HINDS INSTRUMENTS, INC

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Synchronous photoelastic modulator driving and detection
- Patent number 11,686,957
- Issue date Jun 27, 2023
- Hinds Instruments, Inc.
- John Freudenthal
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Universal cushion support for photoelastic modulator
- Patent number 11,307,438
- Issue date Apr 19, 2022
- Hinds Instruments, Inc.
- James C. Mansfield
- G02 - OPTICS
Information Patent Grant
Dual transducer photoelastic modulator
- Patent number 11,054,672
- Issue date Jul 6, 2021
- Hinds Instruments, Inc.
- John Freudenthal
- G02 - OPTICS
Information Patent Grant
Unambiguous retardance measurement
- Patent number 9,841,372
- Issue date Dec 12, 2017
- Hinds Instruments, Inc.
- John Freudenthal
- G01 - MEASURING TESTING
Information Patent Grant
Polarization properties imaging systems
- Patent number 9,683,930
- Issue date Jun 20, 2017
- Hinds Instruments, Inc.
- John Freudenthal
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence measurement of polycrystalline silicon samples or the...
- Patent number 9,228,936
- Issue date Jan 5, 2016
- Hinds Instruments, Inc.
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of linear and circular diattenuation in optical elements
- Patent number 9,019,497
- Issue date Apr 28, 2015
- Hinds Instruments Inc.
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Alignment mechanism for photoelastic modulators
- Patent number 8,797,660
- Issue date Aug 5, 2014
- Hinds Instruments, Inc.
- James C. Mansfield
- G01 - MEASURING TESTING
Information Patent Grant
Detection method for birefringence measurement
- Patent number 8,743,360
- Issue date Jun 3, 2014
- Hinds Instruments, Inc.
- Baoliang Wang
- F21 - LIGHTING
Information Patent Grant
High throughput birefringence measurement
- Patent number 8,582,101
- Issue date Nov 12, 2013
- Hinds Instruments, Inc.
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Support system for vibrating optical assembly
- Patent number 8,537,476
- Issue date Sep 17, 2013
- Hinds Instruments Inc.
- James C. Mansfield
- G02 - OPTICS
Information Patent Grant
Detection system for birefringence measurement
- Patent number 8,520,207
- Issue date Aug 27, 2013
- Hinds Instruments, Inc.
- Baoliang Wang
- F21 - LIGHTING
Information Patent Grant
Detection system for birefringence measurement
- Patent number 8,248,605
- Issue date Aug 21, 2012
- Hinds Instruments, Inc.
- Baoliang Wang
- F21 - LIGHTING
Information Patent Grant
Support for vibrating optical assembly
- Patent number 7,800,845
- Issue date Sep 21, 2010
- Hinds Instruments, Inc.
- James C. Mansfield
- G02 - OPTICS
Information Patent Grant
Sample holder for an optical element
- Patent number 7,746,465
- Issue date Jun 29, 2010
- Hinds Instruments, Inc.
- Douglas C. Mark
- G01 - MEASURING TESTING
Information Patent Grant
Automatic gain control in photodetectors
- Patent number 7,495,205
- Issue date Feb 24, 2009
- Hinds Instruments, Inc.
- Robert Lakanen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Birefringence measurement of polymeric films and the like
- Patent number 7,385,696
- Issue date Jun 10, 2008
- Hinds Instruments, Inc.
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Out-of-plane birefringence measurement
- Patent number 7,312,869
- Issue date Dec 25, 2007
- Hinds Instruments, Inc.
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Purging light beam paths in optical equipment
- Patent number 7,016,039
- Issue date Mar 21, 2006
- Hinds Instruments, Inc.
- Andrew O. Breninger
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring of both circular and linear birefringence
- Patent number 7,002,685
- Issue date Feb 21, 2006
- Hinds Instruments, Inc.
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence measurement of large-format samples
- Patent number 6,992,758
- Issue date Jan 31, 2006
- Hinds Instruments, Inc.
- Andrew D. Kaplan
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence measurement at deep-ultraviolet wavelengths
- Patent number 6,985,227
- Issue date Jan 10, 2006
- Hinds Instruments, Inc.
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Controlling resonant photoelastic modulators
- Patent number 6,970,278
- Issue date Nov 29, 2005
- Hinds Instruments, Inc.
- Tudor N. Buican
- G02 - OPTICS
Information Patent Grant
Mounting system for an optical assembly of a photoelastic modulator
- Patent number 6,906,844
- Issue date Jun 14, 2005
- Hinds Instruments, Inc.
- Massoud Siahpoushan
- G02 - OPTICS
Information Patent Grant
Integrated diagnostic for photoelastic modulator
- Patent number 6,867,863
- Issue date Mar 15, 2005
- Hinds Instruments
- Paul Kadlec
- G02 - OPTICS
Information Patent Grant
Adjustable sample holder for optical equipment
- Patent number 6,765,734
- Issue date Jul 20, 2004
- Hinds Instruments, Inc.
- Christopher O. Griffiths
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of waveplate retardation using a photoelastic modulator
- Patent number 6,738,137
- Issue date May 18, 2004
- Hinds Instruments, Inc.
- Theodore C. Oakberg
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence measurement
- Patent number 6,697,157
