ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik Mbh

Organization

Helmstetten, DE

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Patents Grantslast 30 patents

Information Patent Grant
Achromatic mass separator
- Patent number 8,049,180
- Issue date Nov 1, 2011
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for operating a charged...
- Patent number 7,838,830
- Issue date Nov 23, 2010
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device with a gas field ion source and a gas...
- Patent number 7,692,165
- Issue date Apr 6, 2010
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Asymmetric annular detector
- Patent number 7,659,514
- Issue date Feb 9, 2010
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangement and method for compensating emitter tip vibrations
- Patent number 7,633,074
- Issue date Dec 15, 2009
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam emitting device and method for operating a ch...
- Patent number 7,595,490
- Issue date Sep 29, 2009
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Fang Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ION source for multiple applications
- Patent number 7,589,328
- Issue date Sep 15, 2009
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a sample of a specimen by means...
- Patent number 7,586,093
- Issue date Sep 8, 2009
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Hans-Peter Feuerbaum
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device with cleaning unit and method of opera...
- Patent number 7,355,186
- Issue date Apr 8, 2008
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Thomas Jasinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emitter for an ion source
- Patent number 7,335,896
- Issue date Feb 26, 2008
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Wolfgang Pilz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron beam device
- Patent number 7,282,711
- Issue date Oct 16, 2007
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for operating the same
- Patent number 7,274,018
- Issue date Sep 25, 2007
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron emission device
- Patent number 7,268,361
- Issue date Sep 11, 2007
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emitter beam source and method for controlling a beam current
- Patent number 7,122,805
- Issue date Oct 17, 2006
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Kurt Hoffmann
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Charged particle deflecting system
- Patent number 7,075,075
- Issue date Jul 11, 2006
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for operating the same
- Patent number 7,045,781
- Issue date May 16, 2006
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik Mbh
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS

ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik Mbh

Organization

Patents Grantslast 30 patents

Achromatic mass separator

Charged particle beam apparatus and method for operating a charged...

Charged particle beam device with a gas field ion source and a gas...

Asymmetric annular detector

Arrangement and method for compensating emitter tip vibrations

Charged particle beam emitting device and method for operating a ch...

Gas field ION source for multiple applications

Apparatus and method for inspecting a sample of a specimen by means...

Charged particle beam device with cleaning unit and method of opera...

Emitter for an ion source

Multiple electron beam device

Charged particle beam apparatus and method for operating the same

Electron emission device

Field emitter beam source and method for controlling a beam current

Charged particle deflecting system

Charged particle beam apparatus and method for operating the same

Patents Applicationslast 30 patents

Trademarklast 30 trademarks