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Achromatic mass separator
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Patent number 8,049,180
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Issue date Nov 1, 2011
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ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
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Juergen Frosien
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H01 - BASIC ELECTRIC ELEMENTS
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Asymmetric annular detector
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Patent number 7,659,514
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Issue date Feb 9, 2010
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ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
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Pavel Adamec
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H01 - BASIC ELECTRIC ELEMENTS
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Emitter for an ion source
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Patent number 7,335,896
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Issue date Feb 26, 2008
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ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
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Wolfgang Pilz
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H01 - BASIC ELECTRIC ELEMENTS
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Multiple electron beam device
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Patent number 7,282,711
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Issue date Oct 16, 2007
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ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
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Dieter Winkler
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H01 - BASIC ELECTRIC ELEMENTS
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Electron emission device
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Patent number 7,268,361
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Issue date Sep 11, 2007
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ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
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Pavel Adamec
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H01 - BASIC ELECTRIC ELEMENTS
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Charged particle deflecting system
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Patent number 7,075,075
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Issue date Jul 11, 2006
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ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
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Pavel Adamec
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H01 - BASIC ELECTRIC ELEMENTS
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