HEETRONIX CORP

Organization

RENO, NV, US

Business Address
725 TRADEMARK DRIVE # 104 RENO NV 89511 7758526569
State Location
NV
State of Incorporation

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Stable high temperature heater with serpentine heating strands on i...
- Patent number 7,224,256
- Issue date May 29, 2007
- Heetronix
- James D. Parsons
- G01 - MEASURING TESTING
Information Patent Grant
Encapsulation with oxide bond to borosilicate mixture
- Patent number 7,190,250
- Issue date Mar 13, 2007
- Heetronix
- James D. Parsons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Acoustic absorption radiation sensing in SiC
- Patent number 7,176,461
- Issue date Feb 13, 2007
- Heetronix
- James D. Parsons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stable high temperature sensor system with tungsten on AlN
- Patent number 7,106,167
- Issue date Sep 12, 2006
- Heetronix
- James D. Parsons
- G01 - MEASURING TESTING
Information Patent Grant
Mass flow meter with symmetrical sensors
- Patent number 7,021,136
- Issue date Apr 4, 2006
- Heetronix
- Craig A. Vincze
- G01 - MEASURING TESTING
Information Patent Grant
Bonded structure using reacted borosilicate mixture
- Patent number 6,995,691
- Issue date Feb 7, 2006
- Heetronix
- James D. Parsons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High temperature circuit structures with thin film layer
- Patent number 6,989,574
- Issue date Jan 24, 2006
- Heetronix
- James D. Parsons
- G01 - MEASURING TESTING
Information Patent Grant
Mass flow meter with chip-type sensors
- Patent number 6,883,370
- Issue date Apr 26, 2005
- Heetronix
- Craig A. Vincze
- G01 - MEASURING TESTING
Information Patent Grant
Circuit structure with W, WC and/or W2C layer on AlN substrate
- Patent number 6,765,278
- Issue date Jul 20, 2004
- Heetronix
- James D. Parsons
- G01 - MEASURING TESTING
Information Patent Grant
Acoustic absorption electromagnetic radiation sensing with SIC
- Patent number 6,713,762
- Issue date Mar 30, 2004
- Heetronix
- James D. Parsons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature sensing system with matched temperature coefficients of...
- Patent number 6,649,994
- Issue date Nov 18, 2003
- Heetronix
- James D. Parsons
- G01 - MEASURING TESTING
Information Patent Grant
High temperature circuit structures with expansion matched SiC, AlN...
- Patent number 6,576,972
- Issue date Jun 10, 2003
- Heetronix
- James D. Parsons
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POWER AND ENERGY METER FOR MEASURING ELECTROMAGNETIC RADIATION
- Publication number 20100219341
- Publication date Sep 2, 2010
- HEETRONIX
- JAMES D. PARSONS
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLIES AND METHODS FOR HOUSING AND PROVIDING ELECTRICAL C...
- Publication number 20090066353
- Publication date Mar 12, 2009
- HEETRONIX
- Andrew D. Devey
- G01 - MEASURING TESTING
Information Patent Application
THIN-FILM ALUMINUM NITRIDE ENCAPSULANT FOR METALLIC STRUCTURES ON I...
- Publication number 20080265444
- Publication date Oct 30, 2008
- HEETRONIX
- James D. Parsons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stable high temperature heater system with tungsten heating layer
- Publication number 20060267724
- Publication date Nov 30, 2006
- HEETRONIX
- James D. Parsons
- G01 - MEASURING TESTING
Information Patent Application
Thermal attach and detach methods and system for surface-mounted co...
- Publication number 20060131360
- Publication date Jun 22, 2006
- HEETRONIX CORP.
- Thomas W. Durston
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Stable high temperature with serpentine heating strands on insulati...
- Publication number 20060082433
- Publication date Apr 20, 2006
- HEETRONIX
- James D. Parsons
- G01 - MEASURING TESTING
Information Patent Application
Mass flow meter with chip-type sensors
- Publication number 20050087011
- Publication date Apr 28, 2005
- HEETRONIX
- Craig A. Vincze
- G01 - MEASURING TESTING
Information Patent Application
High temperature circuit structures with thin film layer
- Publication number 20040169249
- Publication date Sep 2, 2004
- HEETRONIX
- James D. Parsons
- G01 - MEASURING TESTING
Information Patent Application
Stable high temperature sensor system with tungsten on AlN
- Publication number 20040056321
- Publication date Mar 25, 2004
- HEETRONIX
- James D. Parsons
- G01 - MEASURING TESTING
Information Patent Application
Acoustic absorption radiation sensing in SiC
- Publication number 20040051042
- Publication date Mar 18, 2004
- HEETRONIX
- James D. Parsons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass flow meter with chip-type sensors
- Publication number 20040035201
- Publication date Feb 26, 2004
- HEETRONIX
- Craig A. Vincze
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
76363294 - HEETRONIX
- Serial number 76363294
- Registration number 3531357
- Filing date Jan 28, 2002
- Heetronix
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

HEETRONIX CORP

Organization

Business Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Stable high temperature heater with serpentine heating strands on i...

Encapsulation with oxide bond to borosilicate mixture

Acoustic absorption radiation sensing in SiC

Stable high temperature sensor system with tungsten on AlN

Mass flow meter with symmetrical sensors

Bonded structure using reacted borosilicate mixture

High temperature circuit structures with thin film layer

Mass flow meter with chip-type sensors

Circuit structure with W, WC and/or W2C layer on AlN substrate

Acoustic absorption electromagnetic radiation sensing with SIC

Temperature sensing system with matched temperature coefficients of...

High temperature circuit structures with expansion matched SiC, AlN...

Patents Applicationslast 30 patents

POWER AND ENERGY METER FOR MEASURING ELECTROMAGNETIC RADIATION

PROBE ASSEMBLIES AND METHODS FOR HOUSING AND PROVIDING ELECTRICAL C...

THIN-FILM ALUMINUM NITRIDE ENCAPSULANT FOR METALLIC STRUCTURES ON I...

Stable high temperature heater system with tungsten heating layer

Thermal attach and detach methods and system for surface-mounted co...

Stable high temperature with serpentine heating strands on insulati...

Mass flow meter with chip-type sensors

High temperature circuit structures with thin film layer

Stable high temperature sensor system with tungsten on AlN

Acoustic absorption radiation sensing in SiC

Mass flow meter with chip-type sensors

Trademarklast 30 trademarks

76363294 - HEETRONIX