patents

  • Information Patent Grant

    Probe pin

    • Patent number 11,630,128
    • Issue date Apr 18, 2023
    • GENED CO., LTD.
    • Byung Sung Lee
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe pin

    • Patent number D983056
    • Issue date Apr 11, 2023
    • GENED CO., LTD.
    • Byung Sung Lee
    • D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE PIN

    • Publication number 20220317156
    • Publication date Oct 6, 2022
    • GENED CO., LTD.
    • Byung Sung LEE
    • G01 - MEASURING TESTING
  • Information Patent Application

    REPLACEABLE SINGLE-TYPE PROBE PIN

    • Publication number 20200393494
    • Publication date Dec 17, 2020
    • GENED CO., LTD.
    • Jung Hyun SHIN
    • G01 - MEASURING TESTING
  • Information Patent Application

    REPLACEABLE DOUBLE-TYPE PROBE PIN

    • Publication number 20200393495
    • Publication date Dec 17, 2020
    • GENED CO.,LTD.
    • Jung Hyun SHIN
    • G01 - MEASURING TESTING