HERMES TESTING SOLUTIONS INC.

Organization

Hsinchu City, TW

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Testing substrate and manufacturing method thereof and probe card
- Patent number 12,108,543
- Issue date Oct 1, 2024
- Hermes Testing Solutions Inc.
- Chiao-Pei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Probing system for discrete wafer
- Patent number 11,703,524
- Issue date Jul 18, 2023
- Hermes Testing Solutions Inc.
- Wen-Yuan Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Injection device, semiconductor testing system and its testing method
- Patent number 11,656,275
- Issue date May 23, 2023
- Hermes Testing Solutions Inc.
- Bo-Lung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Injection device, semiconductor testing system and its testing method
- Patent number 11,567,125
- Issue date Jan 31, 2023
- Hermes Testing Solutions Inc.
- Bo-Lung Chen
- G01 - MEASURING TESTING
Information Patent Grant
CMOS image sensor test probe card
- Patent number 8,358,146
- Issue date Jan 22, 2013
- Hermes Testing Solutions Inc.
- Chien-Yao Hung
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADJUSTABLE SUPPORTING DEVICE
- Publication number 20250044347
- Publication date Feb 6, 2025
- HERMES TESTING SOLUTIONS INC.
- Yi-Chun Yang
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE DETECTION SYSTEM
- Publication number 20250044164
- Publication date Feb 6, 2025
- HERMES TESTING SOLUTIONS INC.
- Chi-Ming Yang
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF
- Publication number 20240345134
- Publication date Oct 17, 2024
- HERMES TESTING SOLUTIONS INC.
- Wei-Ting Chen
- G01 - MEASURING TESTING
Information Patent Application
TESTING SUBSTRATE AND MANUFACTURING METHOD THEREOF AND PROBE CARD
- Publication number 20230213555
- Publication date Jul 6, 2023
- HERMES TESTING SOLUTIONS INC.
- Wen-Yuan Hsu
- G01 - MEASURING TESTING
Information Patent Application
TESTING SUBSTRATE AND MANUFACTURING METHOD THEREOF AND PROBE CARD
- Publication number 20230217600
- Publication date Jul 6, 2023
- HERMES TESTING SOLUTIONS INC.
- Chiao-Pei Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE CARD
- Publication number 20230194571
- Publication date Jun 22, 2023
- HERMES TESTING SOLUTIONS INC.
- TZU-CHIEN WANG
- G01 - MEASURING TESTING
Information Patent Application
INJECTION DEVICE, SEMICONDUCTOR TESTING SYSTEM AND ITS TESTING METHOD
- Publication number 20230045244
- Publication date Feb 9, 2023
- HERMES TESTING SOLUTIONS INC.
- Bo-Lung Chen
- G01 - MEASURING TESTING
Information Patent Application
INJECTION DEVICE, SEMICONDUCTOR TESTING SYSTEM AND ITS TESTING METHOD
- Publication number 20220349939
- Publication date Nov 3, 2022
- HERMES TESTING SOLUTIONS INC.
- Bo-Lung CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR EXCHANGING POLISH PLATE
- Publication number 20220297259
- Publication date Sep 22, 2022
- HERMES TESTING SOLUTIONS INC.
- Tzu-Chien WANG
- B24 - GRINDING POLISHING
Information Patent Application
BIOLOGICAL CHIP TESTING SYSTEM
- Publication number 20220244216
- Publication date Aug 4, 2022
- HERMES TESTING SOLUTIONS INC.
- Chi-Ming Yang
- G01 - MEASURING TESTING
Information Patent Application
PROBING SYSTEM FOR DISCRETE WAFER
- Publication number 20220163563
- Publication date May 26, 2022
- HERMES TESTING SOLUTIONS INC.
- Wen-Yuan HSU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20210055340
- Publication date Feb 25, 2021
- HERMES TESTING SOLUTIONS INC.
- WEN-YUAN HSU
- G01 - MEASURING TESTING
Information Patent Application
INJECTION DEVICE, SEMICONDUCTOR TESTING SYSTEM AND ITS TESTING METHOD
- Publication number 20210003550
- Publication date Jan 7, 2021
- HERMES TESTING SOLUTIONS INC.
- Bo-Lung Chen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF MEMORY MANAGEMENT
- Publication number 20160314852
- Publication date Oct 27, 2016
- HERMES TESTING SOLUTIONS INC.
- Shih-Hsin CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
STAND ALONE MULTI-CELL PROBE CARD FOR AT-SPEED FUNCTIONAL TESTING
- Publication number 20140125371
- Publication date May 8, 2014
- HERMES TESTING SOLUTIONS INC.
- MENG-HSIU CHUNG
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE ADAPTABLE TO DIFFERENT TEST APPARATUSES OF DIF...
- Publication number 20120049878
- Publication date Mar 1, 2012
- HERMES TESTING SOLUTIONS, INC.
- CHIEN-YAO HUNG
- G01 - MEASURING TESTING
Information Patent Application
CIS Circuit Test Probe Card
- Publication number 20100127722
- Publication date May 27, 2010
- HERMES TESTING SOLUTIONS INC.
- Chien-Yao Hung
- G02 - OPTICS

Trademarklast 30 trademarks

Information Trademark
99102071 - SIPH -TESTMATE
- Serial number 99102071
- Filing date Mar 25, 2025
- HERMES TESTING SOLUTIONS INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

HERMES TESTING SOLUTIONS INC.

Organization

Patents Grantslast 30 patents

Testing substrate and manufacturing method thereof and probe card

Probing system for discrete wafer

Injection device, semiconductor testing system and its testing method

Injection device, semiconductor testing system and its testing method

CMOS image sensor test probe card

Patents Applicationslast 30 patents

ADJUSTABLE SUPPORTING DEVICE

TEMPERATURE DETECTION SYSTEM

PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF

TESTING SUBSTRATE AND MANUFACTURING METHOD THEREOF AND PROBE CARD

TESTING SUBSTRATE AND MANUFACTURING METHOD THEREOF AND PROBE CARD

PROBE CARD

INJECTION DEVICE, SEMICONDUCTOR TESTING SYSTEM AND ITS TESTING METHOD

INJECTION DEVICE, SEMICONDUCTOR TESTING SYSTEM AND ITS TESTING METHOD

SYSTEM AND METHOD FOR EXCHANGING POLISH PLATE

BIOLOGICAL CHIP TESTING SYSTEM

PROBING SYSTEM FOR DISCRETE WAFER

PROBE CARD

INJECTION DEVICE, SEMICONDUCTOR TESTING SYSTEM AND ITS TESTING METHOD

SYSTEM AND METHOD OF MEMORY MANAGEMENT

STAND ALONE MULTI-CELL PROBE CARD FOR AT-SPEED FUNCTIONAL TESTING

PROBE CARD STRUCTURE ADAPTABLE TO DIFFERENT TEST APPARATUSES OF DIF...

CIS Circuit Test Probe Card

Trademarklast 30 trademarks

99102071 - SIPH -TESTMATE