General Scanning, Inc.

Organization

Simi Valley, CA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,452,686
- Issue date Sep 17, 2002
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,249,347
- Issue date Jun 19, 2001
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,181,425
- Issue date Jan 30, 2001
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,177,998
- Issue date Jan 23, 2001
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for suppressing unwanted reflections in an optica...
- Patent number 6,028,671
- Issue date Feb 22, 2000
- General Scanning, Inc.
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for high-speed, high-resolution, 3-D imaging of a...
- Patent number RE36560
- Issue date Feb 8, 2000
- General Scanning, Inc.
- Donald J. Svetkoff
- 356 - Optics: measuring and testing
Information Patent Grant
Scanned remote imaging method and system and method of determining...
- Patent number 5,822,486
- Issue date Oct 13, 1998
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for triangulation-based, 3-D imaging utilizing an...
- Patent number 5,815,275
- Issue date Sep 29, 1998
- General Scanning, Inc.
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Grant
Grid array inspection system and method
- Patent number 5,812,268
- Issue date Sep 22, 1998
- General Scanning Inc.
- Robert Lea Jackson
- G01 - MEASURING TESTING
Information Patent Grant
Triangulation-based 3-D imaging and processing method and system
- Patent number 5,812,269
- Issue date Sep 22, 1998
- General Scanning, Inc.
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Grant
Scanned remote imaging method and system and method of determining...
- Patent number 5,768,461
- Issue date Jun 16, 1998
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Triangulation-based 3D imaging and processing method and system
- Patent number 5,654,800
- Issue date Aug 5, 1997
- General Scanning Inc,
- Donald J. Svetkoff
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for high speed measuring of microscopic targets
- Publication number 20030184764
- Publication date Oct 2, 2003
- General Scanning, Inc.
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR HIGH SPEED MEASURING OF MICROSCOPIC TARGETS
- Publication number 20020105655
- Publication date Aug 8, 2002
- General Scanning, Inc.
- Donald J. Svetkoff
- G01 - MEASURING TESTING

General Scanning, Inc.

Organization

Patents Grantslast 30 patents

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

Method and system for suppressing unwanted reflections in an optica...

Method and system for high-speed, high-resolution, 3-D imaging of a...

Scanned remote imaging method and system and method of determining...

Method and system for triangulation-based, 3-D imaging utilizing an...

Grid array inspection system and method

Triangulation-based 3-D imaging and processing method and system

Scanned remote imaging method and system and method of determining...

Triangulation-based 3D imaging and processing method and system

Patents Applicationslast 30 patents

Method and system for high speed measuring of microscopic targets

METHOD AND SYSTEM FOR HIGH SPEED MEASURING OF MICROSCOPIC TARGETS

Trademarklast 30 trademarks