- Issue date Feb 24, 2004
- Hinds Instruments
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of waveplate retardation using a photoelastic modulator
- Patent number 6,473,181
- Issue date Oct 29, 2002
- Hinds Instruments, Inc.
- Theodore C. Oakberg
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence measurement system
- Patent number 6,473,179
- Issue date Oct 29, 2002
- Hinds Instruments, Inc.
- Baoliang Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYNCHRONOUS PHOTOELASTIC MODULATOR DRIVING AND DETECTION
- Publication number 20200174289
- Publication date Jun 4, 2020
- HINDS INSTRUMENTS, INC
- John Freudenthal
- G02 - OPTICS
Information Patent Application
DUAL TRANSDUCER PHOTOELASTIC MODULATOR
- Publication number 20190171042
- Publication date Jun 6, 2019
- HINDS INSTRUMENTS, INC
- John Freudenthal
- G02 - OPTICS
Information Patent Application
MITIGATING MENISCUS EFFECTS IN VERTICALLY ORIENTED CIRCULAR DICHROI...
- Publication number 20180283948
- Publication date Oct 4, 2018
- HINDS INSTRUMENTS, INC
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL CUSHION SUPPORT FOR PHOTOELASTIC MODULATOR
- Publication number 20180180906
- Publication date Jun 28, 2018
- HINDS INSTRUMENTS, INC
- James C. Mansfield
- G02 - OPTICS
Information Patent Application
POLARIZATION PROPERTIES IMAGING SYSTEMS
- Publication number 20170307517
- Publication date Oct 26, 2017
- HINDS INSTRUMENTS, INC
- John Freudenthal
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION PROPERTIES IMAGING SYSTEMS
- Publication number 20160116397
- Publication date Apr 28, 2016
- HINDS INSTRUMENTS, INC
- John Freudenthal
- G01 - MEASURING TESTING
Information Patent Application
UNAMBIGUOUS RETARDANCE MEASUREMENT
- Publication number 20160091416
- Publication date Mar 31, 2016
- HINDS INSTRUMENTS, INC
- John Freudenthal
- G01 - MEASURING TESTING
Information Patent Application
Birefringence Measurement of Polycrystalline Silicon Samples or the...
- Publication number 20150153270
- Publication date Jun 4, 2015
- HINDS INSTRUMENTS, INC
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Application
Alignment Mechanism for Photoelastic Modulators
- Publication number 20140204451
- Publication date Jul 24, 2014
- HINDS INSTRUMENTS, INC
- James C. MANSFIELD
- G02 - OPTICS
Information Patent Application
Detection Method for Birefringence Measurement
- Publication number 20130335977
- Publication date Dec 19, 2013
- HINDS INSTRUMENTS, INC
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Application
Detection System for Birefringence Measurement
- Publication number 20120326005
- Publication date Dec 27, 2012
- HINDS INSTRUMENTS, INC
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Application
High Throughput Birefringence Measurement
- Publication number 20110181883
- Publication date Jul 28, 2011
- HINDS INSTRUMENTS, INC
- Baoliang Wang
- G02 - OPTICS
Information Patent Application
Support System for Vibrating Optical Assembly
- Publication number 20110063707
- Publication date Mar 17, 2011
- HINDS INSTRUMENTS, INC
- James C. Mansfield
- G02 - OPTICS
Information Patent Application
Measurement of Linear and Circular Diattentuation in Optical Elements
- Publication number 20090323064
- Publication date Dec 31, 2009
- HINDS INSTRUMENTS, INC
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Application
Detection System for Birefringence Measurement
- Publication number 20090279089
- Publication date Nov 12, 2009
- HINDS INSTRUMENTS, INC
- Baoliang Wang
- F21 - LIGHTING
Information Patent Application
Automatic Gain Control in Photodetectors
- Publication number 20080290257
- Publication date Nov 27, 2008
- HINDS INSTRUMENTS, INC
- Robert Lakanen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Sample Holder for an Optical Element
- Publication number 20080174773
- Publication date Jul 24, 2008
- Hinds Instruments Inc.
- Douglas C. Mark
- G01 - MEASURING TESTING
Information Patent Application
SUPPORT FOR VIBRATING OPTICAL ASSEMBLY
- Publication number 20080001055
- Publication date Jan 3, 2008
- HINDS INSTRUMENTS, INC
- James C. Mansfield
- G02 - OPTICS
Information Patent Application
BIREFRINGENCE MEASUREMENT OF POLYMERIC FILMS AND THE LIKE
- Publication number 20060187452
- Publication date Aug 24, 2006
- Hinds Instruments Inc.
- Baoliang WANG
- G01 - MEASURING TESTING
Information Patent Application
Out-of-plane birefringence measurement
- Publication number 20050219528
- Publication date Oct 6, 2005
- Hinds Instruments Inc
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Application
Purging light beam paths in optical equipment
- Publication number 20040156049
- Publication date Aug 12, 2004
- Hinds Instruments, Inc.
- Andrew H. Breninger
- G02 - OPTICS
Information Patent Application
Birefringence measurement at deep-ultraviolet wavelengths
- Publication number 20040114142
- Publication date Jun 17, 2004
- Hinds Instruments, Inc.
- Baoliang Wang
- G01 - MEASURING TESTING
Information Patent Application
Birefringence measurement of large-format samples
- Publication number 20040075834
- Publication date Apr 22, 2004
- Hinds Instruments, Inc.
- Andrew D. Kaplan
- G01 - MEASURING TESTING

HINDS INSTRUMENTS, INC

Organization

Patents Grantslast 30 patents

Synchronous photoelastic modulator driving and detection

Universal cushion support for photoelastic modulator

Dual transducer photoelastic modulator

Unambiguous retardance measurement

Polarization properties imaging systems

Birefringence measurement of polycrystalline silicon samples or the...

Measurement of linear and circular diattenuation in optical elements

Alignment mechanism for photoelastic modulators

Detection method for birefringence measurement

High throughput birefringence measurement

Support system for vibrating optical assembly

Detection system for birefringence measurement

Detection system for birefringence measurement

Support for vibrating optical assembly

Sample holder for an optical element

Automatic gain control in photodetectors

Birefringence measurement of polymeric films and the like

Out-of-plane birefringence measurement

Purging light beam paths in optical equipment

System for measuring of both circular and linear birefringence

Birefringence measurement of large-format samples

Birefringence measurement at deep-ultraviolet wavelengths

Controlling resonant photoelastic modulators

Mounting system for an optical assembly of a photoelastic modulator

Integrated diagnostic for photoelastic modulator

Adjustable sample holder for optical equipment

Measurement of waveplate retardation using a photoelastic modulator

Birefringence measurement

Measurement of waveplate retardation using a photoelastic modulator

Birefringence measurement system

Patents Applicationslast 30 patents

SYNCHRONOUS PHOTOELASTIC MODULATOR DRIVING AND DETECTION

DUAL TRANSDUCER PHOTOELASTIC MODULATOR

MITIGATING MENISCUS EFFECTS IN VERTICALLY ORIENTED CIRCULAR DICHROI...

UNIVERSAL CUSHION SUPPORT FOR PHOTOELASTIC MODULATOR

POLARIZATION PROPERTIES IMAGING SYSTEMS

POLARIZATION PROPERTIES IMAGING SYSTEMS

UNAMBIGUOUS RETARDANCE MEASUREMENT

Birefringence Measurement of Polycrystalline Silicon Samples or the...

Alignment Mechanism for Photoelastic Modulators

Detection Method for Birefringence Measurement

Detection System for Birefringence Measurement

High Throughput Birefringence Measurement

Support System for Vibrating Optical Assembly

Measurement of Linear and Circular Diattentuation in Optical Elements

Detection System for Birefringence Measurement

Automatic Gain Control in Photodetectors

Sample Holder for an Optical Element

SUPPORT FOR VIBRATING OPTICAL ASSEMBLY

BIREFRINGENCE MEASUREMENT OF POLYMERIC FILMS AND THE LIKE

Out-of-plane birefringence measurement

Purging light beam paths in optical equipment

Birefringence measurement at deep-ultraviolet wavelengths

Birefringence measurement of large-format samples

Trademarklast 30 trademarks